Works matching Diffraction

Results: 5000
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    X-ray diffraction by phase diffraction gratings.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 4, p. 1159, doi. 10.1107/S1600576715011607
    By:
    • Irzhak, D. V.;
    • Knyasev, M. A.;
    • Punegov, V. I.;
    • Roshchupkin, D. V.
    Publication type:
    Article
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    Elastic Residual Strain and Stress Measurements and Corresponding Part Deflections of 3D Additive Manufacturing Builds of IN625 AM-Bench Artifacts Using Neutron Diffraction, Synchrotron X-Ray Diffraction, and Contour Method.

    Published in:
    Integrating Materials & Manufacturing Innovation, 2019, v. 8, n. 1, p. 318, doi. 10.1007/s40192-019-00149-0
    By:
    • Phan, Thien Q.;
    • Strantza, Maria;
    • Hill, Michael R.;
    • Gnaupel-Herold, Thomas H.;
    • Heigel, Jarred;
    • D'Elia, Christopher R.;
    • DeWald, Adrian T.;
    • Clausen, Bjorn;
    • Pagan, Darren C.;
    • Peter Ko, J. Y.;
    • Brown, Donald W.;
    • Levine, Lyle E.
    Publication type:
    Article
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    TRIADIC CANTOR TARGET DIFFRACTION.

    Published in:
    Microwave & Optical Technology Letters, 1992, v. 5, n. 9, p. 460, doi. 10.1002/mop.4650050916
    By:
    • Jaggard, D. L.;
    • Spielman, T.
    Publication type:
    Article
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    Comparing results of X-ray diffraction, µ-Raman spectroscopy and neutron diffraction when identifying chemical phases in seized nuclear material, during a comparative nuclear forensics exercise.

    Published in:
    Journal of Radioanalytical & Nuclear Chemistry, 2018, v. 315, n. 2, p. 395, doi. 10.1007/s10967-017-5666-3
    By:
    • Rondahl, Stina Holmgren;
    • Pointurier, Fabien;
    • Ahlinder, Linnea;
    • Ramebäck, Henrik;
    • Marie, Olivier;
    • Ravat, Brice;
    • Delaunay, François;
    • Young, Emma;
    • Blagojevic, Ned;
    • Hester, James R.;
    • Thorogood, Gordon;
    • Nelwamondo, Aubrey N.;
    • Ntsoane, Tshepo P.;
    • Roberts, Sarah K.;
    • Holliday, Kiel S.
    Publication type:
    Article
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    Diffraction-Based Multiscale Residual Strain Measurements.

    Published in:
    Microscopy & Microanalysis, 2024, v. 30, n. 2, p. 236, doi. 10.1093/mam/ozae011
    By:
    • Pai, Namit;
    • Manda, Sanjay;
    • Sudhalkar, Bhargav;
    • Syphus, Bethany;
    • Fullwood, David;
    • de Kloe, René;
    • Wright, Stuart;
    • Patra, Anirban;
    • Samajdar, Indradev
    Publication type:
    Article
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    A new theory for X-ray diffraction.

    Published in:
    Acta Crystallographica. Section A, Foundations & Advances, 2014, v. 70, n. 3, p. 257, doi. 10.1107/S205327331400117X
    By:
    • Fewster, Paul F.
    Publication type:
    Article
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