Works matching DE "BIPOLAR integrated circuits"
1
- Measurement Techniques, 2007, v. 50, n. 7, p. 763, doi. 10.1007/s11018-007-0146-8
- Article
2
- Advanced Electronic Materials, 2017, v. 3, n. 12, p. n/a, doi. 10.1002/aelm.201700283
- Sun, Xinxing;
- Roß, Ulrich;
- Gerlach, Jürgen W.;
- Lotnyk, Andriy;
- Rauschenbach, Bernd
- Article
3
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 986, doi. 10.1002/j.2168-0159.2014.tb00256.x
- Hu, Zhijin;
- Liao, Congwei;
- Li, Junmei;
- Li, Wenjie;
- Zhang, Shengdong;
- Zeng, Limei;
- Lee, Chang‐Yeh;
- Lai, Tzu‐Chieh;
- Lo, Chang‐Cheng;
- Lien, A.
- Article
4
- Pacing & Clinical Electrophysiology, 1996, v. 19, n. 11, p. 2014, doi. 10.1111/j.1540-8159.1996.tb03272.x
- Goldman, Daniel S.;
- Buck, Jerrick C.;
- Larnard, Donald J.
- Article
5
- Pacing & Clinical Electrophysiology, 1993, v. 16, n. 7, p. 1368, doi. 10.1111/j.1540-8159.1993.tb01730.x
- Mauser, Jonathan F.;
- Huang, Shoei K. Stephen;
- Risser, Thomas;
- Bonavita, Gregory J.;
- Wagshal, Alan B.;
- Mittleman, Robert S.;
- Cuello, Carlos
- Article
6
- Pacing & Clinical Electrophysiology, 1991, v. 14, n. 11, p. 1917, doi. 10.1111/j.1540-8159.1991.tb02790.x
- Callans, David J.;
- Hook, Bruce G.;
- Marchlinski, Francis G.
- Article
7
- International Materials Reviews, 2007, v. 52, n. 1, p. 1, doi. 10.1179/174328006X102556
- Cunningham, B. D.;
- Huang, J.;
- Baird, D. G.
- Article
8
- Leukos, 2016, v. 12, n. 4, p. 203, doi. 10.1080/15502724.2015.1134333
- Xu, Kaikai;
- Ogudo, Kingsley A.;
- Polleux, Jean-Luc;
- Viana, Carlos;
- Ma, Zhengfei;
- Li, Zebin;
- Yu, Qi;
- Li, Guannpyng;
- Snyman, Lukas W.
- Article
9
- Journal of Dermatologic Surgery & Oncology, 1978, v. 4, n. 3, p. 235, doi. 10.1111/j.1524-4725.1978.tb00418.x
- Article
10
- Instruments & Experimental Techniques, 2010, v. 53, n. 6, p. 825, doi. 10.1134/S0020441210060102
- Ul'maskulov, M.;
- Shunailov, S.;
- Sharypov, K.;
- Shpak, V.;
- Yalandin, M.
- Article
11
- EE: Evaluation Engineering, 2019, v. 58, n. 5, p. 18
- Article
12
- Semiconductors, 2007, v. 41, n. 10, p. 1185, doi. 10.1134/S1063782607100119
- Article
13
- Journal of Electronic Materials, 2017, v. 46, n. 4, p. 2147, doi. 10.1007/s11664-016-5148-3
- Chen, Kai-Huang;
- Cheng, Chien-Min;
- Kao, Ming-Cheng;
- Chang, Kuan-Chang;
- Chang, Ting-Chang;
- Tsai, Tsung-Ming;
- Wu, Sean;
- Su, Feng-Yi
- Article
14
- Journal of Electronic Materials, 2006, v. 35, n. 9, p. 1712, doi. 10.1007/s11664-006-0223-9
- Changhyun Yi;
- Tong-Ho Kim;
- Brown, April S.
- Article
15
- Microwave & Optical Technology Letters, 2003, v. 38, n. 5, p. 384, doi. 10.1002/mop.11067
- Article
16
- Microwave & Optical Technology Letters, 1996, v. 11, n. 3, p. 150, doi. 10.1002/(SICI)1098-2760(19960220)11:3<150::AID-MOP11>3.0.CO;2-F
- Ohkubo, Michio;
- Ikeda, Nariaki;
- Ninomiya, Takao
- Article
17
- Microwave & Optical Technology Letters, 1994, v. 7, n. 16, p. 767, doi. 10.1002/mop.4650071614
- Youngseok Seo;
- Kim, Bumman
- Article
18
- Communications in Statistics: Simulation & Computation, 2005, v. 34, n. 1, p. 145, doi. 10.1081/SAC-200047092
- FIGUEIREDO, ADELAIDE;
- GOMES, PAULO
- Article
19
- Applied Physics A: Materials Science & Processing, 2017, v. 123, n. 5, p. 1, doi. 10.1007/s00339-017-0936-z
- Choi, Sang-Jun;
- Kim, Ki-Hong;
- Yang, Woo-Young;
- Kim, Sohyeon;
- Oh, Semi;
- Kim, Kyoung-Kook;
- Kim, Yunkyung;
- Hong, Minki;
- Nam, Kiyoung;
- Cho, Soohaeng
- Article
20
- Applied Physics A: Materials Science & Processing, 2010, v. 100, n. 4, p. 987, doi. 10.1007/s00339-010-5910-y
- Xinman Chen;
- Guangheng Wu;
- Hailei Zhang;
- Ni Qin;
- Tao Wang;
- Feifei Wang;
- Wangzhou Shi;
- Dinghua Bao
- Article
21
- Measurements, 2007, v. 39, n. 1, p. 9
- Zajankauskas, S.;
- Ibenskis, E.
- Article
22
- Journal of Neuroscience, 2012, v. 32, n. 30, p. 10306, doi. 10.1523/JNEUROSCI.1581-12.2012
- Dunn, Felice A.;
- Wong, Rachel O. L.
- Article
23
- Optical & Quantum Electronics, 2008, v. 40, n. 7, p. 513, doi. 10.1007/s11082-008-9236-3
- Karbassian, M. M.;
- Ghafouri-Shiraz, H.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 9, p. 770, doi. 10.1049/el.2015.4348
- Raad, B.;
- Nigam, K.;
- Sharma, D.;
- Kondekar, P.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 13, p. 1027, doi. 10.1049/el.2015.0115
- Bramhane, L. K.;
- Upadhyay, N.;
- Veluru, J. R.;
- Singh, J.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 24, p. 1805, doi. 10.1049/el.2014.2432
- Lei Yuan;
- Yuming Zhang;
- Qingwen Song;
- Xiaoyan Tang;
- Yimen Zhang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 20, p. 1461, doi. 10.1049/el.2014.2407
- Sahu, C.;
- Ganguly, A.;
- Singh, J.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 15, p. 1070, doi. 10.1049/el.2014.0186
- Hasnaoui, I.;
- Pottrain, A.;
- Lacave, T.;
- Chevalier, P.;
- Gloria, D.;
- Gaquiere, C.
- Article
29
- Journal of Electrical Engineering: Theory & Application, 2010, v. 1, n. 2, p. 120
- Boukhris, I.;
- Belgaroui, E.;
- Kallel, A.
- Article
30
- Journal of Circuits, Systems & Computers, 2013, v. 22, n. 7, p. -1, doi. 10.1142/S0218126613500552
- SHI, LING-FENG;
- ZENG, AI-QIN;
- LI, QIN-QIN;
- CHENG, LI-YE;
- LAI, XIN-QUAN
- Article
31
- Journal of Circuits, Systems & Computers, 2011, v. 20, n. 4, p. 781, doi. 10.1142/S0218126611007608
- SAPONARA, SERGIO;
- BALDETTI, TOMMASO;
- FANUCCI, LUCA;
- VOLPI, EMILIO;
- D'ASCOLI, FRANCESCO
- Article
32
- Journal of Circuits, Systems & Computers, 2010, v. 19, n. 6, p. 1333, doi. 10.1142/S0218126610006700
- RAUT, RABIN;
- DEVABHAKTUNI, VIJAY;
- ROY, NILADRI
- Article
33
- Journal of Circuits, Systems & Computers, 2010, v. 19, n. 3, p. 719, doi. 10.1142/S0218126610006396
- Article
34
- Journal of Circuits, Systems & Computers, 2009, v. 18, n. 3, p. 519, doi. 10.1142/S0218126609005253
- Article
35
- Journal of Circuits, Systems & Computers, 2005, v. 14, n. 2, p. 179, doi. 10.1142/S0218126605002234
- Zhou, K.;
- Guo, J.-R.;
- You, C.;
- Mayega, J.;
- Kraft, R. P.;
- Zhang, T.;
- McDonald, J. F.;
- Goda, B. S.
- Article
36
- International Journal of RF & Microwave Computer-Aided Engineering, 2005, v. 15, n. 2, p. 203, doi. 10.1002/mmce.20069
- Taher, H.;
- Schreurs, D.;
- Nauwelaers, B.
- Article
37
- Technical Physics Letters, 2010, v. 36, n. 10, p. 945, doi. 10.1134/S1063785010100214
- Gorbatyuk, A. V.;
- Grekhov, I. V.;
- Gusin, D. V.
- Article
38
- Technical Journal of University of Engineering & Technology Taxila, 2016, v. 21, n. 1, p. 32
- Article
39
- International Journal of Intelligent Systems, 2011, v. 26, n. 5, p. 426, doi. 10.1002/int.20475
- Article
40
- International Journal of Intelligent Systems, 2008, v. 23, n. 10, p. 1135, doi. 10.1002/int.20310
- Prade, Henri;
- Serrurier, Mathieu
- Article
41
- Symmetry (20738994), 2019, v. 11, n. 2, p. 154, doi. 10.3390/sym11020154
- Zhang, Jizuo;
- Chen, Jianjun;
- Huang, Pengcheng;
- Li, Shouping;
- Fang, Liang
- Article
42
- Journal of Active & Passive Electronic Devices, 2012, v. 7, n. 1/2, p. 61
- Herencsar, Norbert;
- Koton, Jaroslav;
- Vrba, Kamil;
- Lattenberg, Ivo
- Article
43
- Journal of Active & Passive Electronic Devices, 2011, v. 6, n. 3/4, p. 239
- KUMNGERN, MONTREE;
- DEJHAN, KOBCHAI
- Article
44
- Advanced Functional Materials, 2017, v. 27, n. 10, p. n/a, doi. 10.1002/adfm.201604604
- Rani, Adila;
- Velusamy, Dhinesh Babu;
- Marques Mota, Filipe;
- Jang, Yoon Hee;
- Kim, Richard Hahnkee;
- Park, Cheolmin;
- Kim, Dong Ha
- Article
45
- Astrophysics & Space Science, 2014, v. 351, n. 1, p. 159, doi. 10.1007/s10509-014-1813-2
- Article
46
- Journal of Applied Spectroscopy, 2013, v. 80, n. 3, p. 473, doi. 10.1007/s10812-013-9790-8
- Blynski, V.;
- Holub, E.;
- Lemeshevskaya, A.
- Article
47
- Journal of Applied Spectroscopy, 2010, v. 77, n. 3, p. 445, doi. 10.1007/s10812-010-9353-1
- Blynskii, V. I.;
- Bozhatkin, O. A.;
- Golub, E. S.;
- Lemeshevskaya, A. M.;
- Shvedov, S. V.
- Article
48
- Journal of Applied Spectroscopy, 2008, v. 75, n. 4, p. 608, doi. 10.1007/s10812-008-9089-3
- Blynskii, V. I.;
- Emel'yanov, V. A.;
- Golub, E. S.;
- Lemeshevskaya, A. M.;
- Shvedov, S. V.
- Article
49
- IET Generation, Transmission & Distribution (Wiley-Blackwell), 2021, v. 15, n. 23, p. 3256, doi. 10.1049/gtd2.12258
- Xiao, Zhengguang;
- Zheng, Xiaodong;
- Tai, Nengling;
- Fan, Chunju;
- He, Yangyang
- Article
50
- IET Generation, Transmission & Distribution (Wiley-Blackwell), 2018, v. 12, n. 5, p. 1231, doi. 10.1049/iet-gtd.2016.1943
- Yizhen Wang;
- Zhichang Yuan;
- Weijie Wen;
- Yirun Ji;
- Jiao Fu;
- Yan Li;
- Yuming Zhao
- Article