Works matching IS 00218898 AND DT 2013 AND VI 46 AND IP 2
Results: 39
RAMM: a new random-model-based method for solving ab initio crystal structure using the EXPO package.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 476, doi. 10.1107/S0021889813002227
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CLUSTERGEN: a program for molecular cluster generation from crystallographic data.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 540, doi. 10.1107/S0021889813002173
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Oversampling smoothness: an effective algorithm for phase retrieval of noisy diffraction intensities.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 312, doi. 10.1107/S0021889813002471
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CTEAS: a graphical-user-interface-based program to determine thermal expansion from high-temperature X-ray diffraction.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 550, doi. 10.1107/S0021889813002938
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Development of powder diffraction apparatus for small-angle X-ray scattering measurements.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 573, doi. 10.1107/S002188981205162X
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Measuring radioactive powder samples on the high-resolution powder diffraction beamline at the European Synchrotron Radiation Facility.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 567, doi. 10.1107/S0021889813003178
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A new gas system for automated in situ powder diffraction studies at the European Synchrotron Radiation Facility.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 570, doi. 10.1107/S0021889813000629
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Upsampling speckle patterns for coherent X-ray diffraction imaging.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 319, doi. 10.1107/S0021889813003117
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Comprehensive synchrotron grazing-incidence X-ray scattering analysis of nanostructures in porous polymethylsilsesquioxane dielectric thin films.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 466, doi. 10.1107/S0021889812050923
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Calculation of diffraction efficiency for curved crystals with arbitrary curvature radius.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 415, doi. 10.1107/S0021889813000162
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Electron backscatter diffraction investigation of local misorientations and orientation gradients in connection with evolution of grain boundary structures in deformed and annealed zirconium. A new approach in grain boundary analysis.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 483, doi. 10.1107/S0021889812052016
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Adaptive reconstruction method for three-dimensional orientation imaging.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 512, doi. 10.1107/S0021889813005268
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Spontaneous inversion of in-plane polarity of a-oriented GaN domains laterally overgrown on patterned r-plane sapphire substrates.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 443, doi. 10.1107/S0021889813000654
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Accurate measurements of intrinsic scattering from window materials by use of a vacuum camera.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 577, doi. 10.1107/S0021889813002628
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Dependence of the strain diffraction line broadening on ( hkl) and sample direction in textured polycrystals.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 391, doi. 10.1107/S0021889812051928
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Effect of the solute-solvent interface on small-angle neutron scattering from organic solutions of short alkyl chain molecules as revealed by molecular dynamics simulation.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 372, doi. 10.1107/S002188981205131X
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Depth profiling of Fe-implanted Si(100) by means of X-ray reflectivity and extremely asymmetric X-ray diffraction.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 505, doi. 10.1107/S0021889813004597
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P- V- T equation of state of synthetic mirabilite (Na<sub>2</sub>SO<sub>4</sub>·10D<sub>2</sub>O) determined by powder neutron diffraction.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 448, doi. 10.1107/S0021889813001362
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GSAS-II: the genesis of a modern open-source all purpose crystallography software package.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 544, doi. 10.1107/S0021889813003531
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PDFgetX3: a rapid and highly automatable program for processing powder diffraction data into total scattering pair distribution functions.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 560, doi. 10.1107/S0021889813005190
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Superposition twinning supported by texture in ZnO nanospikes.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 396, doi. 10.1107/S0021889812051333
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Quantifying amorphous and crystalline phase content with the atomic pair distribution function.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 332, doi. 10.1107/S0021889812050595
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Indexing of multi-particle diffraction data in a high-pressure single-crystal diffraction experiment.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 387, doi. 10.1107/S0021889812051886
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FabIO: easy access to two-dimensional X-ray detector images in Python.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 537, doi. 10.1107/S0021889813000150
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Detection of alternative conformations: Shift_plot and AC_prediction programs.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 554, doi. 10.1107/S0021889812052065
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Generation and applications of structure envelopes for porous metal-organic frameworks.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 346, doi. 10.1107/S0021889812050935
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Bayesian reconstruction of P( r) directly from two-dimensional detector images via a Markov chain Monte Carlo method.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 404, doi. 10.1107/S002188981300109X
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A microstructural and crystallographic investigation of the precipitation behaviour of a primary Al<sub>3</sub>Zr phase under a high magnetic field.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 421, doi. 10.1107/S0021889813001258
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Liesegang-like patterns of Toll crystals grown in gel.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 337, doi. 10.1107/S0021889812051606
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X-ray diffraction microscopy: emerging imaging techniques for nondestructive analysis of crystalline materials from the millimetre down to the nanometre scale.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 295, doi. 10.1107/S0021889813004160
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Evaluating the polymorphic phase transition in calcium-doped Ba(Zr<sub>0.05</sub>Ti<sub>0.95</sub>)O<sub>3</sub>: a lead-free piezoelectric ceramic.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 324, doi. 10.1107/S0021889813000666
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Electron diffraction characterization of a new metastable Al<sub>2</sub>Cu phase in an Al-Cu friction stir weld.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 430, doi. 10.1107/S0021889813001635
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Improvements and considerations for size distribution retrieval from small-angle scattering data by Monte Carlo methods.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 365, doi. 10.1107/S0021889813001295
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Three-dimensional reconstruction of liquid phases in disordered mesopores using in situ small-angle scattering.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 493, doi. 10.1107/S0021889813003816
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An enhancement in structural and superconducting properties of Bi2212 epitaxial thin films grown by the Pechini sol-gel method.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 379, doi. 10.1107/S0021889812051175
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Exact and explicit expression of the atomic pair distribution function as obtained from X-ray total scattering experiments.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 461, doi. 10.1107/S0021889812051357
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DCD USANS and SESANS: a comparison of two neutron scattering techniques applicable for the study of large-scale structures.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 354, doi. 10.1107/S0021889812050029
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Testing commercial protein crystallography sample mounting loops for movement in a cold-stream.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 525, doi. 10.1107/S0021889813003348
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Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials.
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- Journal of Applied Crystallography, 2013, v. 46, n. 2, p. 297, doi. 10.1107/S0021889813002604
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