Works matching IS 00220744 AND DT 2006 AND VI 55 AND IP 2
1
- Journal of Electron Microscopy, 2006, v. 55, n. 2, p. 75, doi. 10.1093/jmicro/dfl014
- Article
2
- Journal of Electron Microscopy, 2006, v. 55, n. 2, p. 51, doi. 10.1093/jmicro/dfl019
- Article
3
- Journal of Electron Microscopy, 2006, v. 55, n. 2, p. 113, doi. 10.1093/jmicro/dfl018
- Article
4
- Journal of Electron Microscopy, 2006, v. 55, n. 2, p. 63, doi. 10.1093/jmicro/dfl017
- Article
5
- Journal of Electron Microscopy, 2006, v. 55, n. 2, p. 53, doi. 10.1093/jmicro/dfl012
- Article
6
- Journal of Electron Microscopy, 2006, v. 55, n. 2, p. 107, doi. 10.1093/jmicro/dfl011
- Article
7
- Journal of Electron Microscopy, 2006, v. 55, n. 2, p. 69, doi. 10.1093/jmicro/dfl010
- Article
8
- Journal of Electron Microscopy, 2006, v. 55, n. 2, p. 89, doi. 10.1093/jmicro/dfl009
- Article
9
- Journal of Electron Microscopy, 2006, v. 55, n. 2, p. 97, doi. 10.1093/jmicro/dfl004
- Article