Works matching IS 00222720 AND DT 1982 AND VI 127 AND IP 1
Results: 12
Computer Techniques in Electron Microscopy and Analysis.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 1, doi. 10.1111/j.1365-2818.1982.tb00391.x
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A computer system for on-line image capture and analysis.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 39, doi. 10.1111/j.1365-2818.1982.tb00395.x
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Application of an array processor to image processing in electron microscopy.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 85, doi. 10.1111/j.1365-2818.1982.tb00399.x
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A review of on-line processing of chemical analysis data using a conventional CTEM/STEM.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 119, doi. 10.1111/j.1365-2818.1982.tb00402.x
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Reduction of noise in TV rate electron microscope images by digital filtering.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 29, doi. 10.1111/j.1365-2818.1982.tb00394.x
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Interactive image processing with an off-line minicomputer: organization, performance and applications.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 69, doi. 10.1111/j.1365-2818.1982.tb00398.x
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Software for scanning Auger microscopy.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 105, doi. 10.1111/j.1365-2818.1982.tb00401.x
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The detection quantum efficiency of electronic image recording systems.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 17, doi. 10.1111/j.1365-2818.1982.tb00393.x
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An integrated approach to scanning microscope data acquisition.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 61, doi. 10.1111/j.1365-2818.1982.tb00397.x
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Topographical analysis in the SEM using an automatic focusing technique.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 93, doi. 10.1111/j.1365-2818.1982.tb00400.x
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On-line digital computer techniques in electron microscopy: general introduction.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 3, doi. 10.1111/j.1365-2818.1982.tb00392.x
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Multiple signals in STEM.
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- Journal of Microscopy, 1982, v. 127, n. 1, p. 47, doi. 10.1111/j.1365-2818.1982.tb00396.x
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