Works matching IS 00220744 AND DT 1997 AND VI 46 AND IP 1
Results: 13
Characteristics of the myelin sheath membrane of the spiral ganglion cell and the cochlear nerve of guinea pig.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 103, doi. 10.1093/oxfordjournals.jmicro.a023485
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High-resolution electron microscopical observations of initial enamel crystals.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 97, doi. 10.1093/oxfordjournals.jmicro.a023496
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Scanning electron microscopic study of the cytoplasmic tubules in lamprey chloride cells.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 93, doi. 10.1093/oxfordjournals.jmicro.a023495
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New fracture-labelling method: alkaline phosphatase in unstimulated human neutrophils.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 85, doi. 10.1093/oxfordjournals.jmicro.a023494
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Development of coincidence transmission electron microscope (II) Observation of coincidence electron microscopic image.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 79, doi. 10.1093/oxfordjournals.jmicro.a023493
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Helical nanotubes of hexagonal boron nitride.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 75, doi. 10.1093/oxfordjournals.jmicro.a023492
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Structure of a stacking fault in the (101) plane of TiO2.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 67, doi. 10.1093/oxfordjournals.jmicro.a023491
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Image contrast of biological materials in high-voltage electron microscopy.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 59, doi. 10.1093/oxfordjournals.jmicro.a023490
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FIB/HVEM observation of the configuration of cracks and the defect structure near the cracks in Si.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 45, doi. 10.1093/oxfordjournals.jmicro.a023489
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Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 33, doi. 10.1093/oxfordjournals.jmicro.a023488
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Structure determination of YBCO fluorinated phases by HREM.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 23, doi. 10.1093/oxfordjournals.jmicro.a023487
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Multiple beam tilt microscopy for super resolved imaging.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 11, doi. 10.1093/oxfordjournals.jmicro.a023486
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Correction properties of electron mirrors.
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- Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 1, doi. 10.1093/oxfordjournals.jmicro.a023484
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- Article