Works matching IS 10637826 AND DT 2004 AND VI 38 AND IP 6
Results: 20
Magnetic Properties of Carbon Structures.
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- Semiconductors, 2004, v. 38, n. 6, p. 615, doi. 10.1134/1.1766362
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A Study of Recombination Centers in Irradiated p-Si Crystals.
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- Semiconductors, 2004, v. 38, n. 6, p. 639, doi. 10.1134/1.1766363
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Long-Wavelength Edge of the Spectrum of Hot Electron–Hole Plasma Radiation in Photoexcited Indium Arsenide.
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- Semiconductors, 2004, v. 38, n. 6, p. 644, doi. 10.1134/1.1766364
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A Protrusion in the Absorption Spectra of GaAs Excited by High-Power Picosecond Light Pulses.
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- Semiconductors, 2004, v. 38, n. 6, p. 648, doi. 10.1134/1.1766365
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Photosensitive Polyimides Containing Substituted Diphenylmethane Fragments in the Backbone.
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- Semiconductors, 2004, v. 38, n. 6, p. 652, doi. 10.1134/1.1766366
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Analysis of Polarization Modulation Spectra of Photopleochroism Induced by Uniaxial Compression in Ge Crystals.
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- Semiconductors, 2004, v. 38, n. 6, p. 657, doi. 10.1134/1.1766367
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Physical Mechanisms of Laser Correction and Stabilization of the Parameters of Al–n–n<sup>+</sup>-Si–Al Schottky Barrier Structures.
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- Semiconductors, 2004, v. 38, n. 6, p. 663, doi. 10.1134/1.1766368
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Slow Relaxation of Conductance of Quasi-Two-Dimensional Highly Disordered MIS Structures.
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- Semiconductors, 2004, v. 38, n. 6, p. 666, doi. 10.1134/1.1766369
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Fabrication and Properties of an n-ZnO:Ga/p-GaN:Mg/α-Al<sub>2</sub>O<sub>3</sub> Heterojunction.
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- Semiconductors, 2004, v. 38, n. 6, p. 672, doi. 10.1134/1.1766370
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High-Frequency Barrier Capacitance of Metal–Semiconductor Contacts and Abrupt p–n Junctions.
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- Semiconductors, 2004, v. 38, n. 6, p. 675, doi. 10.1134/1.1766371
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Growth of AlGaN Epitaxial Layers and AlGaN/GaN Superlattices by Metal-Organic Chemical Vapor Deposition.
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- Semiconductors, 2004, v. 38, n. 6, p. 678, doi. 10.1134/1.1766372
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Structural Defects at the Semiconductor–Ferroelectric Interface.
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- Semiconductors, 2004, v. 38, n. 6, p. 683, doi. 10.1134/1.1766373
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Electron–Electron Scattering in Stepped Quantum Wells.
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- Semiconductors, 2004, v. 38, n. 6, p. 689, doi. 10.1134/1.1766374
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High-Power 1.5 μm InAs–InGaAs Quantum Dot Lasers on GaAs Substrates.
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- Semiconductors, 2004, v. 38, n. 6, p. 732, doi. 10.1134/1.1766381
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Spectroscopy of Exciton States of InAs Quantum Molecules.
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- Semiconductors, 2004, v. 38, n. 6, p. 696, doi. 10.1134/1.1766375
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Formation of Thick Porous Silicon Layers with Insufficient Minority Carrier Concentration.
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- Semiconductors, 2004, v. 38, n. 6, p. 712, doi. 10.1134/1.1766377
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Transformation of a Short-Wavelength Emission Band of a Double-Charged Intrinsic Acceptor into a Long-Wavelength Band in GaSb-Based LEDs.
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- Semiconductors, 2004, v. 38, n. 6, p. 717, doi. 10.1134/1.1766378
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Soft Breakdown as a Cause of Current Drop in an MOS Tunnel Structure.
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- Semiconductors, 2004, v. 38, n. 6, p. 724, doi. 10.1134/1.1766379
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Electroluminescent Studies of Emission Characteristics of InGaAsN/GaAs Injection Lasers in a Wide Temperature Range.
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- Semiconductors, 2004, v. 38, n. 6, p. 727, doi. 10.1134/1.1766380
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Role of Si-Doped Al<sub>0.3</sub>Ga<sub>0.7</sub>As Layers in the High-Frequency Conductivity of GaAs/Al<sub>0.3</sub>Ga<sub>0.7</sub>As Heterostructures under Conditions of the Quantum Hall Effect.
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- Semiconductors, 2004, v. 38, n. 6, p. 702, doi. 10.1134/1.1766376
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