Works matching IS 00218898 AND DT 2015 AND VI 48 AND IP 5
Results: 29
The atomic scale structure of graphene powder studied by neutron and X-ray diffraction.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1429, doi. 10.1107/S1600576715014053
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Crystallization of high-quality protein crystals using an external electric field.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1507, doi. 10.1107/S1600576715015885
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Topology and temperature dependence of the diffuse X-ray scattering in Na<sub>0.5</sub>Bi<sub>0.5</sub>TiO<sub>3</sub> ferroelectric single crystals.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1543, doi. 10.1107/S160057671501571X
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Empirical correction for resolution- and temperature-dependent errors caused by factors such as thermal diffuse scattering.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1485, doi. 10.1107/S1600576715014934
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Polarization analysis in neutron small-angle scattering with a novel triplet dynamic nuclear polarization spin filter.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1514, doi. 10.1107/S1600576715015575
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SASfit: a tool for small-angle scattering data analysis using a library of analytical expressions.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1587, doi. 10.1107/S1600576715016544
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Scattering Methods in Complex Fluids. By Sow-Hsin Chen and Piero Tartaglia. Cambridge University Press, 2015. Pp. 400. Price (hardcover) GBP 75. ISBN 9780521883801.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1609, doi. 10.1107/S1600576715014958
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Representational analysis of extended disorder in atomistic ensembles derived from total scattering data.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1560, doi. 10.1107/S1600576715016404
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Temperature dependence of thermal expansion tensors of energetic materials.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1364, doi. 10.1107/S1600576715012716
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Complementary use of monochromatic and white-beam X-ray micro-diffraction for the investigation of ancient materials.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1522, doi. 10.1107/S1600576715014983
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AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1581, doi. 10.1107/S1600576715015125
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Effect of using polyimide capillaries during thermal experiments on the particle size distribution of supported Pt nanoparticles.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1599, doi. 10.1107/S1600576715015083
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SdsA polymorph isolation and improvement of their crystal quality using nonconventional crystallization techniques.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1551, doi. 10.1107/S1600576715016556
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Profex: a graphical user interface for the Rietveld refinement program BGMN.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1573, doi. 10.1107/S1600576715014685
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Molecular weight-gyration radius relation of globular proteins: a comparison of light scattering, small-angle X-ray scattering and structure-based data.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1604, doi. 10.1107/S1600576715015551
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Determining the shape and periodicity of nanostructures using small-angle X-ray scattering.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1355, doi. 10.1107/S1600576715013369
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On the use of molecular dynamics simulation to calculate X-ray thermal diffuse scattering from molecular crystals.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1420, doi. 10.1107/S1600576715013242
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In situ monitoring of phase transformation microstructures at Earth's mantle pressure and temperature using multi-grain XRD.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1346, doi. 10.1107/S1600576715012765
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Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method. I. Theoretical concept.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1451, doi. 10.1107/S160057671501448X
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Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method. II. Experimental implementation.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1462, doi. 10.1107/S160057671501585X
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Structure and morphology of shape-controlled Pd nanocrystals.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1534, doi. 10.1107/S1600576715015964
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Small-angle neutron scattering correlation functions of bulk magnetic materials.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1437, doi. 10.1107/S1600576715013187
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Scattering from phase-separated vesicles. I. An analytical form factor for multiple static domains.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1391, doi. 10.1107/S160057671501362X
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X-ray Scattering from Semiconductors and Other Materials. 3rd Ed. By Paul F. Fewster. Singapore: World Scientific Press, 2015. Pp. 493. Price GBP 65.00, USD 99.00. ISBN 9789814436922.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1610, doi. 10.1107/S1600576715016568
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Neutron Interferometry: Lessons in Experimental Quantum Mechanics, Wave-Particle Duality, and Entanglement. 2nd Ed. By Helmut Rauch and Samuel A. Werner. Oxford University Press, 2015. Price (hardcover) GBP 70. ISBN 978-0-19-871251-0.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1607, doi. 10.1107/S1600576715014582
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Reliably distinguishing protein nanocrystals from amorphous precipitate by means of depolarized dynamic light scattering.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1476, doi. 10.1107/S1600576715014740
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Kikuchi pattern analysis of noncentrosymmetric crystals.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1405, doi. 10.1107/S1600576715014016
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Phase densities and lamellar morphologies of semicrystalline polyethylenes via absolute small-angle X-ray scattering measurements.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1498, doi. 10.1107/S1600576715014752
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Characterization of HAPG mosaic crystals using synchrotron radiation.
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- Journal of Applied Crystallography, 2015, v. 48, n. 5, p. 1381, doi. 10.1107/S160057671501287X
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