Works matching IS 00218898 AND DT 2000 AND VI 33 AND IP 5

Results: 14

crystallographers.

Published in:

2000

By:

Cockayne, David J.;
Gjonnes, Jon;
Humphreys, Colin J.;
Lehmpfuhl, Gunter;
Murphy, John;
Shmueli, Uri;
Spence, John C.H.;
Tanaka, Michiyoshi;
Witte, Nicholas S.

Publication type:

Obituary

The number of good reflections in a powder pattern.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1295, doi. 10.1107/S0021889800009250

By:

Sivia, D.S.

Publication type:

Article

X-ray determination of dislocation density and arrangement in plastically deformed copper.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1284, doi. 10.1107/S0021889800008256

By:

Breuer, D.;
Klimanek, P.;
Pantleon, W.

Publication type:

Article

X-ray diffraction line broadening from thermally deposited gold films.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1271, doi. 10.1107/S0021889800009936

By:

Cheary, R.W.;
Dooryhee, E.;
Lynch, P.;
Armstrong, N.;
Dligatch, S.

Publication type:

Article

Powder diffraction beyond the Bragg law: study of palladium nanocrystals.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1262, doi. 10.1107/S0021889800009869

By:

Kaszkur, Zbigniew

Publication type:

Article

An imaging-plate detector for small-angle neutron scattering.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1253, doi. 10.1107/S0021889800009067

By:

Cheng, Y.T.;
Mildner, D.F.R.;
Chen-Mayer, H.H.;
Sharov, V.A.;
Glinka, C.J.

Publication type:

Article

Determination of hydrogen ordering with the β-RH2+x phase (R = Ho, Y) using electron diffraction techniques.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1242, doi. 10.1107/S0021889800009523

By:

Grier, Elizabeth J.;
Petford-Long, Amanda K.;
Ward, Roger C.C.

Publication type:

Article

Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plate.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1241, doi. 10.1107/S0021889800009286

By:

Fujiwara, A.;
Ishii, K.;
Watanuki, T.;
Suematsu, H.;
Nakao, H.;
Ohwada, K.;
Fujii, Y.;
Murakami, Y.;
Kawada, H.;
Kikegawa, T.;
Shimomura, O.;
Matsubara, T.;
Hanabusa, H.;
Daicho, S.;
Kitamura, S.;
Katayama, C.

Publication type:

Article

Microcrystallography with an X-ray waveguide.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1231

By:

Muller, M.;
Burghammer, M.;
Flot, D.;
Riekel, C.;
Morawe, C.;
Murphy, B.;
Cedola, A.

Publication type:

Article

A novel free-mounting system for protein crystals: transformation and improvement of diffraction power by accurately controlled humidity changes.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1223, doi. 10.1107/S0021889800008049

By:

Kiefersauer, Reiner;
Than, Manuel E.;
Dobbek, Holger;
Gremer, Lothar;
Melero, Marcos;
Strobol, Stefan;
Dias, Joao M.;
Soulimane, Tewfik;
Huber, Robert

Publication type:

Article

Identification of an Al-Ni-O precipitate combustion-synthesized NiAl.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1217, doi. 10.1107/S0021889800008505

By:

Biswas, A.;
Madangopal, K.;
Singh, J.B.;
Roy, S.K.;
Banerjee, S.

Publication type:

Article

Solving the generalized indirect Fourier transformation (GIFT) by Boltzmann simplex simulated annealing (BSSA).

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1212, doi. 10.1107/S0021889800008372

By:

Bergmann, A.;
Fritz, G.;
Glatter, O.

Publication type:

Article

A tangent formula derived from Patterson-function arguments. VII. Solution of inorganic structures from powder data with accidental overlap.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1208, doi. 10.1107/S0021889800007834

By:

Rius, J.;
Torrelles, X.;
Miravitlles, C.;
Ochando, L.E.;
Reventos, M.M.;
Amigo, J.M.

Publication type:

Article

The disordered structure of tetraferrocenyl-[3]-cumulene, (Fc)2C=C=C+C(Fc)2, by simulated annealing using synchrotron powder diffraction data.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1199, doi. 10.1107/S0021889800007470

By:

Dinnebier, Robert E.;
Schweiger, Manual;
Bildstein, Benno;
Shankland, Kenneth;
David, William I.F.;
Jobst, Andreas;
van Smaalen, Sander

Publication type:

Article

Works matching IS 00218898 AND DT 2000 AND VI 33 AND IP 5

crystallographers.

The number of good reflections in a powder pattern.

X-ray determination of dislocation density and arrangement in plastically deformed copper.

X-ray diffraction line broadening from thermally deposited gold films.

Powder diffraction beyond the Bragg law: study of palladium nanocrystals.

An imaging-plate detector for small-angle neutron scattering.

Determination of hydrogen ordering with the β-RH<sub>2+x</sub> phase (R = Ho, Y) using electron diffraction techniques.

Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plate.

Microcrystallography with an X-ray waveguide.

A novel free-mounting system for protein crystals: transformation and improvement of diffraction power by accurately controlled humidity changes.

Identification of an Al-Ni-O precipitate combustion-synthesized NiAl.

Solving the generalized indirect Fourier transformation (GIFT) by Boltzmann simplex simulated annealing (BSSA).

A tangent formula derived from Patterson-function arguments. VII. Solution of inorganic structures from powder data with accidental overlap.

The disordered structure of tetraferrocenyl-[3]-cumulene, (Fc)<sub>2</sub>C=C=C+C(Fc)<sub>2</sub>, by simulated annealing using synchrotron powder diffraction data.