Works matching IS 10637826 AND DT 2004 AND VI 38 AND IP 4


Results: 20
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    Capacitance Study of Electron Traps in Low-Temperature-Grown GaAs.

    Published in:
    Semiconductors, 2004, v. 38, n. 4, p. 387, doi. 10.1134/1.1734663
    By:
    • Brunkov, P. N.;
    • Gutkin, A. A.;
    • Moiseenko, A. K.;
    • Musikhin, Yu. G.;
    • Chaldyshev, V. V.;
    • Cherkashin, N. N.;
    • Konnikov, S. G.;
    • Preobrazhenski&icaron;, V. V.;
    • Putyato, M. A.;
    • Semyagin, B. R.
    Publication type:
    Article
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    Thermal Calculation of SiC p–i–n Diodes.

    Published in:
    Semiconductors, 2004, v. 38, n. 4, p. 486, doi. 10.1134/1.1734679
    By:
    • Gamuletskaya, P. B.;
    • Kirillov, A. V.;
    • Lebedev, A. A.;
    • Romanov, L. P.;
    • Smirnov, V. A.
    Publication type:
    Article