Works matching AU Konakova, R. V.
Results: 78
Electrical characteristics of GaAs LPE schottky diodes.
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- Crystal Research & Technology, 1983, v. 18, n. 11, p. 1451, doi. 10.1002/crat.2170181131
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Features of the Temperature Dependence of the Specific Contact Resistance of Au–Ti–Pd–n<sup>+</sup>–n-Si Diffusion Silicon Structures.
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- Semiconductors, 2019, v. 53, n. 4, p. 469, doi. 10.1134/S1063782619040055
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Formation mechanism of contact resistance to III–N heterostructures with a high dislocation density.
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- Semiconductors, 2013, v. 47, n. 9, p. 1180, doi. 10.1134/S1063782613090212
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Effect of Gamma Irradiation on Photoconversion Characteristics of Metal/Gallium Arsenide Barrier Structures with Textured Interface.
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- Technical Physics, 2002, v. 47, n. 6, p. 698, doi. 10.1134/1.1486191
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The Formation and Thermal Stability of Multilayer Ohmic Contacts to n-GaAs with TiB[sub x] and Mo Diffusion Barriers.
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- Technical Physics, 2000, v. 45, n. 11, p. 1452, doi. 10.1134/1.1325029
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Investigation of gallium arsenide single crystals with various crystallographic orientations, after implantation of silicon ions and pulsed photon annealing.
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- Technical Physics, 1999, v. 44, n. 5, p. 548, doi. 10.1134/1.1259381
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Influence of microwave treatment on the electrophysical characteristics of technically important semiconductors and surface-barrier structures.
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- Technical Physics, 1998, v. 43, n. 12, p. 1445, doi. 10.1134/1.1259222
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Silicon diffused diodes with nearly ideal current–voltage characteristics.
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- Technical Physics, 1998, v. 43, n. 10, p. 1257, doi. 10.1134/1.1259167
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Relationship between the electronic properties of the interface and the interphase interactions in NbN–GaAs heterostructures.
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- Technical Physics, 1998, v. 43, n. 1, p. 56, doi. 10.1134/1.1258936
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Properties of Al, (AuGe)–GaAs contacts fabricated by combining ion-beam treatment and metallization.
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- Technical Physics, 1997, v. 42, n. 2, p. 232, doi. 10.1134/1.1258631
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Nature of the transitional region during the deposition of titanium boride and nitride films on gallium arsenide.
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- Technical Physics Letters, 1999, v. 25, n. 10, p. 789, doi. 10.1134/1.1262636
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Formation of titanium oxide films on the surface of porous silicon carbide.
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- Technical Physics, 2008, v. 53, n. 9, p. 1232, doi. 10.1134/S1063784208090168
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Effect of Microwave Annealing on Silicon Dioxide/Silicon Carbide Structures.
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- Technical Physics, 2003, v. 48, n. 5, p. 598, doi. 10.1134/1.1576474
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Phase Interactions in TiN[sub x](TiB[sub x])–n-Si–n[sup +]-Si Contacts and Their Thermal Degradation Due to Rapid Thermal Annealing.
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- Technical Physics, 2003, v. 48, n. 4, p. 441, doi. 10.1134/1.1568486
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Redistribution of radiative recombination centers in the SiC/por-SiC/Dy<sub>2</sub>O<sub>3</sub> structure under the influence of athermal microwave irradiation.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2024, v. 27, n. 3, p. 274, doi. 10.15407/spqeo27.03.274
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Relationship between oxidation, stresses, morphology, local resistivity, and optical properties of TiO<sub>2</sub>, Gd<sub>2</sub>O<sub>3</sub>, Er<sub>2</sub>O<sub>3</sub>, SiO<sub>2</sub> thin films on SiC.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2023, v. 26, n. 3, p. 260, doi. 10.15407/spqeo26.03.260
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Redistribution of centers responsible for radiative recombination in SiC/por-SiC and SiC/por-SiC/Er<sub>2</sub>O<sub>3</sub> structures under nonthermal action of microwave radiation.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2022, v. 25, n. 4, p. 355, doi. 10.15407/spqeo25.04.355
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Comparative characteristics of TiO<sub>2</sub>(Er<sub>2</sub>O<sub>3</sub>, Dy<sub>2</sub>O<sub>3</sub>)/por-SiC/SiC heterostructures (Review).
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2020, v. 23, n. 3, p. 253, doi. 10.15407/spqeo23.03.253
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Peculiarities of study of Au-Ti-Pd-n<sup>+</sup>-n-n<sup>+</sup>-Si multilayer contact structure to avalanche transit-time diodes.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2019, v. 22, n. 1, p. 34, doi. 10.15407/spqeo22.01.34
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Method for data processing in application to ohmic contacts.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2019, v. 22, n. 1, p. 11, doi. 10.15407/spqeo22.01.11
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Thin dysprosium oxide films formed by rapid thermal annealing on porous SiC substrates.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2018, v. 21, n. 4, p. 360, doi. 10.15407/spqeo21.04.360
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Comparison of properties inherent to thin titanium oxide films formed by rapid thermal annealing on SiC and porous SiC substrates.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2018, v. 21, n. 2, p. 200, doi. 10.15407/spqeo21.02.200
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Physical mechanisms providing formation of ohmic contacts metal-semiconductor (Review).
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2018, v. 21, n. 1, p. 5, doi. 10.15407/spqeo21.01.005
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Optical properties of thin erbium oxide films formed by rapid thermal annealing on SiC substrates with different structures.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2017, v. 20, n. 4, p. 465, doi. 10.15407/spqeo20.04.465
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Transformation of impurity-defect centers in single crystals CdTe:Cl under the influence of microwaves.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2017, v. 20, n. 2, p. 250, doi. 10.15407/spqeo20.02.250
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Transformation of impurity-defect centers in single crystals CdTe:Cl under the influence of microwaves.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2017, v. 20, n. 2, p. 250, doi. 10.15407/spqeo20.02.250
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Theoretical and experimental modelling the specific resistance of vertical ohmic contacts Au-Ti-Pd-n<sup>+</sup>-n-n<sup>+</sup>-Si in IMPATT diodes.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2016, v. 19, n. 4, p. 366, doi. 10.15407/spqeo19.04.366
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Structural and electrical-physical properties of the ohmic contacts based on palladium to n<sup>+</sup>-n-n<sup>++</sup>-n<sup>+++</sup>-InP.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2015, v. 18, n. 4, p. 391, doi. 10.15407/spqeo18.04.391
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Ohmic contacts based on Pd to indium phosphide Gunn diodes.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2015, v. 18, n. 3, p. 317, doi. 10.15407/spqeo18.03.317
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Influence of pulse magnetic fields treatment on optical properties of GaAs based films.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2014, v. 17, n. 2, p. 130
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Effect of weak magnetic fields treatment on photoluminescence of III-V single crystals.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2014, v. 17, n. 1, p. 75
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On a feature of temperature dependence of contact resistivity for ohmic contacts to n-Si with an n<sup>+</sup>-n doping step.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2014, v. 17, n. 1, p. 1
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Mechanism of current flow and temperature dependence of contact resistivity in Au-Pd-Ti-Pd-n<sup>+</sup> -GaN ohmic contacts.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2013, v. 16, n. 4, p. 313
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Effect of microwave radiation on I-V curves and contact resistivity of ohmic contacts to n-GaN and n-AlN.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2013, v. 16, n. 3, p. 289
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Role of dislocations in formation of ohmic contacts to heavily doped n-Si.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2013, v. 16, n. 2, p. 99
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Investigation of resistance formation mechanisms for contacts to n-AlN and n-GaN with a high dislocation density.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2012, v. 15, n. 4, p. 351
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Technique and setup for diagnostics of p-n junction to case thermal resistance in high-power gallium nitride LEDs.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2012, v. 15, n. 2, p. 124
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Interface features of SiO<sub>2</sub>/SiC heterostructures according to methods for producing the SiO<sub>2</sub> thin films.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2012, v. 15, n. 1, p. 13
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Some aspects of thermal resistance measurement technique for IMPATT and light-emitting diodes.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2011, v. 14, n. 4, p. 465
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Temperature dependence of contact resistance of Au-Ti-Pd<sub>2</sub>Si-n<sup>+</sup>-Si ohmic contacts.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2010, v. 13, n. 4, p. 436, doi. 10.15407/spqeo13.04.436
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Formation of ohmic contacts to n(p)-gan and measurement of their contact resistivity.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2010, v. 13, n. 4, p. 337, doi. 10.15407/spqeo13.04.337
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Modification of properties of the glass--Si<sub>3</sub>N<sub>4</sub>-Si-SiO<sub>2</sub> structure at laser treatment.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2009, v. 12, n. 3, p. 284
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Heat-resistant barrier and ohmic contacts based on TiB<sub>x</sub> and ZrB<sub>x</sub> interstitial phases to microwave diode structures.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2008, v. 11, n. 3, p. 209, doi. 10.15407/spqeo11.03.209
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Microwave induced structural-impurity ordering of transition region in Ta<sub>2</sub>O<sub>5</sub> stacks on Si.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2008, v. 11, n. 4, p. 311, doi. 10.15407/spqeo11.04.311
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Development of high-stable contact systems to gallium nitride microwave diodes.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2007, v. 10, n. 4, p. 1
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On the tunnel mechanism of current flow in Au-TiB<sub>x</sub>-n-GaN-i-Al<sub>2</sub>O<sub>3</sub> Schottky barrier diodes.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2007, v. 10, n. 3, p. 1, doi. 10.15407/spqeo10.03.001
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A silicon carbide thermistor.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006, v. 9, n. 4, p. 67, doi. 10.15407/spqeo9.04.067
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Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006, v. 9, n. 2, p. 58, doi. 10.15407/spqeo9.02.058
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New technological possibilities to prepare InP epitaxial layers, as well as ohmic and barrier contacts to them, and the properties of microwave diodes made on their basis.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005, v. 8, n. 4, p. 105
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Novel technological possibilities for growth of GaAs autoepitaxial films, and properties of Gunn diodes made on their basis.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005, v. 8, n. 4, p. 65
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