Works matching IS 00218898 AND DT 2020 AND VI 53 AND IP 4
Results: 31
Iterative X‐ray spectroscopic ptychography.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 937, doi. 10.1107/S1600576720006354
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Dark‐field electron holography as a recording of crystal diffraction in real space: a comparative study with high‐resolution X‐ray diffraction for strain analysis of MOSFETs.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 885, doi. 10.1107/S1600576720006020
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Chirok: a post‐refinement tool to analyse absolute structure.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1138, doi. 10.1107/S1600576720006214
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Resolving pseudosymmetry in tetragonal ZrO<sub>2</sub> using electron backscatter diffraction with a modified dictionary indexing approach.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1060, doi. 10.1107/S160057672000864X
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EDDIDAT: a graphical user interface for the analysis of energy‐dispersive diffraction data.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1130, doi. 10.1107/S1600576720005506
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Pulse‐to‐pulse wavefront sensing at free‐electron lasers using ptychography.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 949, doi. 10.1107/S1600576720006913
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Ptychographic X‐ray speckle tracking with multi‐layer Laue lens systems.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 927, doi. 10.1107/S1600576720006925
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A new parafocusing paradigm for X‐ray diffraction.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1073, doi. 10.1107/S1600576720008651
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Real‐time tracking of the self‐assembled growth of a 3D Ge quantum dot lattice in an alumina matrix.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1029, doi. 10.1107/S1600576720007815
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Effect of 2,4‐dinitrophenol dye doping on tristhioureazinc(II) sulfate single crystals: a potential nonlinear optical material.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 972, doi. 10.1107/S1600576720006585
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A new approach to phason disorder for a decagonal quasicrystal: the moment series expansion of the tiling distribution function for AlCuRh.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 904, doi. 10.1107/S1600576720006251
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Retrieving the configuration of grain boundary structure in polycrystalline materials by extraordinary X‐ray reflection analysis.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1006, doi. 10.1107/S1600576720007803
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X‐ray characterization of physical‐vapor‐transport‐grown bulk AlN single crystals.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1080, doi. 10.1107/S1600576720008961
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Viscous‐medium‐based crystal support in a sample holder for fixed‐target serial femtosecond crystallography.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1051, doi. 10.1107/S1600576720008663
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X‐Seed 4: updates to a program for small‐molecule supramolecular crystallography.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1141, doi. 10.1107/S1600576720007438
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Predicting the available work from deformation‐induced α′′ martensite formation in metastable β Ti alloys.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1015, doi. 10.1107/S1600576720007451
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Crystallography of γ′‐Fe<sub>4</sub>N formation in single‐crystalline α‐Fe whiskers.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 865, doi. 10.1107/S1600576720005981
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A laboratory transmission diffraction Laue setup to evaluate single‐crystal quality.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 914, doi. 10.1107/S1600576720006317
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MrPIXEL: automated execution of Pixel calculations via the Mercury interface.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1154, doi. 10.1107/S1600576720008444
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New method to measure domain‐wall motion contribution to piezoelectricity: the case of PbZr<sub>0.65</sub>Ti<sub>0.35</sub>O<sub>3</sub> ferroelectric.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1039, doi. 10.1107/S1600576720008213
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Complex modeling for the quantification of nanoscale disorder using genetic algorithms, density functional theory and line‐profile analysis.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1087, doi. 10.1107/S1600576720008225
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In situ temperature profile measurements with high‐energy X‐rays as a probe of optical floating zone crystal growth environment.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 982, doi. 10.1107/S1600576720007062
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From atoms to bonds, angles and torsions: molecular metrics from crystal space, and two Excel implementations.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1101, doi. 10.1107/S1600576720007311
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Defining the hematite topotaxial crystal growth in magnetite–hematite phase transformation.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 896, doi. 10.1107/S1600576720006305
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In situ monitoring of hydrothermal reactions by X‐ray diffraction with Bragg–Brentano geometry.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1163, doi. 10.1107/S1600576720006019
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Dynamical X‐ray diffraction imaging of voids in dislocation‐free high‐purity germanium single crystals.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 880, doi. 10.1107/S1600576720005993
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Assessment of structure factors for analysis of small‐angle scattering data from desired or undesired aggregates.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 991, doi. 10.1107/S1600576720006500
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GIWAXS‐SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing‐incidence wide‐angle X‐ray scattering of organic materials.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1108, doi. 10.1107/S1600576720005476
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Professor Dr Dirk Feil (1933–2020).
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1167, doi. 10.1107/S1600576720008080
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SAS‐cam: a program for automatic processing and analysis of small‐angle scattering data.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1147, doi. 10.1107/S1600576720008985
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PtyNAMi: ptychographic nano‐analytical microscope.
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- Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 957, doi. 10.1107/S1600576720008420
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