Works matching IS 00220744 AND DT 2007 AND VI 56 AND IP 5
1
- Journal of Electron Microscopy, 2007, v. 56, n. 5, p. 181, doi. 10.1093/jmicro/dfm020
- Charu Thakral;
- Jerrold L. Abraham
- Article
2
- Journal of Electron Microscopy, 2007, v. 56, n. 5, p. 163, doi. 10.1093/jmicro/dfm024
- Kensuke Inai;
- Kaoru Ohya;
- Tohru Ishitani
- Article
3
- Journal of Electron Microscopy, 2007, v. 56, n. 5, p. 189, doi. 10.1093/jmicro/dfm023
- Article
4
- Journal of Electron Microscopy, 2007, v. 56, n. 5, p. 171, doi. 10.1093/jmicro/dfm022
- Tetsuo Oikawa;
- Joong Jung Kim;
- Takeshi Tomita;
- Hyun Soon Park;
- Daisuke Shindo
- Article
5
- Journal of Electron Microscopy, 2007, v. 56, n. 5, p. 177, doi. 10.1093/jmicro/dfm021
- Kenta Yoshida;
- Tsutomu Nozaki;
- Tsukasa Hirayama;
- Nobuo Tanaka
- Article
6
- Journal of Electron Microscopy, 2007, v. 56, n. 5, p. 203, doi. 10.1093/jmicro/dfm018
- Junzo Desaki;
- Shuzo Ninomiya;
- Masaru Fujita
- Article