Works matching DE "SEMICONDUCTOR-metal boundaries"
1
- Revista Cubana de Física, 2011, v. 28, n. 1, p. 35
- Borroto, A.;
- Del Río, L.;
- Arronte, M.;
- Altshuler, E.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 1, p. 159, doi. 10.1007/s10854-017-7900-8
- Büyükbaş Uluşan, A.;
- Tataroğlu, A.;
- Azizian-Kalandaragh, Y.;
- Altındal, Ş.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 9, doi. 10.1007/s10854-008-9586-4
- Reddy, V. Rajagopal;
- Sang-Ho Kim;
- Hyun-Gi Hong;
- Sang-Won Yoon;
- Jae-Pyoung Ahn;
- Tae-Yeon Seong
- Article
4
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 8, p. 805, doi. 10.1007/s10854-007-9210-z
- Article
5
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700639
- Yoo, Hocheon;
- Hong, Seongin;
- Moon, Hyunseong;
- On, Sungmin;
- Ahn, Hyungju;
- Lee, Han‐Koo;
- Kim, Sunkook;
- Hong, Young Ki;
- Kim, Jae‐Joon
- Article
6
- Telecommunication Engineering, 2014, v. 54, n. 9, p. 1280, doi. 10.3969/j.issn.1001-893x.2014.09.020
- Article
7
- Physica Status Solidi - Rapid Research Letters, 2016, v. 10, n. 11, p. 797, doi. 10.1002/pssr.201600209
- Giannazzo, F.;
- Fisichella, G.;
- Piazza, A.;
- Di Franco, S.;
- Greco, G.;
- Agnello, S.;
- Roccaforte, F.
- Article
8
- Advances in Condensed Matter Physics, 2010, p. 1, doi. 10.1155/2010/526929
- Article
9
- Modern Physics Letters B, 2013, v. 27, n. 15, p. -1, doi. 10.1142/S0217984913501108
- LIU, GANG;
- WU, MU SHENG;
- OUYANG, CHU YING;
- XU, BO
- Article
10
- PLoS ONE, 2018, v. 13, n. 12, p. 1, doi. 10.1371/journal.pone.0208239
- Yao, Lele;
- Li, Donghui;
- Liu, Lingling
- Article
11
- Materials Science (0137-1339), 2006, v. 24, n. 4, p. 929
- Bilozertseva, V. I.;
- Khlyap, H. M.;
- Shkumbatyuk, P. S.;
- Dyakonenko, N. L.;
- Krivonos, S. S.
- Article
12
- Radiophysics & Quantum Electronics, 2004, v. 47, n. 9, p. 688, doi. 10.1007/s11141-005-0006-9
- Boshkov, V. G.;
- Ziatzev, S. E.
- Article
13
- Chemistry - A European Journal, 2015, v. 21, n. 33, p. 11899, doi. 10.1002/chem.201405073
- Yuan, Kai;
- Chen, Lie;
- Chen, Yiwang
- Article
14
- Instruments & Experimental Techniques, 2003, v. 46, n. 3, p. 410, doi. 10.1023/A:1024443228073
- Article
15
- Catalysts (2073-4344), 2018, v. 8, n. 4, p. 161, doi. 10.3390/catal8040161
- Matamoros-Ambrocio, Mayra;
- Ruiz-Peralta, María De Lourdes;
- Chigo-Anota, Ernesto;
- García-Serrano, Jesús;
- Pérez-Centeno, Armando;
- Sánchez-Cantú, Manuel;
- Rubio-Rosas, Efraín;
- Escobedo-Morales, Alejandro
- Article
16
- Applied Physics A: Materials Science & Processing, 2009, v. 94, n. 4, p. 911, doi. 10.1007/s00339-008-4849-8
- Cheng, Jinguang;
- Sui, Yu;
- Wang, Yang;
- Wang, Xianjie;
- Su, Wenhui
- Article
17
- Applied Physics A: Materials Science & Processing, 2009, v. 94, n. 3, p. 633, doi. 10.1007/s00339-008-4848-9
- Rahman, Faiz;
- Sun Xu;
- Watson, Ian;
- Mutha, Dinesh;
- Oxland, Richard;
- Johnson, Nigel;
- Banerjee, Abhishek;
- Wasige, Edward
- Article
18
- Applied Physics A: Materials Science & Processing, 2005, v. 81, n. 3, p. 561, doi. 10.1007/s00339-004-2673-3
- Reddy, V. R.;
- Kim, S.-H.;
- Seong, T.-Y.
- Article
19
- Armenian Journal of Physics, 2015, v. 8, n. 1, p. 30
- Article
20
- International Journal of Modern Physics C: Computational Physics & Physical Computation, 2005, v. 16, n. 7, p. 1043, doi. 10.1142/S0129183105007704
- SELLAI, A.;
- OUENNOUGHI, Z.
- Article
21
- Semiconductors, 2016, v. 50, n. 6, p. 709, doi. 10.1134/S1063782616060233
- Stognei, O.;
- Maliki, A.;
- Grebennikov, A.;
- Semenenko, K.;
- Bulovatskaya, E.;
- Sitnikov, A.
- Article
22
- Semiconductors, 2015, v. 49, n. 4, p. 461, doi. 10.1134/S1063782615040193
- Sachenko, A.;
- Belyaev, A.;
- Boltovets, N.;
- Brunkov, P.;
- Jmerik, V.;
- Ivanov, S.;
- Kapitanchuk, L.;
- Konakova, R.;
- Klad'ko, V.;
- Romanets, P.;
- Saja, P.;
- Safryuk, N.;
- Sheremet, V.
- Article
23
- Semiconductors, 2011, v. 45, n. 8, p. 1009, doi. 10.1134/S1063782611080227
- Article
24
- Semiconductors, 2011, v. 45, n. 5, p. 593, doi. 10.1134/S1063782611050174
- Article
25
- Semiconductors, 2011, v. 45, n. 5, p. 599, doi. 10.1134/S1063782611050241
- Pavlyk, B.;
- Hrypa, A.;
- Slobodzyan, D.;
- Lys, R.;
- Shykoryak, J.;
- Didyk, R.
- Article
26
- Semiconductors, 2010, v. 44, n. 4, p. 463, doi. 10.1134/S1063782610040093
- Blank, T. V.;
- Goldberg, Yu. A.;
- Posse, E. A.;
- Soldatenkov, F. Yu.
- Article
27
- Semiconductors, 2008, v. 42, n. 11, p. 1315, doi. 10.1134/S1063782608110134
- Bessolov, V. N.;
- Blank, T. V.;
- Goldberg, Yu. A.;
- Konstantinov, O. V.;
- Posse, E. A.
- Article
28
- Semiconductors, 2008, v. 42, n. 4, p. 453, doi. 10.1134/S1063782608040143
- Belyaev, A.;
- Boltovets, N.;
- Ivanov, V.;
- Kamalov, A.;
- Kapitanchuk, L.;
- Konakova, R.;
- Kudryk, Ya.;
- Lytvyn, O.;
- Milenin, V.;
- Nasyrov, M.
- Article
29
- Semiconductors, 2007, v. 41, n. 3, p. 272, doi. 10.1134/S1063782607030050
- Article
30
- Semiconductors, 2006, v. 40, n. 10, p. 1173, doi. 10.1134/S1063782606100095
- Blank, T.;
- Gol'dberg, Yu.;
- Konstantinov, O.;
- Nikitin, V.;
- Posse, E.
- Article
31
- Semiconductors, 2004, v. 38, n. 9, p. 1036, doi. 10.1134/1.1797481
- Gurovich, B. A.;
- Aronzon, B. A.;
- Ryl'kov, V. V.;
- Ol'shansk&iitilde;, E. D.;
- Kuleshova, E. A.;
- Dolg&iitilde;, D. I.;
- Kovalev, D. Yu.;
- Filippov, V. I.
- Article
32
- Semiconductors, 2002, v. 36, n. 9, p. 1001, doi. 10.1134/1.1507282
- Article
33
- Semiconductors, 2002, v. 36, n. 9, p. 1043, doi. 10.1134/1.1507288
- Golubev, V. G.;
- Kurdyukov, D. A.;
- Pevtsov, A. B.;
- Sel’kin, A. V.;
- Shadrin, E. B.;
- Il’inskiı, A. V.;
- Boeyink, R.
- Article
34
- Semiconductors, 2001, v. 35, n. 5, p. 539, doi. 10.1134/1.1371618
- Bulyarskiı, S. V.;
- Zhukov, A. V.
- Article
35
- Semiconductors, 1998, v. 32, n. 12, p. 1270, doi. 10.1134/1.1187613
- Allen, T. Yu.;
- Nazhmudinov, Kh. G.;
- Polyanskaya, T. A.
- Article
36
- Semiconductors, 1998, v. 32, n. 11, p. 1196, doi. 10.1134/1.1187591
- Bozhkov, V. G.;
- Kagadeı, V. A.;
- Torkhov, N. A.
- Article
37
- Journal of Electronic Materials, 2019, v. 48, n. 3, p. 1754, doi. 10.1007/s11664-018-06889-7
- Mitra, Kunal;
- Mahapatra, S.;
- Dasgupta, T.
- Article
38
- Journal of Electronic Materials, 2018, v. 47, n. 9, p. 5099, doi. 10.1007/s11664-018-6414-3
- Das, H.;
- Sunkari, S.;
- Naas, H.
- Article
39
- Journal of Electronic Materials, 2017, v. 46, n. 11, p. 6563, doi. 10.1007/s11664-017-5696-1
- Bouzid, F.;
- Dehimi, L.;
- Pezzimenti, F.
- Article
40
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2802, doi. 10.1007/s11664-016-4375-y
- Liu, Dan;
- Lin, Chun;
- Zhou, Songmin;
- Hu, Xiaoning
- Article
41
- Journal of Electronic Materials, 2011, v. 40, n. 11, p. 2179, doi. 10.1007/s11664-011-1741-7
- Fang, Z.-Q.;
- Claflin, B.;
- Look, D.;
- Chai, F.;
- Odekirk, B.
- Article
42
- Journal of Electronic Materials, 2011, v. 40, n. 4, p. 433, doi. 10.1007/s11664-010-1411-1
- Catalfamo, Frank;
- Yen, Tingfang;
- Yun, Juhyung;
- Anderson, Wayne
- Article
43
- Journal of Electronic Materials, 2007, v. 36, n. 12, p. 1662, doi. 10.1007/s11664-007-0277-3
- Voss, L. F.;
- Stafford, L.;
- Khanna, R.;
- Gila, B. P.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Ren, F.;
- Kravchenko, I. I.
- Article
44
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. L15, doi. 10.1007/s11664-004-0251-2
- Chang, H. C.;
- Lee, C. S.;
- Chen, S. H.;
- Chang, E. Y.;
- He, J. Z.
- Article
45
- Advanced Functional Materials, 2014, v. 24, n. 22, p. 3357, doi. 10.1002/adfm.201303365
- You, Tiangui;
- Shuai, Yao;
- Luo, Wenbo;
- Du, Nan;
- Bürger, Danilo;
- Skorupa, Ilona;
- Hübner, René;
- Henker, Stephan;
- Mayr, Christian;
- Schüffny, René;
- Mikolajick, Thomas;
- Schmidt, Oliver G.;
- Schmidt, Heidemarie
- Article
46
- Technical Physics, 2013, v. 58, n. 11, p. 1619, doi. 10.1134/S1063784213110170
- Lunin, L. S.;
- Karapet’yan, G. Ya.;
- Dneprovskii, V. G.;
- Kataev, V. F.
- Article
47
- Technical Physics, 2007, v. 52, n. 2, p. 285, doi. 10.1134/S1063784207020235
- Blank, T.;
- Gol’dberg, Yu.;
- Konstantinov, O.;
- Nikitin, V.;
- Posse, E.
- Article
48
- Technical Physics, 2002, v. 47, n. 9, p. 1134, doi. 10.1134/1.1508078
- Klimov, V. A.;
- Timofeeva, I. O.;
- Khanin, S. D.;
- Shadrin, E. B.;
- Ilinskiı, A. V.;
- Silva-Andrade, F.
- Article
49
- Technical Physics, 2002, v. 47, n. 7, p. 932, doi. 10.1134/1.1495063
- Melkikh, A. V.;
- Povzner, A. A.
- Article
50
- Technical Physics, 2001, v. 46, n. 9, p. 1128, doi. 10.1134/1.1404165
- Gol’dberg, Yu. A.;
- Posse, E. A.
- Article