Works matching IS 00220744 AND DT 2007 AND VI 56 AND IP 2
1
- Journal of Electron Microscopy, 2007, v. 56, n. 2, p. 37, doi. 10.1093/jmicro/dfm013
- Article
2
- Journal of Electron Microscopy, 2007, v. 56, n. 2, p. 57, doi. 10.1093/jmicro/dfm006
- Kenji Tsuda;
- Hajime Mitsuishi;
- Masami Terauchi;
- Kazuo Kawamura
- Article
3
- Journal of Electron Microscopy, 2007, v. 56, n. 2, p. 63, doi. 10.1093/jmicro/dfm005
- Junzo Desaki;
- Naoya Nishida
- Article
4
- Journal of Electron Microscopy, 2007, v. 56, n. 2, p. 69, doi. 10.1093/jmicro/dfm004
- Junzo Desaki;
- Naoya Nishida
- Article
5
- Journal of Electron Microscopy, 2007, v. 56, n. 2, p. 43, doi. 10.1093/jmicro/dfm003
- Pyuck-Pa Choi;
- Young-Soon Kwon;
- Ji-Soon Kim;
- Talaat Al-Kassab
- Article
6
- Journal of Electron Microscopy, 2007, v. 56, n. 2, p. 51, doi. 10.1093/jmicro/dfm002
- Hai-Bo Zhang;
- Fang Wang;
- Akio Takaoka
- Article