Works matching DE "PHOTORESISTORS"
1
- Angewandte Chemie, 2014, v. 126, n. 1, p. 248, doi. 10.1002/ange.201306763
- Zhang, Yuan;
- Wang, Mingfeng;
- Collins, Samuel D.;
- Zhou, Huiqiong;
- Phan, Hung;
- Proctor, Christopher;
- Mikhailovsky, Alexander;
- Wudl, Fred;
- Nguyen, Thuc ‐ Quyen
- Article
2
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13941, doi. 10.1007/s10854-018-9527-9
- Karasyuk, P.;
- Shepelytskyi, Y.;
- Semeniuk, O.;
- Bubon, O.;
- Juska, G.;
- Blevis, I.;
- Reznik, A.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 10, p. 7083, doi. 10.1007/s10854-017-6409-5
- Panneerselvam, Dhilippan;
- Kabir, M.
- Article
4
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 9, p. 6685, doi. 10.1007/s10854-017-6360-5
- Ganesh, T.;
- SivaKumar, M.;
- Kumar, R.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 6, p. 6271, doi. 10.1007/s10854-016-4559-5
- Álvarez-Fernández, Armando;
- Maldonado, José-Luis;
- Pérez-Gutiérrez, Enrique;
- Rodríguez, Mario;
- Ramos-Ortíz, Gabriel;
- Barbosa-García, Oracio;
- Meneses-Nava, Marco-Antonio;
- Zolotukhin, Mikhail
- Article
6
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 12, p. 2083, doi. 10.1007/s10854-012-0833-3
- Kouissa, S.;
- Djemel, A.;
- Aida, M.
- Article
7
- Measurement Techniques, 2011, v. 54, n. 6, p. 712, doi. 10.1007/s11018-011-9792-y
- Miroshnikova, I.;
- Astakhov, V.;
- Zenova, E.;
- Tagachenkov, A.;
- Rachnikov, D.
- Article
8
- Measurement Techniques, 2010, v. 53, n. 6, p. 620, doi. 10.1007/s11018-010-9551-5
- Miroshnikova, I.;
- Komissarov, A.;
- Miroshnikov, B.
- Article
9
- Advanced Electronic Materials, 2017, v. 3, n. 12, p. n/a, doi. 10.1002/aelm.201700293
- Gan, Zhikai;
- Zhou, Peiqi;
- Huang, Xu;
- Mei, Chunlian;
- Wang, Hui
- Article
10
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201600409
- Lai, Stefano;
- Cosseddu, Piero;
- Basiricò, Laura;
- Ciavatti, Andrea;
- Fraboni, Beatrice;
- Bonfiglio, Annalisa
- Article
11
- Acta Technica Corviniensis - Bulletin of Engineering, 2014, v. 7, n. 2, p. 31
- VASKOVIĆ, Mina;
- JURIŠEVIĆ, Marko;
- BABAJIĆ, Nenad;
- MATIJEVIĆ, Milan
- Article
12
- Caderno Brasileiro de Ensino de Física, 2023, v. 45, p. 1, doi. 10.1590/1806-9126-RBEF-2023-0288
- Xiaojing Wen;
- Korsun, Igor;
- Kryzhanovskyi, Serhii
- Article
13
- Journal of Imaging Science & Technology, 2012, v. 56, n. 6, p. 1, doi. 10.2352/J.ImagingSci.Technol.12.56.6.060501
- Tokarski, Zbigniew;
- Ahn, Yong-Jin;
- Jung, Soo-Yong
- Article
14
- Chemistry - A European Journal, 2015, v. 21, n. 25, p. 8986, doi. 10.1002/chem.201582513
- Article
15
- Electrica, 2021, v. 21, n. 1, p. 168, doi. 10.5152/electrica.2020.20038
- Kholodnov, Viacheslav Aleksandrovich;
- Nikitin, Mikhail Stepanovich
- Article
16
- Computer Measurement & Control, 2018, v. 26, n. 5, p. 286, doi. 10.16526/j.cnki.11-4762/tp.2018.05.071
- Article
17
- Instruments & Experimental Techniques, 2010, v. 53, n. 3, p. 447, doi. 10.1134/S002044121003022X
- Aliev, A. A.;
- Kuliev, Sh. M.;
- Mamedov, A. K.;
- Mukhtarova, R. I.
- Article
18
- International Journal of Advanced Research in Computer Science, 2017, v. 8, n. 9, p. 794, doi. 10.26483/ijarcs.v8i9.5025
- Saxena, Akansh;
- Singh, Pawan
- Article
19
- Semiconductors, 2018, v. 52, n. 12, p. 1586, doi. 10.1134/S1063782618120230
- Spirin, K. E.;
- Gaponova, D. M.;
- Marem’yanin, K. V.;
- Rumyantsev, V. V.;
- Gavrilenko, V. I.;
- Mikhailov, N. N.;
- Dvoretsky, S. A.
- Article
20
- Semiconductors, 2018, v. 52, n. 2, p. 231, doi. 10.1134/S1063782618020082
- Miroshnikov, B.;
- Miroshnikova, I.;
- Popov, A.
- Article
21
- Semiconductors, 2014, v. 48, n. 11, p. 1490, doi. 10.1134/S1063782614110220
- Article
22
- Semiconductors, 2013, v. 47, n. 4, p. 574, doi. 10.1134/S1063782613040179
- Mukhamedzyanov, H.;
- Markov, V.;
- Maskaeva, L.
- Article
23
- Semiconductors, 2001, v. 35, n. 4, p. 451, doi. 10.1134/1.1365193
- Ryzhkov, V. N.;
- Ibragimova, M. I.;
- Baryshev, N. S.
- Article
24
- Semiconductors, 1999, v. 33, n. 7, p. 799, doi. 10.1134/1.1187785
- Osipov, V. V.;
- Selyakov, A. Yu.;
- Foygel, M.
- Article
25
- Journal of Electronic Materials, 2022, v. 51, n. 3, p. 953, doi. 10.1007/s11664-021-09362-0
- Article
26
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3092, doi. 10.1007/s11664-014-3248-5
- Hong, K.;
- Jeong, T.;
- Youn, C.
- Article
27
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3006, doi. 10.1007/s11664-013-2654-4
- Gaucher, A.;
- Baylet, J.;
- Rothman, J.;
- Martinez, E.;
- Cardinaud, C.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 13, p. 17791, doi. 10.1007/s10854-021-06315-5
- Koptyaev, Andrey I.;
- Travkin, Vlad V.;
- Sachkov, Yury I.;
- Romanenko, Yuliya V.;
- Pakhomov, Georgy L.
- Article
29
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 24, p. 21059, doi. 10.1007/s10854-019-02475-7
- Kabir, M. Z.;
- Arnab, Salman M.;
- Hijazi, Nour
- Article
30
- Polymers for Advanced Technologies, 2019, v. 30, n. 2, p. 304, doi. 10.1002/pat.4466
- Terada, Kiwamu;
- Furutani, Masahiro;
- Arimitsu, Koji
- Article
31
- Astronomy & Astrophysics / Astronomie et Astrophysique, 2018, v. 617, p. N.PAG, doi. 10.1051/0004-6361/201731975
- Parikka, A.;
- Habart, E.;
- Bernard-Salas, J.;
- Köhler, M.;
- Abergel, A.
- Article
32
- Current Agriculture Research Journal, 2023, v. 11, n. 3, p. 1023, doi. 10.12944/CARJ.11.3.30
- NAGALINGAM, RAJESWARAN;
- CHINTAMANENI, VIJAYALAKSHMI;
- PARAMASIVAN, KANNAN;
- PONNUSAMY, MURUGANANTHAM
- Article
33
- Technical Physics Letters, 1997, v. 23, n. 1, p. 82, doi. 10.1134/1.1261624
- Kholodnov, V. A.;
- Drugova, A. A.
- Article
34
- Applied Physics A: Materials Science & Processing, 2010, v. 100, n. 2, p. 401, doi. 10.1007/s00339-010-5852-4
- Dun, Aihuan;
- Wei, Jingsong;
- Gan, Fuxi
- Article
35
- Nature Communications, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41467-022-32659-5
- Neu, Jens;
- Shipps, Catharine C.;
- Guberman-Pfeffer, Matthew J.;
- Shen, Cong;
- Srikanth, Vishok;
- Spies, Jacob A.;
- Kirchhofer, Nathan D.;
- Yalcin, Sibel Ebru;
- Brudvig, Gary W.;
- Batista, Victor S.;
- Malvankar, Nikhil S.
- Article
36
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2012, v. 26, n. 31, p. 1250137-1, doi. 10.1142/S0217979212501378
- AMIRHOSEINY, M.;
- HASSAN, Z.;
- NG, S. S.;
- CHUAH, L. S.;
- AHMAD, M. A.;
- YUSOF, Y.
- Article
37
- Psychophysiology, 1990, v. 27, n. 5, p. 599, doi. 10.1111/j.1469-8986.1990.tb01983.x
- Durkin, Martin;
- Prescott, Louisa;
- Jonet, C. Jean;
- Frank, Elaine;
- Niggel, Michael;
- Powell, Donald A.
- Article
38
- Journal of Material Cycles & Waste Management, 2016, v. 18, n. 2, p. 366, doi. 10.1007/s10163-014-0339-6
- Chaniago, Yus;
- Kim, Jae-Kyeong;
- Park, Myung-Jun;
- Koo, Kee-Kahb;
- Lee, Moonyong
- Article
39
- Optical & Quantum Electronics, 2014, v. 46, n. 10, p. 1297, doi. 10.1007/s11082-013-9857-z
- Wanyan, Jingjing;
- Sun, Zhaoqi;
- Shi, Shiwei;
- Wu, Mingzai;
- He, Gang;
- Li, Guang
- Article
40
- Journal of Electrical & Computer Engineering Innovations (JECEI), 2022, v. 10, n. 2, p. 363, doi. 10.22061/JECEI.2022.8487.517
- Mehrfar, A. H.;
- Majd, A. Eslami
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1596, doi. 10.1049/el.2017.2769
- Billet, M.;
- Desmet, Y.;
- Bavedila, F.;
- Barbieri, S.;
- Hänsel, W.;
- Holzwarth, R.;
- Ducournau, G.;
- Lampin, J.-F.;
- Peytavit, E.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4463
- Heves, E.;
- Ozturk, C.;
- Gurbuz, Y.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 3, p. 70, doi. 10.1049/el.2012.3993
- Peytavit, E.;
- Formont, S.;
- Lampin, J. -F.
- Article
44
- Applied Solar Energy (19349424), 2019, v. 55, n. 1, p. 1, doi. 10.3103/S0003701X19010110
- Razykov, T. M.;
- Bosio, A.;
- Romeo, N.;
- Ergashev, B. A.;
- Mavlonov, A. A.;
- Usmonov, A. Yu.;
- Esanov, Sh. A.
- Article
45
- Applied Solar Energy (19349424), 2010, v. 46, n. 4, p. 298, doi. 10.3103/S0003701X10040134
- Karimov, M.;
- Makhkamov, Sh.;
- Makhmudov, Sh.;
- Muminov, R.;
- Rakhmatov, A.;
- Sandler, L.;
- Sattiev, A.;
- Sulaimanov, A.;
- Tursunov, N.
- Article
46
- Nanomaterials (2079-4991), 2022, v. 12, n. 24, p. 4390, doi. 10.3390/nano12244390
- Wang, Haiyan;
- Sun, Yu;
- Chen, Jin;
- Wang, Fengchao;
- Han, Ruiyi;
- Zhang, Canyun;
- Kong, Jinfang;
- Li, Lan;
- Yang, Jing
- Article
47
- Nanomaterials (2079-4991), 2019, v. 9, n. 4, p. 505, doi. 10.3390/nano9040505
- Li, Jieni;
- Li, Henan;
- Ding, Dong;
- Li, Zibo;
- Chen, Fuming;
- Wang, Ye;
- Liu, Shiwei;
- Yao, Huizhen;
- Liu, Lai;
- Shi, Yumeng
- Article
48
- Nanomaterials (2079-4991), 2018, v. 8, n. 9, p. 677, doi. 10.3390/nano8090677
- Maulu, Alberto;
- Navarro-Arenas, Juan;
- Rodríguez-Cantó, Pedro J.;
- Sánchez-Royo, Juan F.;
- Abargues, Rafael;
- Suárez, Isaac;
- Martínez-Pastor, Juan P.
- Article
49
- Journal of Engineering Studies & Research, 2017, v. 23, n. 3, p. 19, doi. 10.29081/jesr.v23i3.76
- HOLMAN, GEORGE EDUARD;
- AFANASOV, CIPRIAN
- Article
50
- Journal of Engineering Studies & Research, 2013, v. 19, n. 3, p. 12
- CARAMAN, IULIANA;
- EVTODIEV, IGOR;
- RACOVEŎ, OXANA;
- STAMATE, MARIUS
- Article