Found: 31
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Impedance spectroscopy of single graphene layer at gas adsorption.
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- Physica Status Solidi. A: Applications & Materials Science, 2015, v. 212, n. 9, p. 1941, doi. 10.1002/pssa.201532101
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- Article
Microprismatic plane-focusing Fresnel lenses for light concentration in solar photovoltaic modules.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2023, v. 26, n. 2, p. 188, doi. 10.15407/spqeo26.02.188
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- Article
Nanophysics in modern medicine.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2022, v. 25, n. 2, p. 185, doi. 10.15407/spqeo25.02.185
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- Article
The advancement of silicon-on-insulator (SOI) devices and their basic properties.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2020, v. 23, n. 3, p. 227, doi. 10.15407/spqeo23.03.227
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- Article
Relaxation of photovoltage in ITO-Ge-Si heterojunction with Ge nanostructured thin films.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2017, v. 20, n. 2, p. 259, doi. 10.15407/spqeo20.02.259
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- Article
Relaxation of photovoltage in ITO-Ge-Si heterojunction with Ge nanostructured thin films.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2017, v. 20, n. 2, p. 259, doi. 10.15407/spqeo20.02.259
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- Article
Analysis of multichannel optical rotary connectors based on the compensation operating principle with mirror and prismatic optical compensators (Part 1).
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2017, v. 20, n. 1, p. 1, doi. 10.15407/spqeo20.01.001
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- Article
Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si<sub>1-x</sub>C<sub>x</sub>:H films.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2015, v. 18, n. 1, p. 63
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- Article
Photoconductivity mechanism in structures with Ge-nanoclusters grown on Si(100) surface.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2014, v. 17, n. 4, p. 331
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- Article
Electroluminescent properties of Tb-doped carbon-enriched silicon oxide.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2014, v. 17, n. 1, p. 34
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- Article
Graphene layers fabricated from the Ni/a-SiC bilayer precursor.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2013, v. 16, n. 4, p. 322
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- Article
Novel hysteresis effect in ultrathin epitaxial Gd<sub>2</sub>O<sub>3</sub> high-k dielectric.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2008, v. 11, n. 4, p. 324, doi. 10.15407/spqeo11.04.324
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- Article
Electrical and light-emitting properties of silicon dioxide co-implanted by carbon and silicon ions.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2008, v. 11, n. 4, p. 98, doi. 10.15407/spqeo11.04.319
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- Article
Hydrogen plasma treatment of silicon thin-film structures and nanostructured layers.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2008, v. 11, n. 2, p. 101, doi. 10.15407/spqeo11.02.101
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- Article
Influence of traps in gate oxide-Si film transition layers on FD MOSFET's characteristics at cryogenic temperatures.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2007, v. 10, n. 2, p. 34, doi. 10.15407/spqeo10.02.034
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- Article
Characterization of charge trapping processes in fully-depleted UNIBOND SOI MOSFET subjected to γ-irradiation.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006, v. 9, n. 2, p. 69, doi. 10.15407/spqeo9.02.069
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- Article
Effect of chemical and radiofrequency plasma treatment on photoluminescence of SiO<sub>x</sub> films.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006, v. 9, n. 1, p. 9, doi. 10.15407/spqeo9.01.009
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- Article
Modification of electroluminescence and charge trapping in germanium implanted metal-oxide silicon light-emitting diodes with plasma treatment.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005, v. 8, n. 1, p. 90, doi. 10.15407/spqeo8.01.090
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- Article
Bimetallic Sulfur-Reducing Additives Based on Al-MCM-41 Structured Aluminosilicate for Cracking Catalysts.
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- Petroleum Chemistry, 2018, v. 58, n. 3, p. 214, doi. 10.1134/S0965544118030088
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- Article
Mesoporous aluminosilicates as components of gas oil cracking and higher-alkane hydroisomerization catalysts.
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- Petroleum Chemistry, 2011, v. 51, n. 3, p. 151, doi. 10.1134/S0965544111030091
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- Article
Photovoltaic properties and photoconductivity in multilayer Ge/Si heterostructures with Ge nanoislands.
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- Journal of Materials Science, 2011, v. 46, n. 17, p. 5737, doi. 10.1007/s10853-011-5528-2
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- Article
Oxidation of Dibenzothiophene with the Subsequent Bioconversion of Sulfone.
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- Theoretical Foundations of Chemical Engineering, 2021, v. 55, n. 4, p. 778, doi. 10.1134/S0040579521040035
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- Article
A Review of Riverine Fluxes of Hexachlorocyclohexane and DDT to the Azov and Black Seas from the Former USSR and Russian Federation.
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- Journal of Environmental Science & Health. Part A. Toxic/Hazardous Substances & Environmental Engineering, 2003, v. 38, n. 5, p. 753, doi. 10.1081/ESE-120018589
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- Article
Kinetics of Structural and Phase Transformations in Thin SiO<sub>x</sub> Films in the Course of a Rapid Thermal Annealing.
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- Semiconductors, 2005, v. 39, n. 10, p. 1197, doi. 10.1134/1.2085270
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- Article
The Influence of Vacuum Annealing Temperature on the Fundamental Absorption Edge and Structural Relaxation of a-SiC:H Films.
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- Semiconductors, 2005, v. 39, n. 5, p. 572, doi. 10.1134/1.1923567
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- Article
Effect of Erbium on Electronic Traps in PECVD-grown a-Si:H(Er)/c-Si Structures.
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- Semiconductors, 2001, v. 35, n. 6, p. 621, doi. 10.1134/1.1379390
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- Article
Effect of PEDOT:PSS Layer Deposition on Electrical and Photoelectrical Properties of n<sup>+</sup>-ZnO/n-Si Heterostructure.
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- Journal of Electronic Materials, 2023, v. 52, n. 5, p. 3112, doi. 10.1007/s11664-023-10276-2
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- Article
Sulfur-Reducing Additives Based on Aluminosilicates Al-SBA-15 and Al-SBA-16 for Cracking catalysts.
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- Chemistry & Technology of Fuels & Oils, 2018, v. 54, n. 1, p. 15, doi. 10.1007/s10553-018-0892-0
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- Article
FORMATION AND STABILITY OF GOLD NANOPARTICLES IN COLLOIDS PREPARED BY CITRATE METHOD.
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- Chemistry, Physics & Technology of Surface / Khimiya, Fizyka ta Tekhnologiya Poverhni, 2023, v. 14, n. 3, p. 310, doi. 10.15407/hftp14.03.310
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- Article
The nature of white luminescence in SiO<sub>2</sub>:C layers.
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- Technical Physics Letters, 2009, v. 35, n. 6, p. 559, doi. 10.1134/S1063785009060224
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- Article
Quenching of electroluminescence and charge trapping in high-efficiency Ge-implanted MOS light-emitting silicon diodes.
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- Applied Physics B: Lasers & Optics, 2007, v. 87, n. 1, p. 129, doi. 10.1007/s00340-006-2534-1
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- Article