Works matching IS 10637826 AND DT 2008 AND VI 42 AND IP 5
1
- Semiconductors, 2008, v. 42, n. 5, p. 557, doi. 10.1134/S1063782608050126
- Article
2
- Semiconductors, 2008, v. 42, n. 5, p. 545, doi. 10.1134/S1063782608050102
- Lisovskyy, I.;
- Zlobin, S.;
- Kaganovich, É.;
- Manoĭlov, É.;
- Begun, E.
- Article
3
- Semiconductors, 2008, v. 42, n. 5, p. 499, doi. 10.1134/S1063782608050011
- Avacheva, T.;
- Bodyagin, N.;
- Vikhrov, S.;
- Mursalov, S.
- Article
4
- Semiconductors, 2008, v. 42, n. 5, p. 508, doi. 10.1134/S1063782608050035
- Bulatetskaya, L.;
- Bozhko, V.;
- Davidyuk, G.;
- Parasyuk, O.
- Article
5
- Semiconductors, 2008, v. 42, n. 5, p. 540, doi. 10.1134/S1063782608050096
- Zaitsev, S.;
- Maksimov, A.;
- Tartakovskiĭ, I.;
- Yakovlev, D.;
- Waag, A.
- Article
6
- Semiconductors, 2008, v. 42, n. 5, p. 505, doi. 10.1134/S1063782608050023
- Belyaev, A.;
- Rubets, V.;
- Antipov, V.;
- Toshkhodzhaev, Kh.
- Article
7
- Semiconductors, 2008, v. 42, n. 5, p. 522, doi. 10.1134/S1063782608050060
- Article
8
- Semiconductors, 2008, v. 42, n. 5, p. 518, doi. 10.1134/S1063782608050059
- Kyazym-Zade, A.;
- Salmanov, V.;
- Mokhtari, A.;
- Dadashova, V.;
- Agaeva, A.
- Article
9
- Semiconductors, 2008, v. 42, n. 5, p. 528, doi. 10.1134/S1063782608050072
- Makarenko, Ph.;
- Pribylov, N.;
- Rembeza, S.;
- Mel’nik, V.
- Article
10
- Semiconductors, 2008, v. 42, n. 5, p. 531, doi. 10.1134/S1063782608050084
- Bozhkov, V.;
- Torkhov, N.;
- Ivonin, I.;
- Novikov, V.
- Article
11
- Semiconductors, 2008, v. 42, n. 5, p. 514, doi. 10.1134/S1063782608050047
- Kosyachenko, L.;
- German, I.;
- Rarenko, I.;
- Zakharuk, Z.;
- Nikonyuk, E.
- Article
12
- Semiconductors, 2008, v. 42, n. 5, p. 550, doi. 10.1134/S1063782608050114
- Article
13
- Semiconductors, 2008, v. 42, n. 5, p. 563, doi. 10.1134/S1063782608050138
- Article
14
- Semiconductors, 2008, v. 42, n. 5, p. 571, doi. 10.1134/S106378260805014X
- Article
15
- Semiconductors, 2008, v. 42, n. 5, p. 576, doi. 10.1134/S1063782608050151
- Lisovskyy, I.;
- Indutniĭ, I.;
- Muravskaya, M.;
- Voitovich, V.;
- Gule, E.;
- Shepelyavyĭ, P.
- Article
16
- Semiconductors, 2008, v. 42, n. 5, p. 580, doi. 10.1134/S1063782608050163
- Razzhuvalov, A.;
- Grinyaev, S.
- Article
17
- Semiconductors, 2008, v. 42, n. 5, p. 589, doi. 10.1134/S1063782608050175
- Belevskiĭ, P.;
- Vinoslavskiĭ, M.;
- Poroshin, V.;
- Stroganova, I.
- Article
18
- Semiconductors, 2008, v. 42, n. 5, p. 593, doi. 10.1134/S1063782608050187
- Hajiyev, É.;
- Madadzade, A.
- Article
19
- Semiconductors, 2008, v. 42, n. 5, p. 596, doi. 10.1134/S1063782608050199
- Article
20
- Semiconductors, 2008, v. 42, n. 5, p. 604, doi. 10.1134/S1063782608050205
- Lebedev, É.;
- Goikhman, M.;
- Zhigunov, D.;
- Podeshvo, I.;
- Nikitin, S.;
- Forsh, P.;
- Kudryavtsev, V.;
- Yakimanskiĭ, A.
- Article
21
- Semiconductors, 2008, v. 42, n. 5, p. 608, doi. 10.1134/S1063782608050217
- Article
22
- Semiconductors, 2008, v. 42, n. 5, p. 616, doi. 10.1134/S1063782608050229
- Jmerik, V.;
- Mizerov, A.;
- Shubina, T.;
- Plotnikov, D.;
- Zamoryanskaya, M.;
- Yagovkina, M.;
- Domracheva, Ya.;
- Sitnikova, A.;
- Ivanov, S.
- Article