Works matching DE "ELECTRON beam lithography"


Results: 460
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    Favored SCALPEL's continued progress.

    Published in:
    Solid State Technology, 1999, v. 42, n. 7, p. 73
    By:
    • Harriott, Lloyd;
    • Waskiewicz, Warren;
    • Novembre, Anthony;
    • Liddle, J. Alexander
    Publication type:
    Article
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    Covalent Patterning of 2D MoS<sub>2</sub>.

    Published in:
    Chemistry - A European Journal, 2021, v. 27, n. 52, p. 13117, doi. 10.1002/chem.202102021
    By:
    • Chen, Xin;
    • Kohring, Malte;
    • Assebban, M'hamed;
    • Tywoniuk, Bartłomiej;
    • Bartlam, Cian;
    • Moses Badlyan, Narine;
    • Maultzsch, Janina;
    • Duesberg, Georg S.;
    • Weber, Heiko B.;
    • Knirsch, Kathrin C.;
    • Hirsch, Andreas
    Publication type:
    Article
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    Electrical Detection of Magnetic Skyrmions in a Magnetic Tunnel Junction.

    Published in:
    Advanced Electronic Materials, 2023, v. 9, n. 1, p. 1, doi. 10.1002/aelm.202200570
    By:
    • Guang, Yao;
    • Zhang, Like;
    • Zhang, Junwei;
    • Wang, Yadong;
    • Zhao, Yuelei;
    • Tomasello, Riccardo;
    • Zhang, Senfu;
    • He, Bin;
    • Li, Jiahui;
    • Liu, Yizhou;
    • Feng, Jiafeng;
    • Wei, Hongxiang;
    • Carpentieri, Mario;
    • Hou, Zhipeng;
    • Liu, Junming;
    • Peng, Yong;
    • Zeng, Zhongming;
    • Finocchio, Giovanni;
    • Zhang, Xixiang;
    • Coey, John Michael David
    Publication type:
    Article
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    Smuggling light through opaque materials.

    Published in:
    Physics & Chemistry of Glasses: European Journal of Glass Science & Technology Part B, 2021, v. 62, n. 5, p. 165
    By:
    • Kingery, Ken
    Publication type:
    Article
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    Geometrical dependence of optical negative index meta-materials at 1.55 μm.

    Published in:
    Applied Physics A: Materials Science & Processing, 2009, v. 95, n. 4, p. 1119, doi. 10.1007/s00339-009-5139-9
    By:
    • Wu, Wei;
    • Ponizovskaya, Ekaterina;
    • Kim, Evgenia;
    • Cho, David;
    • Bratkovsky, Alexander;
    • Yu, Zhaoning;
    • Xia, Qiangfei;
    • Li, Xuema;
    • Shen, Y. Ron;
    • Wang, S. Y.;
    • Williams, R. Stanley
    Publication type:
    Article
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