Works matching IS 10637826 AND DT 2009 AND VI 43 AND IP 8
Results: 25
Fast pulsed gallium arsenide heterostructure diodes.
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- Semiconductors, 2009, v. 43, n. 8, p. 1055, doi. 10.1134/S106378260908017X
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The effects of the porous buffer layer and doping with dysprosium on internal stresses in the GaInP:Dy/por-GaAs/GaAs(100) heterostructures.
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- Semiconductors, 2009, v. 43, n. 8, p. 1098, doi. 10.1134/S1063782609080247
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Optimum composition of a Bi<sub>2</sub>Te<sub>3 − x </sub>Se<sub> x </sub> alloy for the n-type leg of a thermoelectric generator.
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- Semiconductors, 2009, v. 43, n. 8, p. 973, doi. 10.1134/S1063782609080016
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Photoelectric properties of a sandwich structure composed of films synthesized under highly nonequilibrium conditions.
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- Semiconductors, 2009, v. 43, n. 8, p. 993, doi. 10.1134/S1063782609080053
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The temperature dependence of the thermopower of the InSb Corbino disc in a quantizing magnetic field.
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- Semiconductors, 2009, v. 43, n. 8, p. 995, doi. 10.1134/S1063782609080065
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Dependence of the efficiency of a CdS/CdTe solar cell on the absorbing layer’s thickness.
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- Semiconductors, 2009, v. 43, n. 8, p. 1023, doi. 10.1134/S1063782609080119
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Flexible solar cells based on cadmium sulfide and telluride.
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- Semiconductors, 2009, v. 43, n. 8, p. 1046, doi. 10.1134/S1063782609080156
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Effect of parameters of narrow-gap inclusions on the type and intensity of secondary-ion photoeffect in heterophase photosensitive semiconductors.
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- Semiconductors, 2009, v. 43, n. 8, p. 1064, doi. 10.1134/S1063782609080193
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Charge transport in 4 H-SiC detector structures under conditions of a high electric field.
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- Semiconductors, 2009, v. 43, n. 8, p. 1052, doi. 10.1134/S1063782609080168
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Non-volatile memory based on silicon nanoclusters.
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- Semiconductors, 2009, v. 43, n. 8, p. 1040, doi. 10.1134/S1063782609080144
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Thermoelectric figure of merit of Ag<sub>2</sub>Se with Ag and Se excess.
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- Semiconductors, 2009, v. 43, n. 8, p. 977, doi. 10.1134/S1063782609080028
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Spin hall effect in semiconductor structures with spatially inhomogeneous spin relaxation.
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- Semiconductors, 2009, v. 43, n. 8, p. 1002, doi. 10.1134/S1063782609080089
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Fractal geometry of the surface potential in electrochemically deposited platinum and palladium films.
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- Semiconductors, 2009, v. 43, n. 8, p. 1071, doi. 10.1134/S106378260908020X
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Dielectric waveguide for middle and far infrared radiation.
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- Semiconductors, 2009, v. 43, n. 8, p. 1036, doi. 10.1134/S1063782609080132
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Luminescence in quantum-confined cadmium selenide nanocrystals and nanorods in external electric fields.
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- Semiconductors, 2009, v. 43, n. 8, p. 1008, doi. 10.1134/S1063782609080090
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Spin-lattice relaxation of <sup>113</sup>Cd and <sup>19</sup>F nuclear spins in the crystal lattice of CdF<sub>2</sub> semiconductor crystals with DX centers.
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- Semiconductors, 2009, v. 43, n. 8, p. 985, doi. 10.1134/S1063782609080041
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Specific features of the epitaxial growth of narrow-gap InSb quantum dots on an InAs substrate.
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- Semiconductors, 2009, v. 43, n. 8, p. 1102, doi. 10.1134/S1063782609080259
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Specific features of recombination processes in CdTe films produced in different temperature conditions of growth and subsequent annealing.
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- Semiconductors, 2009, v. 43, n. 8, p. 980, doi. 10.1134/S106378260908003X
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Photoluminescence of ZnO infiltrated into a three-dimensional photonic crystal.
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- Semiconductors, 2009, v. 43, n. 8, p. 1017, doi. 10.1134/S1063782609080107
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Lateral photoconductivity of multilayer Ge/Si structures with Ge quantum dots.
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- Semiconductors, 2009, v. 43, n. 8, p. 997, doi. 10.1134/S1063782609080077
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Cooperative effects in the case of pulsed self-heating of a p-i-n diode.
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- Semiconductors, 2009, v. 43, n. 8, p. 1028, doi. 10.1134/S1063782609080120
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Features of molecular beam epitaxy of the GaN (0001) and GaN (000 $$ \bar 1 $$ ) layers with the use of different methods of activation of nitrogen.
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- Semiconductors, 2009, v. 43, n. 8, p. 1058, doi. 10.1134/S1063782609080181
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Properties of GaN(SiC)-(Ti, Zr)B<sub> x </sub> contacts subjected to rapid thermal annealing.
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- Semiconductors, 2009, v. 43, n. 8, p. 1086, doi. 10.1134/S1063782609080223
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Possibility of obtaining the (GaSb)<sub>1 − x </sub>(Si<sub>2</sub>)<sub> x </sub> films on silicon substrates by the method of liquid-phase epitaxy.
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- Semiconductors, 2009, v. 43, n. 8, p. 1092, doi. 10.1134/S1063782609080235
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High-resolution X-ray diffraction studies of the GaAs structures grown at a low temperature and periodically δ-doped with antimony and phosphorus.
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- Semiconductors, 2009, v. 43, n. 8, p. 1078, doi. 10.1134/S1063782609080211
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