Works matching IS 00218898 AND DT 2001 AND VI 34 AND IP 6

Results: 24

new commercial products.

Published in:: Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 788
Publication type:: Article

The crystal lattice (Book).

Published in:: 2001
Publication type:: Book Review

From molecules to crystallizers (Book).

Published in:: 2001
Publication type:: Book Review

Iterative unfolding of two-dimensional data by Siska's method.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 786, doi. 10.1107/S0021889801014194

By:

Wieder, Thomas

Publication type:

Article

Xd-red-1.0: synchroton an in-house X-ray diffraction data reduction and analysis program.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 785, doi. 10.1107/S0021889801013437

By:

Mathiesen, Ragnvald H.

Publication type:

Article

PSEUDO: a program for a pseudo-symmetry search.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 783, doi. 10.1107/S0021889801011852

By:

Kroumova, E.;
Aroyo, M.I.;
Perez-Mato, J.M.;
Ivantchev, S.;
Igartua, J.M.;
Wondratschek, H.

Publication type:

Article

MCGRtof: Monte Carlo G(r) with resolution corrections for time-of-flight neutron diffractometers.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 780, doi. 10.1107/S0021889801015345

By:

Tucker, Matthew G.;
Dove, Martin T.;
Keen, David A.

Publication type:

Article

NADA--a computer program for the simultaneous refinement of orientation matrix and modulation vector(s).

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 777

By:

Schonleber, Andreas;
Meyer, Mathias;
Chapuis, Gervais

Publication type:

Article

Using Situs for the registration of protein structures with low-resolution bead models from X-ray solution scattering.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 773, doi. 10.1107/S0021889801012869

By:

Wriggers, Willy;
Chacon, Pablo

Publication type:

Article

Scattering curve and radius of gyration of a straight chain of identical spheres.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 771, doi. 10.1107/S0021889801014558

By:

Kawaguchi, Takeshi

Publication type:

Article

Teaching diffraction using computer simulations over the Internet.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 767, doi. 10.1107/S0021889801013656

By:

Proffen, Th.;
Neder, R.B.;
Billinge, S.J.L.

Publication type:

Article

Controllable variation of the intensity of diffracted X-ray beams and double modulation of such beams for transmission and reception of audio information.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 763, doi. 10.1107/S0021889801015333

By:

Navasardyan, M.A.

Publication type:

Article

Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 757, doi. 10.1107/S0021889801014728

By:

Ballirano, Paolo;
Caminiti, Ruggero

Publication type:

Article

Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 751, doi. 10.1107/S0021889801014273

By:

Poulsen, H.F.;
Nielsen, S.F.;
Lauridsen, E.M.;
Schmidt, S.;
Suter, R.M.;
Lienert, U.;
Margulies, L.;
Lorentzen, T.;
Jensen, D. Juul

Publication type:

Article

Tracking: a method for structural characterization of grains in powders or polycrystals.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 744, doi. 10.1107/S0021889801014170

By:

Lauridsen, E.M.;
Schmidt, S.;
Suter, R.M.;
Poulsen, H.F.

Publication type:

Article

The precision of diffraction peak location.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 737, doi. 10.1107/S002188980101411X

By:

Withers, Philip J.;
Daymond, Mark R.;
Johnson, Michael W.

Publication type:

Article

Direct determination of microstructural parameters from the X-ray diffraction profile of a crystal with stacking faults.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 730, doi. 10.1107/S0021889801014091

By:

Estevez-Rams, Ernesto;
Penton-Madrigal, Arbelio;
Lora-Serrano, Raymundo;
Martinez-Garcia, Jorge

Publication type:

Article

Orthorhombic lattice deformation of CuAlBe shape-memory single crystals under cyclic strain.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 722, doi. 10.1107/S002188980101384X

By:

Tidu, A.;
Eberhardt, A.;
Bolle, B.;
Moreau, F.;
Heizmann, J.-J.

Publication type:

Article

Measurement of subtle strain modifications in heterostructures by using X-ray mapping in reciprocal space.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 715, doi. 10.1107/S0021889801013759

By:

Shilo, D.;
Lakin, E.;
Zolotoyabko, E.

Publication type:

Article

Salts of aromatic carboxylates: the crystal structures of nickel(II) and cobalt(II) 2,6-naphthalenedi-carboxylate tetrahydrate.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 710, doi. 10.1107/S0021889801012857

By:

Kaduk, James A.;
Hanko, Jason A.

Publication type:

Article

A random procedure for the decomposition of a powder pattern in EXPO.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 704, doi. 10.1107/S0021889801012729

By:

Altomare, Angela;
Giacovazzo, Carmelo;
Moliterni, Anna Grazia Giuseppina;
Rizzi, Rosanna

Publication type:

Article

Planar faults in layered Bi-containing perovskites studies by X-ray diffraction line profile analysis.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 699, doi. 10.1107/S0021889801011700

By:

Boulle, A.;
Legrand, C.;
Guinebretiere, R.;
Mercurio, J.P.;
Dauger, A.

Publication type:

Article

Robust Rietveld refinement in the presence of impurity phases.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 691, doi. 10.1107/S0021889801011396

By:

David, W.I.F.

Publication type:

Article

A new method for analysing peak broadening caused by compositional fluctuation in X-ray diffraction measurements.

Published in:

Journal of Applied Crystallography, 2001, v. 34, n. 6, p. 681, doi. 10.1107/S0021889801011347

By:

Nakashima, Kiichi;
Kawaguchi, Yoshihiro

Publication type:

Article