Works matching IS 00218898 AND DT 2020 AND VI 53 AND IP 3

Results: 31

Ptychographic X‐ray speckle tracking.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 760, doi. 10.1107/S1600576720005567

By:

Morgan, Andrew J.;
Quiney, Harry M.;
Bajt, Saša;
Chapman, Henry N.

Publication type:

Article

How To Be a Better Scientist. By Andrew C. Johnson and John P. Sumpter. Taylor and Francis, 2018. Pp. 248. Price GBP 15.19 ISBN 9781138731295 (paperback), GBP 76.00 ISBN 9781138731219 (hardback), GBP 12.34 ISBN 9781315189079 (ebook).

Published in:

2020

By:

Helliwell, John R.

Publication type:

Book Review

Handbook of Industrial Crystallization. Third edition. Edited by Allan S. Myerson, Deniz Erdemir and Alfred Y. Lee. Cambridge University Press, 2019. Pp. 538. Price GBP 145 (hardcover). ISBN 9780521196185.

Published in:

2020

By:

Benz, Klaus-Werner

Publication type:

Book Review

Takagi–Taupin dynamical X‐ray diffraction simulations of asymmetric X‐ray diffraction from crystals: the effects of surface undulations.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 793, doi. 10.1107/S1600576720005178

By:

Macrander, Albert

Publication type:

Article

Effects of surface undulations on asymmetric X‐ray diffraction: a rocking‐curve topography study.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 789, doi. 10.1107/S1600576720005166

By:

Macrander, Albert;
Pereira, Nino;
Huang, Xianrong;
Kasman, Elina;
Qian, Jun;
Wojcik, Michael;
Assoufid, Lahsen

Publication type:

Article

Measurement of single‐crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 734, doi. 10.1107/S1600576720005154

By:

Gureva, P. V.;
Marchenkov, N. V.;
Artemev, A. N.;
Artemiev, N. A.;
Belyaev, A. D.;
Demkiv, A. A.;
Shishkov, V. A.

Publication type:

Article

X‐ray pulse stretching after diffraction.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 623, doi. 10.1107/S1600576720003714

By:

Hrdý, Jaromír

Publication type:

Article

Compressive strain formation in surface‐damaged crystals.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 629, doi. 10.1107/S1600576720003702

By:

Ferrari, Claudio;
Beretta, Sara;
Rotunno, Enzo;
Korytár, Dusan;
Zaprazny, Zdenko

Publication type:

Article

Impact and behavior of Sn during the Ni/GeSn solid‐state reaction.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 605, doi. 10.1107/S1600576720003064

By:

Quintero, Andrea;
Gergaud, Patrice;
Hartmann, Jean-Michel;
Delaye, Vincent;
Reboud, Vincent;
Cassan, Eric;
Rodriguez, Philippe

Publication type:

Article

Calculation of total scattering from a crystalline structural model based on experimental optics parameters.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 671, doi. 10.1107/S1600576720002940

By:

Hiroi, Satoshi;
Ohara, Koji;
Ohuchi, Satoru;
Umetani, Yukihiro;
Kozaki, Takashi;
Igaki, Emiko;
Sakata, Osami

Publication type:

Article

A thermal‐gradient approach to variable‐temperature measurements resolved in space.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 662, doi. 10.1107/S160057672000415X

By:

O'Nolan, Daniel;
Huang, Guanglong;
Kamm, Gabrielle E.;
Grenier, Antonin;
Liu, Chia-Hao;
Todd, Paul K.;
Wustrow, Allison;
Thinh Tran, Gia;
Montiel, David;
Neilson, James R;
Billinge, Simon J. L.;
Chupas, Peter J.;
Thornton, Katsuyo S.;
Chapman, Karena W.

Publication type:

Article

SVAT4: a computer program for visualization and analysis of crystal structures.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 848, doi. 10.1107/S1600576720004586

By:

Li, X.-Z.

Publication type:

Article

SingleCrystal 4: real‐time multi‐phase diffraction simulation.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 860, doi. 10.1107/S1600576720006378

By:

Palmer, David C.

Publication type:

Article

Stochastic models of dense or hollow nanoparticles and their scattering properties.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 811, doi. 10.1107/S1600576720005464

By:

Gommes, Cedric J.;
Chattot, Raphael;
Drnec, Jakub

Publication type:

Article

Pattern‐matching indexing of Laue and monochromatic serial crystallography data for applications in materials science.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 824, doi. 10.1107/S160057672000521X

By:

Dejoie, Catherine;
Tamura, Nobumichi

Publication type:

Article

Equatorial aberration of powder diffraction data collected with an Si strip X‐ray detector by a continuous‐scan integration method.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 679, doi. 10.1107/S1600576720005130

By:

Ida, Takashi

Publication type:

Article

Full reciprocal‐space mapping up to 2000 K under controlled atmosphere: the multipurpose QMAX furnace.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 650, doi. 10.1107/S160057672000432X

By:

Guinebretière, René;
Arnaud, Stephan;
Blanc, Nils;
Boudet, Nathalie;
Thune, Elsa;
Babonneau, David;
Castelnau, Olivier

Publication type:

Article

Dual‐energy crystal‐analyzer scheme for spectral tomography.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 781, doi. 10.1107/S1600576720005439

By:

Zolotov, Denis;
Buzmakov, Alexey;
Grigoriev, Maxim;
Schelokov, Igor

Publication type:

Article

A novel experimental approach for nanostructure analysis: simultaneous small‐angle X‐ray and neutron scattering.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 722, doi. 10.1107/S1600576720005208

By:

Metwalli, Ezzeldin;
Götz, Klaus;
Lages, Sebastian;
Bär, Christian;
Zech, Tobias;
Noll, Dennis M.;
Schuldes, Isabel;
Schindler, Torben;
Prihoda, Annemarie;
Lang, Herbert;
Grasser, Jürgen;
Jacques, Mark;
Didier, Luc;
Cyril, Amrouni;
Martel, Anne;
Porcar, Lionel;
Unruh, Tobias

Publication type:

Article

Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 635, doi. 10.1107/S1600576720003775

By:

Krause, Lennard;
Tolborg, Kasper;
Grønbech, Thomas Bjørn Egede;
Sugimoto, Kunihisa;
Iversen, Bo Brummerstedt;
Overgaard, Jacob

Publication type:

Article

Exact and fast calculation of the X‐ray pair distribution function.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 710, doi. 10.1107/S1600576720004616

By:

Neder, Reinhard B.;
Proffen, Thomas

Publication type:

Article

sasPDF: pair distribution function analysis of nanoparticle assemblies from small‐angle scattering data.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 699, doi. 10.1107/S1600576720004628

By:

Liu, Chia-Hao;
Janke, Eric M.;
Li, Ruipen;
Juhás, Pavol;
Gang, Oleg;
Talapin, Dmitri V.;
Billinge, Simon J. L.

Publication type:

Article

CrystalCMP: automatic comparison of molecular structures.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 841, doi. 10.1107/S1600576720003787

By:

Rohlíček, Jan;
Skořepová, Eliška

Publication type:

Article

Sub‐millisecond time‐resolved small‐angle neutron scattering measurements at NIST.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 598, doi. 10.1107/S1600576720004367

By:

Glinka, Charles;
Bleuel, Markus;
Tsai, Peter;
Zákutná, Dominika;
Honecker, Dirk;
Dresen, Dominique;
Mees, Flore;
Disch, Sabrina

Publication type:

Article

X‐ray diffraction using focused‐ion‐beam‐prepared single crystals.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 614, doi. 10.1107/S1600576720003143

By:

Weigel, Tina;
Funke, Claudia;
Zschornak, Matthias;
Behm, Thomas;
Stöcker, Hartmut;
Leisegang, Tilmann;
Meyer, Dirk C.

Publication type:

Article

3D‐printed holders for in meso in situ fixed‐target serial X‐ray crystallography.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 854, doi. 10.1107/S1600576720002897

By:

Huang, Chia-Ying;
Meier, Nathalie;
Caffrey, Martin;
Wang, Meitian;
Olieric, Vincent

Publication type:

Article

Optimization of crystallization of biological macromolecules using dialysis combined with temperature control.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 686, doi. 10.1107/S1600576720003209

By:

Junius, Niels;
Vahdatahar, Elham;
Oksanen, Esko;
Ferrer, Jean-Luc;
Budayova-Spano, Monika

Publication type:

Article

Hydrogen/deuterium exchange behavior in tetragonal hen egg‐white lysozyme crystals affected by solution state.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 837, doi. 10.1107/S1600576720005488

By:

Kita, Akiko;
Morimoto, Yukio

Publication type:

Article

Information gain from isotopic contrast variation in neutron reflectometry on protein–membrane complex structures.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 800, doi. 10.1107/S1600576720005634

By:

Heinrich, Frank;
Kienzle, Paul A.;
Hoogerheide, David P.;
Lösche, Mathias

Publication type:

Article

X‐ray ptychographic mode of self‐assembled CdSe/CdS octapod‐shaped nanocrystals in thick polymers.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 741, doi. 10.1107/S160057672000583X

By:

De Caro, Liberato;
Scattarella, Francesco;
Altamura, Davide;
Arciniegas, Milena P.;
Siliqi, Dritan;
Manna, Liberato;
Giannini, Cinzia

Publication type:

Article

Near, far, wherever you are: simulations on the dose efficiency of holographic and ptychographic coherent imaging.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 748, doi. 10.1107/S1600576720005816

By:

Du, Ming;
Gürsoy, Dogˇa;
Jacobsen, Chris

Publication type:

Article