Works matching IS 00222720 AND DT 1986 AND VI 142 AND IP 2
Results: 13
Comparison of the Diffraction Contrast and the Slice Method for Image Computation.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 131, doi. 10.1111/j.1365-2818.1986.tb02750.x
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Electron microscopic study of 5SrRNA crystals from Thermus thermophilus HB8.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 247, doi. 10.1111/j.1365-2818.1986.tb02761.x
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High resolution electron microscopy of grain boundaries in Nb<sub>3</sub>Ge-films.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 171, doi. 10.1111/j.1365-2818.1986.tb02754.x
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Observation of lattice fringes of the Si(111)-7×7 structure by reflection electron microscopy.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 211, doi. 10.1111/j.1365-2818.1986.tb02758.x
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Structure and composition analysis of silicon aluminium oxynitride polytypes by combined use of structure imaging and microanalysis.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 235, doi. 10.1111/j.1365-2818.1986.tb02760.x
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Measurement of translation component at ordered interfaces by weak-beam α-fringe electron microscopy.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 163, doi. 10.1111/j.1365-2818.1986.tb02753.x
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High resolution transmission electron microscopy of Sm-Co based permanent magnets.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 201, doi. 10.1111/j.1365-2818.1986.tb02757.x
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High resolution imaging of the CdTe/(100)InSb interface: A lattice-matched hetero-epitaxial structure.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 153, doi. 10.1111/j.1365-2818.1986.tb02752.x
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Some aspects of liquid metal ion sources.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 191, doi. 10.1111/j.1365-2818.1986.tb02756.x
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Fine structure of the images of atoms in 011-gold crystals in various Bragg reflecting conditions.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 119, doi. 10.1111/j.1365-2818.1986.tb02749.x
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Intensity analysis of boron and nitrogen K-edge spectra for hexagonal boron nitride by EELS.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 141, doi. 10.1111/j.1365-2818.1986.tb02751.x
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High resolution electron microscopy of partial dislocations in the Laves phase structure.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 181, doi. 10.1111/j.1365-2818.1986.tb02755.x
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High-resolution electron microscopy of Ba<sub>x</sub>K<sub>2-x</sub>Fe<sub>x</sub>Ti<sub>6-x</sub>O<sub>1</sub>3 crystals in polar-glass state.
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- Journal of Microscopy, 1986, v. 142, n. 2, p. 223, doi. 10.1111/j.1365-2818.1986.tb02759.x
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