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- Title
Behavioral Features of the Approach Curve of a Scanning Ion-Conductance Microscope.
- Authors
Lukashenko, S. Yu.; Gorbenko, O. M.; Zhukov, M. V.; Pichahchi, S. V.; Sapozhnikov, I. D.; Felshtyn, M. L.; Golubok, A. O.
- Abstract
The operation of a scanning ion-conductance microscope is based on the assumption that the ion current I(z) flowing through the narrow aperture of a probe in the form of a glass nanopipette has the maximum saturation value I = Isat (in comparison with the aperture of the probe) far from the sample under study in an electrolyte solution, which steadily decreases as the probe approaches the surface. The value of the operating current of a scanning ion-conductance microscope is usually chosen near the saturation current I ~ 09Isat. However, in some cases there is an unusual behavior of the I(z) approach curve near the surface when the ion current increases as the nanopipette approaches the sample surface. The appearance of a peak on the I(z) curve as the nanopipette approaches the sample surface is what we call the "peak effect". It is obvious that the peak effect can lead to failure in the operation of the scanning ion-conductance microscope servo system and noise in images obtained by the scanning ion-conductance microscope. In this work, the appearance of a peak on the approach curve is studied experimentally. Considering the nanopipette near the sample surface as a microfluidic system in the form of a T-shaped channel the I(z) dependence is calculated using the finite-element method and the COMSOL software package.
- Publication
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, Vol 17, Issue 3, p585
- ISSN
1027-4510
- Publication type
Academic Journal
- DOI
10.1134/S1027451023030096