Works matching IS 00218898 AND DT 2000 AND VI 33 AND IP 2

Results: 34

computer program abstracts.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 417, doi. 10.1107/S0021889800001801

By:

Pilati, Tullio;
Forni, Alessandra

Publication type:

Article

A beam-stop mount designed for use with area detectors.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 415, doi. 10.1107/S0021889899015587

By:

Bertok, Alexander;
Allen Jr., John W.;
Wen-jeng Li;
Sheriff, Steven

Publication type:

Article

ShakePSD: automatic phase solver covering heavy-atom methods and direct methods for Windows PCs.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 406, doi. 10.1107/S0021889899015058

By:

Okada, Sachiko;
Okada, Kenji

Publication type:

Article

ROD: a program for surface X-ray crystallography.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 401, doi. 10.1107/S0021889899013655

By:

Vlieg, Elias

Publication type:

Article

In situ X-ray crystallography.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 397, doi. 10.1107/S0021889800001254

By:

McPherson, Alexander

Publication type:

Article

The Huber G670 imaging-plate Guinier camera tested on beamline I711 at the MAX II synchrotron.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 394, doi. 10.1107/S0021889800000893

By:

Stahl, Kenny

Publication type:

Article

How the R factor changes as molecules become larger.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 392, doi. 10.1107/S0021889800000777

By:

Krebs, Frederick C.

Publication type:

Article

Parallel-beam X-ray diffractometry using X-ray guide tubes.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 389, doi. 10.1107/S0021889899015344

By:

Yamanoi, Toyoko;
Nakazawa, Hiromoto

Publication type:

Article

Crystallization bench.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 387, doi. 10.1107/S0021889899015691

By:

Cabric, B.;
Pavlovic, T.

Publication type:

Article

Polar potassium rare earth nitrates K2[RE(NO3)5(H2O)2] (RE = La, Ce, Pr, and Nd). II. Linear and nonlinear optical properties.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 380, doi. 10.1107/S002188980000087X

By:

Hellwig, H.;
Ruhle, S.;
Held, P.;
Bohaty, L.

Publication type:

Article

Polar potassium rare earth nitrates K2[RE(NO3)5(H2O)2] (RE = La, CE, Pr and Nd). I. Crystal growth and crystal structures.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 372, doi. 10.1107/S0021889800000868

By:

Held, P.;
Hellwig, H.;
Ruhle, S.;
Bohaty, L.

Publication type:

Article

Application for high-energy synchroton radiation for texture studies.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 364, doi. 10.1107/S0021889899016684

By:

Mishin, O.V.;
Lauridsen, E.M.;
Lassen, N.C. Krieger;
Bruckner, G.;
Tschentscher, T.;
Bay, B.;
Jensen, D. Juul;
Poulsen, H.F.

Publication type:

Article

Reconstruction of low-resolution three-dimensional density maps from one-dimensional small-angle X-ray solution scattering data for biomolecules.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 350, doi. 10.1107/S0021889899015976

By:

Walther, Dirk;
Cohen, Fred E.;
Doniach, Sebastian

Publication type:

Article

Use of a crystallization robot to set up sitting-drop-vapor-diffusion crystallization and in situ crystallization screens.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 344, doi. 10.1107/S0021889800001151

By:

Snook, Christopher F.;
Purdy, Michael D.;
Wiener, Michael C.

Publication type:

Article

A correction for anisotropic line broadening due to structural defects in powder diffraction structure analysis.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 338, doi. 10.1107/S002188980000114X

By:

Solovyov, Leonid A.

Publication type:

Article

Modeling radial collimators for use in stress and texture measurements with neutron diffraction.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 334, doi. 10.1107/S0021889800000856

By:

Wang, D.-Q.;
Wang, X.-L.;
Robertson, J.L.;
Hubbard, C.R.

Publication type:

Article

Extinction-corrected mean thickness and integral width used in the program UMWEG98.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 330, doi. 10.1107/S0021889800000698

By:

Rossmanith, Elisabeth

Publication type:

Article

Kinematical intensity profiles obtained for single and multiple diffraction in perfect spherical crystals.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 323, doi. 10.1107/S0021889800000686

By:

Rossmanith, Elisabeth

Publication type:

Article

Assessment of different X-ray stress measuring techniques for thin titanium nitride coatings.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 312, doi. 10.1107/S0021889800000145

By:

Saerens, A.;
van Houtte, P.;
Meert, B.;
Quaeyhaegens, C.

Publication type:

Article

Solving crystal structures in P1: an automated procedure for finding an allowed origin in the correct space group.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 307, doi. 10.1107/S0021889800000157

By:

Burla, Maria Cristina;
Carrozzini, Benedetta;
Cascarano, Giovanni Luca;
Giacovazzo, Carmelo;
Polidori, Giampiero

Publication type:

Article

X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 296, doi. 10.1107/S0021889800000133

By:

Velterop, L.;
Delhez, R.;
de Keijser, Th.H.;
Mittemeijer, E.J.;
Deefman, D.

Publication type:

Article

Performance of a multi-wavelength monochromator system for neutron single-crystal and powder diffraction.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 291, doi. 10.1107/S0021889899016829

By:

Ahmed, F.U.;
Tanaka, I.;
Niimura, N.

Publication type:

Article

Small-angle X-ray scattering analysis of the periodic tricontinuous network structure of symmetric ABC triblock copolymers.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 285, doi. 10.1107/S0021889899016830

By:

Seki, Motohiro;
Suzuki, Jiro;
Matsushita, Yushu

Publication type:

Article

Phase transitions in ReO3 studied by high-pressure X-ray diffraction.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 279

By:

Jorgensen, J.-E.;
Staun, J.;
Gerward, L.

Publication type:

Article

Accuracy of XRPD QPA using the combined Rietveld-RIR method.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 267, doi. 10.1107/S002188989901643X

By:

Gualtieri, Alessandro F.

Publication type:

Article

Deconvolution of X-ray diffraction profiles by using series expansion.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 259, doi. 10.1107/S0021889899015575

By:

Sanchez-Bajo, F.;
Cumbrera, F.L.

Publication type:

Article

Refinement of free structure parameters of a thin film when only one reflection is available.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 252, doi. 10.1107/S0021889899016039

By:

Meyer, Dirk C.;
Paufler, Peter

Publication type:

Article

Multiple CCD detector for macromolecular X-ray crystallography.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 243, doi. 10.1107/S0021889899015666

By:

Phillips, Walter C.;
Stanton, Martin;
Stewart, Alexander;
Hua Qian;
Ingersoll, Charles;
Sweet, Robert M.

Publication type:

Article

Nest-near-neighbour interactions with AI in Li+- and Rb+-exchanged Na&sup+; β-aluminas, detected by synchroton X-ray absorption spectroscopy.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 234, doi. 10.1107/S0021889899015654

By:

Marcelli, Augusto;
Mottana, Annibale;
Cibin, Giannantonio

Publication type:

Article

Elimination of extrinsic components overlapping lattice distortion variations of a silicon single crystal obtained by double-crystal X-ray topography.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 226, doi. 10.1107/S0021889899015484

By:

Kudo, Y.;
Liu, K.-Y.;
Kawado, S.;
Hirando, K.

Publication type:

Article

SAXS experiments on absolute scale with Kratky systems using water as a secondary standard.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 218, doi. 10.1107/S0021889899015216

By:

Orthaber, Doris;
Bergmann, Alexander;
Glatter, Otto

Publication type:

Article

X-ray investigation and discussion of the magnetostriction of Gd3T (T=Ni, Rh, Irx) single crystals.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 213, doi. 10.1107/S0021889899014922

By:

Kusz, J.;
Bohm, H.;
Talik, E.

Publication type:

Article

A non-linear positive method to reconstruct the parent textures from the inherited textures in phase transformation.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 206, doi. 10.1107/S0021889899014879

By:

Humbert, M.;
Gey, N.;
Esling, C.

Publication type:

Article

X-ray study of the light-induced metastable state of a spin-crossover compound.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 201, doi. 10.1107/S0021889899014739

By:

Kusz, Joachim;
Spiering, Hartmut;
Gutlich, Philipp

Publication type:

Article

Works matching IS 00218898 AND DT 2000 AND VI 33 AND IP 2

computer program abstracts.

A beam-stop mount designed for use with area detectors.

ShakePSD: automatic phase solver covering heavy-atom methods and direct methods for Windows PCs.

ROD: a program for surface X-ray crystallography.

In situ X-ray crystallography.

The Huber G670 imaging-plate Guinier camera tested on beamline I711 at the MAX II synchrotron.

How the R factor changes as molecules become larger.

Parallel-beam X-ray diffractometry using X-ray guide tubes.

Crystallization bench.

Polar potassium rare earth nitrates K<sub>2</sub>[RE(NO<sub>3</sub>)<sub>5</sub>(H<sub>2</sub>O)<sub>2</sub>] (RE = La, Ce, Pr, and Nd). II. Linear and nonlinear optical properties.

Polar potassium rare earth nitrates K<sub>2</sub>[RE(NO<sub>3</sub>)<sub>5</sub>(H<sub>2</sub>O)<sub>2</sub>] (RE = La, CE, Pr and Nd). I. Crystal growth and crystal structures.

Application for high-energy synchroton radiation for texture studies.

Reconstruction of low-resolution three-dimensional density maps from one-dimensional small-angle X-ray solution scattering data for biomolecules.

Use of a crystallization robot to set up sitting-drop-vapor-diffusion crystallization and in situ crystallization screens.

A correction for anisotropic line broadening due to structural defects in powder diffraction structure analysis.

Modeling radial collimators for use in stress and texture measurements with neutron diffraction.

Extinction-corrected mean thickness and integral width used in the program UMWEG<sup>98</sup>.

Kinematical intensity profiles obtained for single and multiple diffraction in perfect spherical crystals.

Assessment of different X-ray stress measuring techniques for thin titanium nitride coatings.

Solving crystal structures in P1: an automated procedure for finding an allowed origin in the correct space group.

X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.

Performance of a multi-wavelength monochromator system for neutron single-crystal and powder diffraction.

Small-angle X-ray scattering analysis of the periodic tricontinuous network structure of symmetric ABC triblock copolymers.

Phase transitions in ReO<sub>3</sub> studied by high-pressure X-ray diffraction.

Accuracy of XRPD QPA using the combined Rietveld-RIR method.

Deconvolution of X-ray diffraction profiles by using series expansion.

Refinement of free structure parameters of a thin film when only one reflection is available.

Multiple CCD detector for macromolecular X-ray crystallography.

Nest-near-neighbour interactions with AI in Li<sup>+</sup>- and Rb<sup>+</sup>-exchanged Na&sup+; β-aluminas, detected by synchroton X-ray absorption spectroscopy.

Elimination of extrinsic components overlapping lattice distortion variations of a silicon single crystal obtained by double-crystal X-ray topography.

SAXS experiments on absolute scale with Kratky systems using water as a secondary standard.

X-ray investigation and discussion of the magnetostriction of Gd<sub>3</sub>T (T=Ni, Rh, Ir<sub>x</sub>) single crystals.

A non-linear positive method to reconstruct the parent textures from the inherited textures in phase transformation.

X-ray study of the light-induced metastable state of a spin-crossover compound.