Found: 12
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Crystal orientation mapping of NiO grown on cube textured Ni tapes.
- Published in:
- Journal of Microscopy, 2004, v. 216, n. 2, p. 123, doi. 10.1111/j.0022-2720.2004.01396.x
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- Article
Index for spatial heterogeneity in breast cancer.
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- Journal of Microscopy, 2004, v. 216, n. 2, p. 110, doi. 10.1111/j.0022-2720.2004.01398.x
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- Publication type:
- Article
Imaging cells on polymer spherulites.
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- Journal of Microscopy, 2004, v. 216, n. 2, p. 153, doi. 10.1111/j.0022-2720.2004.01401.x
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- Article
Automatic real-time three-dimensional cell tracking by fluorescence microscopy.
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- Journal of Microscopy, 2004, v. 216, n. 2, p. 131, doi. 10.1111/j.0022-2720.2004.01404.x
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- Article
Directional analysis of digitized three-dimensional images by configuration counts.
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- Journal of Microscopy, 2004, v. 216, n. 2, p. 175, doi. 10.1111/j.0022-2720.2004.01405.x
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- Article
A convenient and rapid sample repositioning approach for atomic force microscopy.
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- Journal of Microscopy, 2004, v. 216, n. 2, p. 194, doi. 10.1111/j.0022-2720.2004.01406.x
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- Article
Second-order stereology of spatial fibre systems.
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- Journal of Microscopy, 2004, v. 216, n. 2, p. 156, doi. 10.1111/j.0022-2720.2004.01407.x
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- Article
An ultrastructural study of cellular response to variation in porosity in phase-pure hydroxyapatite.
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- Journal of Microscopy, 2004, v. 216, n. 2, p. 97, doi. 10.1111/j.0022-2720.2004.01403.x
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- Article
Maximum pixel spectrum: a new tool for detecting and recovering rare, unanticipated features from spectrum image data cubes.
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- Journal of Microscopy, 2004, v. 216, n. 2, p. 186, doi. 10.1111/j.0022-2720.2004.01412.x
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- Article
Corrigendum.
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- 2004
- Publication type:
- Correction Notice
Signal analysis of total internal reflection fluorescent speckle microscopy (TIR-FSM) and wide-field epi-fluorescence FSM of the actin cytoskeleton and focal adhesions in living cells.
- Published in:
- Journal of Microscopy, 2004, v. 216, n. 2, p. 138, doi. 10.1111/j.0022-2720.2004.01408.x
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- Publication type:
- Article
Structured illumination microscopy: artefact analysis and reduction utilizing a parameter optimization approach.
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- Journal of Microscopy, 2004, v. 216, n. 2, p. 165, doi. 10.1111/j.0022-2720.2004.01411.x
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- Publication type:
- Article