Works matching IS 00220744 AND DT 2004 AND VI 53 AND IP 4
Results: 14
Bandgap mapping for III–V quantum well by electron spectroscopy imaging.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 371, doi. 10.1093/jmicro/dfh082
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In situ ESEM observation of melting silver and Inconel on an Al2O3 powder bed.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 393, doi. 10.1093/jmicro/dfh070
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Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 403, doi. 10.1093/jmicro/dfh068
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Cytochemical detection of endogenous peroxidase in the intralobular ducts of hamster major salivary glands.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 435, doi. 10.1093/jmicro/dfh066
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Appearance of electron-dense segments: indication of possible conformational changes of pre-mineralizing collagen fibrils in the osteoid of rat bones.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 423, doi. 10.1093/jmicro/dfh057
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Influence of plasma and inflammatory proteins on the ultrastructure of exogenous surfactant.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 407, doi. 10.1093/jmicro/dfh056
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Immunohistochemical detection of haem oxygenase in AA amyloidogenesis.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 417, doi. 10.1093/jmicro/dfh055
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HVEM characterization of crack tip dislocations in silicon crystals.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 353, doi. 10.1093/jmicro/dfh051
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Aluminium phosphide as a eutectic grain nucleus in hypoeutectic Al-Si alloys.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 361, doi. 10.1093/jmicro/dfh048
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High-resolution transmission electron microscopy study of Ca3Co4O9.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 397, doi. 10.1093/jmicro/dfh046
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Suzuki segregation in a binary Cu-Si alloy.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 311
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Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 339, doi. 10.1093/jmicro/dfh044
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Behaviors of surfactant atoms on Si(001) surface.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 325, doi. 10.1093/jmicro/dfh043
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Voltage refinement by deficit HOLZ line geometry.
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- Journal of Electron Microscopy, 2004, v. 53, n. 4, p. 381, doi. 10.1093/jmicro/dfh038
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- Article