Works matching IS 00222720 AND DT 2010 AND VI 239 AND IP 2

Results: 9

ESEM imaging of dynamic biological processes: the closure of stomatal pores.
Published in:
Journal of Microscopy, 2010, v. 239, n. 2, p. 135, doi. 10.1111/j.1365-2818.2009.03351.x
By:
- M<sup>c</sup>GREGOR, J. E.;
- DONALD, A. M.
Publication type:
Article
Pixel-based analysis of FRAP data with a general initial bleaching profile.
Published in:
Journal of Microscopy, 2010, v. 239, n. 2, p. 142, doi. 10.1111/j.1365-2818.2009.03361.x
By:
- JONASSON, J. K.;
- HAGMAN, J.;
- LORÉN, N.;
- BERNIN, D.;
- NYDÉN, M.;
- RUDEMO, M.
Publication type:
Article
Friction, adhesion and durability and influence of humidity on adhesion and surface charging of skin and various skin creams using atomic force microscopy.
Published in:
Journal of Microscopy, 2010, v. 239, n. 2, p. 99, doi. 10.1111/j.1365-2818.2009.03362.x
By:
- TANG, W.;
- BHUSHAN, B.;
- GE, S.
Publication type:
Article
Photo- and bio-physical characterization of novel violet and near-infrared lipophilic fluorophores for neuronal tracing.
Published in:
Journal of Microscopy, 2010, v. 239, n. 2, p. 117, doi. 10.1111/j.1365-2818.2009.03363.x
By:
- TONNIGES, J.;
- HANSEN, M.;
- DUNCAN, J.;
- BASSETT, M. J.;
- FRITZSCH, B.;
- GRAY, B. D.;
- EASWARAN, A.;
- NICHOLS, M. G.
Publication type:
Article
Using a <670> zone axis for convergent beam electron diffraction measurements of lattice strain in strained silicon.
Published in:
Journal of Microscopy, 2010, v. 239, n. 2, p. 154, doi. 10.1111/j.1365-2818.2010.03364.x
By:
- DIERCKS, D. R.;
- KAUFMAN, M. J.;
- IRWIN, R. B.;
- JAIN, A.;
- ROBERTSON, L.;
- WEIJTMANS, J. W.;
- WISE, R.
Publication type:
Article
Texture classification by statistical learning from morphological image processing: application to metallic surfaces.
Published in:
Journal of Microscopy, 2010, v. 239, n. 2, p. 159, doi. 10.1111/j.1365-2818.2010.03365.x
By:
- CORD, A.;
- BACH, F.;
- JEULIN, D.
Publication type:
Article
Co-registered spectrally encoded confocal microscopy and optical frequency domain imaging system.
Published in:
Journal of Microscopy, 2010, v. 239, n. 2, p. 87, doi. 10.1111/j.1365-2818.2010.03367.x
By:
- KANG, D. K.;
- SUTER, M. J.;
- BOUDOUX, C.;
- YACHIMSKI, P. S.;
- PURICELLI, W. P.;
- NISHIOKA, N. S.;
- MINO-KENUDSON, M.;
- LAUWERS, G. Y.;
- BOUMA, B. E.;
- TEARNEY, G.J.
Publication type:
Article
Leakage radiation microscopy of surface plasmon coupled emission: investigation of gain-assisted propagation in an integrated plasmonic waveguide.
Published in:
Journal of Microscopy, 2010, v. 239, n. 2, p. 167, doi. 10.1111/j.1365-2818.2010.03368.x
By:
- GRANDIDIER, J.;
- DES FRANCS, G. COLAS;
- MASSENOT, S.;
- BOUHELIER, A.;
- MARKEY, L.;
- WEEBER, J.-C.;
- DEREUX, A.
Publication type:
Article
Characterization of dilute species within CVD-grown silicon nanowires doped using trimethylboron: protected lift-out specimen preparation for atom probe tomography.
Published in:
Journal of Microscopy, 2010, v. 239, n. 2, p. 92, doi. 10.1111/j.1365-2818.2010.03375.x
By:
- PROSA, T. J.;
- ALVIS, R.;
- TSAKALAKOS, L.;
- SMENTKOWSKI, V. S.
Publication type:
Article