Works matching DE "POSITION sensitive particle detectors"
1
- Advanced Functional Materials, 2019, v. 29, n. 1, p. N.PAG, doi. 10.1002/adfm.201805967
- Hao, Yan;
- Guo, Shuai;
- Weller, Dieter;
- Zhang, Min;
- Ding, Chunjie;
- Chai, Ke;
- Xie, Lingling;
- Liu, Ruibin
- Article
2
- Technical Physics Letters, 2006, v. 32, n. 11, p. 987, doi. 10.1134/S1063785006110241
- Gorelenok, A. T.;
- Tomasov, A. A.;
- Shmidt, N. M.;
- Il’ichev, É. A.;
- Lantratov, V. M.;
- Zadiranov, Yu. M.;
- Brunkov, P. N.;
- Titkova, O. V.;
- Kalyuzhnyĭ, N. A.;
- Mintarov, S. A.;
- Mdivani, V. N.;
- Katsoev, V. V.;
- Katsoev, L. V.;
- Shmelev, S. S.
- Article
3
- Applied Physics B: Lasers & Optics, 2014, v. 114, n. 1/2, p. 107, doi. 10.1007/s00340-013-5621-0
- Eliseev, S.;
- Blaum, K.;
- Block, M.;
- Dörr, A.;
- Droese, C.;
- Eronen, T.;
- Goncharov, M.;
- Höcker, M.;
- Ketter, J.;
- Ramirez, E.;
- Nesterenko, D.;
- Novikov, Yu.;
- Schweikhard, L.
- Article
4
- International Journal of Modern Physics A: Particles & Fields; Gravitation; Cosmology; Nuclear Physics, 2011, v. 26, n. 19, p. 3121, doi. 10.1142/S0217751X11053808
- Article
5
- Journal of Applied Crystallography, 2005, v. 38, n. 1, p. 199, doi. 10.1107/S0021889804031450
- Guilmeau, Emmanuel;
- Chateigner, Daniel;
- Noudem, Jacques;
- Funahashi, Ryoji;
- Horii, Shigeru;
- Ouladdiaf, Bachir
- Article
6
- Journal of Applied Crystallography, 2005, v. 38, n. 1, p. 62, doi. 10.1107/S0021889804026822
- Article
7
- European Physical Journal A -- Hadrons & Nuclei, 2008, v. 36, n. 3, p. 251, doi. 10.1140/epja/i2008-10590-9
- Anderson, L.-L.;
- Rudolph, D.;
- Johansson, E. K.;
- Torres, D. A.;
- Carlsson, B. G.;
- Ragnarsson, I.;
- Andreoiu, C.;
- Baktash, C.;
- Carpenter, M. P.;
- Charity, R. J.;
- Chiara, C. J.;
- Ekman, J.;
- Fahlander, C.;
- Hoel, C.;
- Pechenaya, O. L.;
- Reviol, W.;
- du Rietz, R.;
- Sarantites, D. G.;
- Seweryniak, D.;
- Sobotka, L.G.
- Article
8
- Crystallography Reports, 2006, v. 51, p. S27, doi. 10.1134/S1063774506070066
- Ionita, I.;
- Grabcev, B.;
- Todireanu, S.;
- Constantin, F.;
- Shvetsov, V.;
- Anghel, E.;
- Popescu, G.;
- Mincu, M.;
- Datcu, A.
- Article
9
- Instruments & Experimental Techniques, 2017, v. 60, n. 4, p. 605, doi. 10.1134/S0020441217040108
- Article
10
- Instruments & Experimental Techniques, 2014, v. 57, n. 5, p. 564, doi. 10.1134/S0020441214040083
- Muminov, R.;
- Radzhapov, S.;
- Toshmuradov, Yo.;
- Risalieva, Sh.;
- Bekbaev, S.;
- Kurmantaev, A.
- Article
11
- Instruments & Experimental Techniques, 2013, v. 56, n. 6, p. 640, doi. 10.1134/S0020441213050175
- Iyudin, A.;
- Bogomolov, V.;
- Svertilov, S.;
- Yashin, I.;
- Smoot, G.;
- Greiner, J.;
- Kienlin, A.
- Article
12
- Instruments & Experimental Techniques, 2010, v. 53, n. 6, p. 792, doi. 10.1134/S0020441210060047
- Zhukov, K.;
- Kantserov, V.;
- Murav'ev, S.;
- Shmeleva, A.
- Article
13
- Optical Engineering, 2007, v. 46, n. 11, p. 13602
- Sheng Lih Yeh;
- Kuang Tsan Lin
- Article
14
- Sensors (14248220), 2011, v. 11, n. 3, p. 2857, doi. 10.3390/s110302857
- Zheng You;
- Jian Sun;
- Fei Xing;
- Gao-Fei Zhang
- Article
15
- Sensors (14248220), 2011, v. 11, n. 2, p. 1246, doi. 10.3390/s110201246
- Porteiro, Jacobo;
- Riveiro, Belén;
- Granada, Enrique;
- Armesto, Julia;
- Eguía, Pablo;
- Collazo, Joaquín
- Article
16
- Sensors (14248220), 2010, v. 10, n. 12, p. 11512, doi. 10.3390/s101211512
- Tauro, Flavia;
- Aureli, Matteo;
- Porfiri, Maurizio;
- Grimaldi, Salvatore
- Article
17
- Sensors (14248220), 2010, v. 10, n. 11, p. 9948, doi. 10.3390/s101109948
- Article
18
- Sensors (14248220), 2010, v. 10, n. 11, p. 9687, doi. 10.3390/s101109687
- Article
19
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2007, v. 21, n. 22, p. 3851, doi. 10.1142/S0217979207037739
- ABDEL-RAHMAN, M. A.;
- ABDEL-RAHMAN, M.;
- LOTFY, YAHIA A.;
- BADAWI, EMAD A.;
- ABO-ELSOUD, M.;
- EISSA, M.
- Article
20
- International Journal of Optomechatronics, 2009, v. 3, n. 2, p. 116, doi. 10.1080/15599610902894584
- Liu, Yong;
- Xi, Ning;
- Shen, Yantao;
- Li, Xiongzi;
- Zhang, George;
- Fuhlbrigge, ThomasA.
- Article
21
- Experimental Techniques, 2004, v. 28, n. 4, p. 18, doi. 10.1111/j.1747-1567.2004.tb00172.x
- Article
22
- Journal of Radioanalytical & Nuclear Chemistry, 2012, v. 291, n. 2, p. 275, doi. 10.1007/s10967-011-1193-9
- Article
23
- European Physical Journal D (EPJ D), 2005, v. 34, n. 1-3, p. 15, doi. 10.1140/epjd/e2005-00101-2
- El Rahim, M. Abd;
- Antoine, R.;
- Arnaud, L.;
- Broyer, M.;
- Rayane, D.;
- Viard, A.;
- Dugourd, Ph.
- Article
24
- Circuits, Systems & Signal Processing, 2013, v. 32, n. 2, p. 843, doi. 10.1007/s00034-012-9508-9
- Hari, V.;
- Premkumar, A.;
- Zhong, X.
- Article
25
- Journal of Measurements in Engineering, 2016, v. 4, n. 3, p. 148, doi. 10.21595/jme.2016.17518
- Li Lin;
- Zhou Sitong;
- Tan Luyang;
- Wang Dong
- Article
26
- JETP Letters, 2008, v. 86, n. 9, p. 615, doi. 10.1134/S0021364007210138
- Akhmedov, E. T.;
- Singleton, D.
- Article
27
- Measurement & Control (0020-2940), 2014, v. 47, n. 8, p. 246, doi. 10.1177/0020294014551629
- Lu, Yonghua;
- Li, Yawei;
- Li, Jing
- Article
28
- Journal of Synchrotron Radiation, 2004, v. 11, n. 5, p. 406, doi. 10.1107/S0909049504014839
- Mudie, S. T.;
- Pavlov, K. M.;
- Morgan, M. J.;
- Hester, J. R.;
- Tabuchi, M.;
- Takeda, Y.
- Article
29
- Astrophysics & Space Sciences Transactions (ASTRA), 2011, v. 7, n. 3, p. 279, doi. 10.5194/astra-7-279-2011
- Kanonidi, K. Kh.;
- Khaerdinov, N. S.;
- Lidvansky, A. S.;
- Sobisevich, L. E.;
- Vainio, R.
- Article
30
- Radiation Protection Dosimetry, 2006, v. 118, n. 1, p. 3, doi. 10.1093/rpd/nci317
- Article
31
- European Physical Journal C -- Particles & Fields, 2006, v. 48, n. 2, p. 677, doi. 10.1140/epjc/s10052-006-0083-8
- Raniwala, S.;
- Idzik, M.;
- Raniwala, R.;
- Viyogi, Y. P.
- Article
32
- European Physical Journal C -- Particles & Fields, 2006, v. 48, n. 1, p. 3, doi. 10.1140/epjc/s2006-02625-4
- Schieck, J.;
- Bethke, S.;
- Biebel, O.;
- Kluth, S.;
- Fernández, P. A. M.;
- Pahl, C.
- Article
33
- International Journal of PIXE, 2002, v. 12, n. 3/4, p. 93, doi. 10.1142/S0129083502000184
- Hu Zhaohui;
- Liu Pingsheng;
- Huang Yuying;
- Wang Baoyi;
- Feng Guohua;
- Budnar, Miloś;
- Pelicon, Primo&zcirc;;
- Kavĉiĉ, Matja&zcirc;
- Article
34
- Semiconductors, 2017, v. 51, n. 5, p. 657, doi. 10.1134/S1063782617050220
- Senokosov, E.;
- Chukita, V.;
- Khamidullin, R.;
- Cheban, V.;
- Odin, I.;
- Chukichev, M.
- Article
35
- Semiconductors, 2009, v. 43, n. 6, p. 796, doi. 10.1134/S1063782609060207
- Eremin, V. K.;
- Verbitskaya, E. M.;
- Ilyashenko, I. N.;
- Eremin, I. V.;
- Safonova, N. N.;
- Tuboltsev, Yu. V.;
- Egorov, N. N.;
- Golubkov, S. A.;
- Konkov, K. A.
- Article
37
- Sensors (14248220), 2016, v. 16, n. 10, p. 1611, doi. 10.3390/s16101611
- Wei Wang;
- Jiapin Chen;
- Zivkovic, Aleksandar. S.;
- Huikai Xie
- Article
38
- Sensors (14248220), 2015, v. 15, n. 12, p. 29938, doi. 10.3390/s151229779
- Contreras, Javier;
- Tornero, Josep;
- Ferreira, Isabel;
- Martins, Rodrigo;
- Gomes, Luis;
- Fortunato, Elvira
- Article
39
- Sensors (14248220), 2014, v. 14, n. 4, p. 7505, doi. 10.3390/s140407505
- Borui Li;
- Chundi Mu;
- Shuli Han;
- Tianming Bai
- Article
40
- Sensors (14248220), 2012, v. 12, n. 12, p. 16771, doi. 10.3390/s121216771
- Ivan, Ioan Alexandru;
- Ardeleanu, Mihai;
- Laurent, Guillaume J.
- Article
41
- Instruments & Experimental Techniques, 2005, v. 48, n. 4, p. 538, doi. 10.1007/s10786-005-0095-x
- Rakhimov, N.;
- Ser’eznov, A.
- Article
42
- Journal of Circuits, Systems & Computers, 2000, v. 10, n. 1/2, p. 113, doi. 10.1142/S021812660000010X
- Parnichkun, Manukid;
- Samadi, Viraphan
- Article
43
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201870012
- Ashar, A. Z.;
- Ganesh, N.;
- Narayan, K. S.
- Article
44
- Modern Physics Letters A, 2011, v. 26, n. 39, p. 2951, doi. 10.1142/S0217732311037339
- DUTTA, S.;
- JASVANTLAL, J. K.;
- DEWANTO, A.;
- CHAN, A. H.;
- OH, C. H.
- Article