Works matching IS 00222720 AND DT 1985 AND VI 139 AND IP 2
Results: 11
Scanning ion beam lithography and its application in microelectronics and microscopy.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 167, doi. 10.1111/j.1365-2818.1985.tb02633.x
- By:
- Publication type:
- Article
An X-ray diffraction analysis of rat tail tendons treated with Cupromeronic Blue.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 205, doi. 10.1111/j.1365-2818.1985.tb02637.x
- By:
- Publication type:
- Article
The detective quantum efficiency of the scintillator/photomultiplier in the scanning electron microscope.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 153, doi. 10.1111/j.1365-2818.1985.tb02632.x
- By:
- Publication type:
- Article
Assessment of electron irradiation damage to biomolecules using the Patterson function.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 197, doi. 10.1111/j.1365-2818.1985.tb02636.x
- By:
- Publication type:
- Article
The origins and development of scanning electron microscopy.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 121, doi. 10.1111/j.1365-2818.1985.tb02629.x
- By:
- Publication type:
- Article
High resolution electron beam fabrication: a brief review of experimental studies that began at Cambridge University in 1962.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 139, doi. 10.1111/j.1365-2818.1985.tb02631.x
- By:
- Publication type:
- Article
Some theoretical aspects of type-1 magnetic contrast in the scanning electron microscope.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 187, doi. 10.1111/j.1365-2818.1985.tb02635.x
- By:
- Publication type:
- Article
HIGH RESOLUTION MAGNETIC MICROSTRUCTURE IMAGING USING SECONDARY ELECTRON SPIN POLARIZATION ANALYSIS IN A SCANNING ELECTRON MICROSCOPE.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. RP1, doi. 10.1111/j.1365-2818.1985.tb02628.x
- By:
- Publication type:
- Article
Recollections of the early days of SEM in the Cambridge University Engineering Department, 1948-53.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 129, doi. 10.1111/j.1365-2818.1985.tb02630.x
- By:
- Publication type:
- Article
Astigmatism correction and determination of resolving power in the SEM.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 177, doi. 10.1111/j.1365-2818.1985.tb02634.x
- By:
- Publication type:
- Article
Theoretical calculation of layer geometry in rotary shadowed models of membrane-associated particles.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 221, doi. 10.1111/j.1365-2818.1985.tb02638.x
- By:
- Publication type:
- Article