Works matching IS 00220744 AND DT 2006 AND VI 55 AND IP 4
Results: 6
Embedment-free section electron microscopy.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 231, doi. 10.1093/jmicro/dfl030
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- Publication type:
- Article
Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: II. Application to practical ELNES analysis of low SNR.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 225, doi. 10.1093/jmicro/dfl029
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- Article
Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: I. Principle and test examples.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 215, doi. 10.1093/jmicro/dfl028
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- Article
A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 209, doi. 10.1093/jmicro/dfl027
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- Article
Visibility of Si nanoparticles embedded in an amorphous SiO2 matrix.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 201, doi. 10.1093/jmicro/dfl026
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- Publication type:
- Article
The wrap-around problem and optimal padding in the exit wave reconstruction using HRTEM images.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 191, doi. 10.1093/jmicro/dfl025
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- Article