Works matching IS 10637826 AND DT 1999 AND VI 33 AND IP 6
Results: 29
PUBLICATION OF THE SEMINAR PROCEEDINGS IS DEDICATED TO THE MEMORY OF V. F MASTEROV INTAS–RFBR Seminar on Rare-Earth Impurities in Semiconductors and Low-Dimensional Semiconductor Structures, St. Petersburg State Technical University, October...
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- Semiconductors, 1999, v. 33, n. 6, p. 595, doi. 10.1134/1.1187735
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Erbium-doped silicon epilayers grown by liquid-phase epitaxy.
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- Semiconductors, 1999, v. 33, n. 6, p. 596, doi. 10.1134/1.1187762
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Photoluminescence of erbium-doped silicon: excitation power dependence.
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- Semiconductors, 1999, v. 33, n. 6, p. 598, doi. 10.1134/1.1187736
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Impurity centers in silicon doped with rare-earth impurities of dysprosium, holmium, erbium, and ytterbium.
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- Semiconductors, 1999, v. 33, n. 6, p. 603, doi. 10.1134/1.1187737
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Redistribution of erbium during the crystallization of buried amorphous silicon layers.
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- Semiconductors, 1999, v. 33, n. 6, p. 606, doi. 10.1134/1.1187738
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Influence of intrinsic point defects on the formation of structural defects and optically active centers during the annealing of erbium- and dysprosium-implanted silicon.
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- Semiconductors, 1999, v. 33, n. 6, p. 610, doi. 10.1134/1.1187763
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Influence of the orientation of the silicon substrate on the properties of avalanche Si:Er:O light-emitting structures.
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- Semiconductors, 1999, v. 33, n. 6, p. 613, doi. 10.1134/1.1187739
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Mechanisms of excitation of the f-f emission in silicon codoped with erbium and oxygen.
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- Semiconductors, 1999, v. 33, n. 6, p. 616, doi. 10.1134/1.1187740
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Mechanism of erbium electroluminescence in hydrogenated amorphous silicon.
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- Semiconductors, 1999, v. 33, n. 6, p. 622, doi. 10.1134/1.1187741
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Effect of annealing on the optical and structural properties of GaN:Er.
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- Semiconductors, 1999, v. 33, n. 6, p. 624, doi. 10.1134/1.1187742
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Optical activity of Yb in GaAs and low-dimensional GaAs/GaAlAs structures.
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- Semiconductors, 1999, v. 33, n. 6, p. 627, doi. 10.1134/1.1187743
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Photothermoacoustic and photoelectric microscopy of silicon.
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- Semiconductors, 1999, v. 33, n. 6, p. 630, doi. 10.1134/1.1187744
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Radiation-thermal activation of silicon implanted in gallium arsenide.
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- Semiconductors, 1999, v. 33, n. 6, p. 636, doi. 10.1134/1.1187745
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Photoionization of short-range acceptor states in uniaxially deformed semiconductors.
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- Semiconductors, 1999, v. 33, n. 6, p. 640, doi. 10.1134/1.1187746
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Electric and luminescence properties of GaAs–A[sup II]B[sup IV]C[sub 2][sup V] single crystals.
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- Semiconductors, 1999, v. 33, n. 6, p. 645, doi. 10.1134/1.1187747
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Reciprocal drag of electrons and phonons in strongly doped HgFeSe semiconductors.
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- Semiconductors, 1999, v. 33, n. 6, p. 648, doi. 10.1134/1.1187748
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Scanning tunneling microscopy investigation of the microtopography of SiO[sub 2] and Si surfaces at the Si/SiO[sub 2] interface in SIMOX structures.
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- Semiconductors, 1999, v. 33, n. 6, p. 654, doi. 10.1134/1.1187749
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Reconstruction and electron states of a Ga[sub 2]Se[sub 3]–GaAsheterointerface.
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- Semiconductors, 1999, v. 33, n. 6, p. 658, doi. 10.1134/1.1187750
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Sulfide passivation of GaAs power diodes.
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- Semiconductors, 1999, v. 33, n. 6, p. 662, doi. 10.1134/1.1187751
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Electron states in the surface region of gallium arsenide treated in selenium and arsenic vapor.
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- Semiconductors, 1999, v. 33, n. 6, p. 665, doi. 10.1134/1.1187752
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Deep-level recombination spectroscopy in GaP light-emitting diodes.
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- Semiconductors, 1999, v. 33, n. 6, p. 668, doi. 10.1134/1.1187753
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Influence of temperature on the spectral composition of the breakdown electroluminescence of silicon carbide p-n structures.
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- Semiconductors, 1999, v. 33, n. 6, p. 672, doi. 10.1134/1.1187754
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Self-organization of quantum dots in multilayer InAs/GaAs and InGaAs/GaAs structures in submonolayer epitaxy.
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- Semiconductors, 1999, v. 33, n. 6, p. 677, doi. 10.1134/1.1187755
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Dimensionality effects in the hot-electron photoluminescence of gallium arsenide: 2D–quasi-3D transition.
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- Semiconductors, 1999, v. 33, n. 6, p. 681, doi. 10.1134/1.1187756
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Effect of substrate material on the rate of growth and the optical parameters of a-C : H layers.
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- Semiconductors, 1999, v. 33, n. 6, p. 684, doi. 10.1134/1.1187757
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Photosensitivity of GaAlAs/GaAs heterophotoelements in linearly polarized light.
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- Semiconductors, 1999, v. 33, n. 6, p. 689
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Increasing the power of broad-waveguide lasers by additional selection of transverse modes.
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- Semiconductors, 1999, v. 33, n. 6, p. 693, doi. 10.1134/1.1187759
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Gain and internal losses in InGaAsSb/InAsSbP double-heterostructure lasers.
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- Semiconductors, 1999, v. 33, n. 6, p. 700, doi. 10.1134/1.1187760
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In Memory of Vadim Fedorovich Masterov.
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- Semiconductors, 1999, v. 33, n. 6, p. 704, doi. 10.1134/1.1187761
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