Works matching IS 10637745 AND DT 2021 AND VI 66 AND IP 4
Results: 21
Application of the EBSD Method to Study the Fracture Mechanisms of Reactor Pressure Vessels Steels under Operational Factors.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 704, doi. 10.1134/S1063774521040131
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Microstructural Features of Poly(N-Vinylpyrrolidone)−La(NO3)3 ⋅ 6H2O Hydrogel.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 699, doi. 10.1134/S1063774521040179
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Technique for Determining the Fracture Relief Periodicity in Fractured Materials.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 694, doi. 10.1134/S1063774521040027
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Electron Microscopy Study of Surface Islands in Epitaxial Ge3Sb2Te6 Layer Grown on a Silicon Substrate.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 687, doi. 10.1134/S1063774521030317
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Microstructure of Epitaxial GaN Layers Synthesized on Nanoprofiled Si(001) Substrates.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 682, doi. 10.1134/S1063774521040155
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Microscopic Studies of Alignment Layers Processed by a Focused Ion Beam for the Creation of Liquid Crystal Metasurfaces.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 673, doi. 10.1134/S1063774521040039
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Electron Microscopy and Electron Diffraction Studies of Morphology and Crystal Structure of Natural Silicas.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 663, doi. 10.1134/S1063774521040209
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Application of Electron Energy-Loss Spectroscopy for Analysis of the Microstructure of Reactor Materials.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 656, doi. 10.1134/S1063774521040180
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Electron Microscopy in the Study of Lunar Regolith.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 648, doi. 10.1134/S1063774521040143
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Anomalously Large Burgers Vectors of Screw Dislocations in Gallium Nitride Nanowires.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 644, doi. 10.1134/S1063774521040106
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Structural Transformations of the Dislocation Cores in Si and Their Relationship with Photoluminescence.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 636, doi. 10.1134/S1063774521040064
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Extended Defects in O+-Implanted Si Layers and Their Luminescence.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 625, doi. 10.1134/S1063774521040210
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Methodological Approaches to Research of Multilayer Thin-Film Systems and Interfaces in Composite Materials.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 618, doi. 10.1134/S106377452104012X
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Microstructure and Rheological Behavior of Stabilized Gold Nanoparticles Hydrosol.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 612, doi. 10.1134/S106377452104009X
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The Electron Diffraction Investigation of the Phase Structures in the Systems MF2–RF3 (CaF2–ErF3, SrF2–LaF3).
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- Crystallography Reports, 2021, v. 66, n. 4, p. 608, doi. 10.1134/S1063774521040167
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Specific Features of the Atomic Structure of Iron Silicide Nanocrystals in a Silicon Matrix.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 601, doi. 10.1134/S1063774521040088
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Method of Contrast Enhancement and Background Correction in Electron Diffraction Patterns of Polycrystalline Materials.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 594, doi. 10.1134/S1063774521040052
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Study of Wide-Gap Semiconductors Using Electron-Beam Induced Current Method.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 581, doi. 10.1134/S1063774521040222
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In Situ Reflection Electron Microscopy for the Analysis of Silicon Surface Processes: Sublimation, Electromigration, and Adsorption of Impurity Atoms.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 570, doi. 10.1134/S1063774521040192
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Ultrafast Electron Microscopy: An Instrument of the XXI Century.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 553, doi. 10.1134/S1063774521040040
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Editor-in-Chief's Column.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 551, doi. 10.1134/S1063774521040118
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