Works matching IS 00218898 AND DT 2000 AND VI 33 AND IP 6
Results: 23
crystallographers.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1450
- By:
- Publication type:
- Article
Response to Larsen & Thorkildsen's comments on Extinction-corrected mean thickness and integrated width used in the program UMWEG98.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1448, doi. 10.1107/S0021889800010992
- By:
- Publication type:
- Article
Comments on Extinction-corrected mean thickness and integral width used in the program UMWEG98 by Rossmanith (2000).
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1447, doi. 10.1107/S0021889800010980
- By:
- Publication type:
- Article
Molsee: a Tcl/Tk-based program to control Rasmol.
- Published in:
- 2000
- By:
- Publication type:
- Product Review
OVIONE: a new vector-search rotation-function program for macromolecular crystallography.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1436
- By:
- Publication type:
- Article
Preferred orientation in Debye-Scherrer geometry: interpretation of the March coefficient.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1434, doi. 10.1107/S0021889800012267
- By:
- Publication type:
- Article
Quantitative X-ray standing-wave phase analysis by means of photoelectrons.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1430, doi. 10.1107/S0021889800012036
- By:
- Publication type:
- Article
Electric-field-induced structural changes measured with a CCD-coupled X-ray image intensifier.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1422, doi. 10.1107/S0021889800013285
- By:
- Publication type:
- Article
Bayesian estimation of hyperparameters for indirect Fourier transformation in small-angle scattering.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1415, doi. 10.1107/S0021889800012930
- By:
- Publication type:
- Article
Kinematical two-dimensional multiple-diffraction intensity profiles. Application to ω-ψ scans obtained with Cu Kα radiation.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1405, doi. 10.1107/S002188980001270X
- By:
- Publication type:
- Article
On the resolution of neutron scattering instruments.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1399, doi. 10.1107/S0021889800013236
- By:
- Publication type:
- Article
Resolution calculations for novel neutron beam elements.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1393, doi. 10.1107/S0021889800013224
- By:
- Publication type:
- Article
A small-angle neutron scattering model for polydisperse spherical particles with diffusion zones and application to soft magnetic metallic glass.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1386, doi. 10.1107/S0021889800013248
- By:
- Publication type:
- Article
A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1376, doi. 10.1107/S0021889800012772
- By:
- Publication type:
- Article
Coupling between spatial and angular variables in surface X-ray diffraction: effects on the line shapes and integrated intensities.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1365, doi. 10.1107/S0021889800012188
- By:
- Publication type:
- Article
Hardness of oxide films formed as a result of aluminium anode oxidation processes.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1360
- By:
- Publication type:
- Article
X-ray diffractometer for structural studies of surfaces and interfaces.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1342, doi. 10.1107/S0021889800011468
- By:
- Publication type:
- Article
Estimating nanoparticle size from diffraction measurements.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1335, doi. 10.1107/S0021889800010888
- By:
- Publication type:
- Article
Analysis of the asymptotic properties of X-ray line broadening caused by dislocations.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1329, doi. 10.1107/S002188980001058X
- By:
- Publication type:
- Article
Estimation of statistical uncertainties in quantitative phase analysis using the Rietveld method and the whole-powder-pattern decomposition method.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1324, doi. 10.1107/S0021889800010402
- By:
- Publication type:
- Article
Kα[sub1]-Kα[sub2] characteristic of a parabolic graded multilayer.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1317, doi. 10.1107/S0021889800010396
- By:
- Publication type:
- Article
Extended pseudo-Voigt function for approximating the Voigt profile.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1311, doi. 10.1107/S0021889800010219
- By:
- Publication type:
- Article
Completion of crystal structures from powder data: the use of the coordination polyhedra.
- Published in:
- Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1305, doi. 10.1107/S0021889800010852
- By:
- Publication type:
- Article