Works matching IS 00220744 AND DT 2005 AND VI 54 AND IP 1
1
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 79, doi. 10.1093/jmicro/dfh105
- Article
2
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 61, doi. 10.1093/jmicro/dfh104
- Article
3
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 51, doi. 10.1093/jmicro/dfh103
- Article
4
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 43, doi. 10.1093/jmicro/dfh102
- Article
5
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 57, doi. 10.1093/jmicro/dfh101
- Article
6
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 67, doi. 10.1093/jmicro/dfh100
- Article
7
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 35, doi. 10.1093/jmicro/dfh099
- Article
8
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 19, doi. 10.1093/jmicro/dfh098
- Article
9
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 29, doi. 10.1093/jmicro/dfh097
- Article
10
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 11, doi. 10.1093/jmicro/dfh096
- Article
11
- Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 1, doi. 10.1093/jmicro/dfh047
- Article