Works matching IS 00220744 AND DT 2009 AND VI 58 AND IP 2
1
- Journal of Electron Microscopy, 2009, v. 58, n. 2, p. 55, doi. 10.1093/jmicro/dfp008
- Norio Amizuka;
- Minqi Li;
- Kuniko Hara;
- Masatoshi Kobayashi;
- Paulo H. L. de Freitas;
- Sobhan Ubaidus;
- Kimimitsu Oda;
- Yasuhiro Akiyama
- Article
2
- Journal of Electron Microscopy, 2009, v. 58, n. 2, p. 47, doi. 10.1093/jmicro/dfp005
- Rina Jeger;
- Yona Lichtenfeld;
- Hagit Peretz;
- Boaz Shany;
- Razi Vago;
- Danny Baranes
- Article
3
- Journal of Electron Microscopy, 2009, v. 58, n. 2, p. 35, doi. 10.1093/jmicro/dfp004
- Kimie Atsuzawa;
- Nobuteru Usuda;
- Ayami Nakazawa;
- Motoaki Fukasawa;
- Radostin Danev;
- Shouzou Sugitani;
- Kuniaki Nagayama
- Article
4
- Journal of Electron Microscopy, 2009, v. 58, n. 2, p. 67, doi. 10.1093/jmicro/dfp001
- Junzo Desaki;
- Naoya Nishida
- Article
5
- Journal of Electron Microscopy, 2009, v. 58, n. 2, p. 29, doi. 10.1093/jmicro/dfp009
- Yuji Otsuka;
- Yumiko Shimizu;
- Isao Tanaka
- Article