Editorial.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 441, doi. 10.1093/jmicro/dfh095
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- Publication type:
- Article
Works matching IS 00220744 AND DT 2004 AND VI 53 AND IP 5
Results: 26
1
2
Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 465, doi. 10.1093/jmicro/dfh090
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- Article
3
Post-thinning technique for a lifted-out membrane.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 493, doi. 10.1093/jmicro/dfh085
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- Publication type:
- Article
4
Microstructures of galvannealing coats plated on an iron substrate deformed by indentation.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 557
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- Publication type:
- Article
5
Application of FIB with micro pick-up to microstructural study of irradiated SiC/SiC composites.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 519, doi. 10.1093/jmicro/dfh081
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- Publication type:
- Article
6
Reducing focused ion beam damage to transmission electron microscopy samples.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 451, doi. 10.1093/jmicro/dfh080
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- Publication type:
- Article
7
3D analysis of cracking behaviour under indentation in ion-irradiated β-SiC.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 511, doi. 10.1093/jmicro/dfh079
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- Article
8
Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 443, doi. 10.1093/jmicro/dfh078
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- Publication type:
- Article
9
Application of a focused ion beam mill to the characterisation of a microstructure in tin plating on a Fe 42wt% Ni substrate.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 541, doi. 10.1093/jmicro/dfh064
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- Publication type:
- Article
10
Crystallographic orientation contrast associated with Ga+ ion channelling for Fe and Cu in focused ion beam method.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 571
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- Publication type:
- Article
11
Transmission electron microscopy on thin film of high density magnetic composite prepared by FIB method.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 485, doi. 10.1093/jmicro/dfh072
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- Article
12
A review of focused ion beam technology and its applications in transmission electron microscopy.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 527, doi. 10.1093/jmicro/dfh071
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- Publication type:
- Article
13
Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 497, doi. 10.1093/jmicro/dfh067
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- Publication type:
- Article
14
A new method for preparing plan-view TEM specimen of multilayered films using focused ion beam.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 501, doi. 10.1093/jmicro/dfh065
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- Publication type:
- Article
15
Microstructural analysis of the deformation range under nano-indentation in β-SiC.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 515, doi. 10.1093/jmicro/dfh073
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- Publication type:
- Article
16
Application of a FIB–STEM system for 3D observation of a resin-embedded yeast cell.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 563, doi. 10.1093/jmicro/dfh063
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- Publication type:
- Article
17
A study of the damage on FIB-prepared TEM samples of AlxGa1−xAs.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 471, doi. 10.1093/jmicro/dfh062
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- Publication type:
- Article
18
Microsampling technique for EBSP inspection on the cross-sections of copper trench lines in ULSIs.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 567, doi. 10.1093/jmicro/dfh061
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- Publication type:
- Article
19
Plan-view and cross-sectional characterization of thiourea-treated phosphorus-added steel surface.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 553, doi. 10.1093/jmicro/dfh060
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- Publication type:
- Article
20
A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 479, doi. 10.1093/jmicro/dfh059
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- Publication type:
- Article
21
Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10 kV and 40 kV.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 459, doi. 10.1093/jmicro/dfh058
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- Publication type:
- Article
22
Focused ion beam fabrication of field-ion microscope specimens from mechanically milled pearlitic steel powder.
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- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 523, doi. 10.1093/jmicro/dfh054
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- Publication type:
- Article
23
FIB and TEM Observations of Defects in Hot-Dip Zinc Coatings.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 545, doi. 10.1093/jmicro/dfh053
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- Publication type:
- Article
24
HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting method.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 505, doi. 10.1093/jmicro/dfh052
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- Publication type:
- Article
25
Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 489, doi. 10.1093/jmicro/dfh050
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- Publication type:
- Article
26
Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 5, p. 537, doi. 10.1093/jmicro/dfh049
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- Publication type:
- Article