Magnification calibration of X-ray 3D microscopy using micro-line structures.
- Published in:
- Microscopy, 2025, v. 74, n. 1, p. 48, doi. 10.1093/jmicro/dfae045
- By:
- Publication type:
- Article
Works matching IS 20505698 AND DT 2025 AND VI 74 AND IP 1
Results: 9
1
2
Surface potential distribution of resist exposed by electron beam and the non-charging exposure conditions.
- Published in:
- Microscopy, 2025, v. 74, n. 1, p. 35, doi. 10.1093/jmicro/dfae044
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- Publication type:
- Article
3
Development of a localized surface plasmon–enhanced electron beam–pumped nanoscale light source for electron beam excitation–assisted optical microscopy.
- Published in:
- Microscopy, 2025, v. 74, n. 1, p. 71, doi. 10.1093/jmicro/dfae043
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- Publication type:
- Article
4
Surface sensitivity of atomic-resolution secondary electron imaging.
- Published in:
- Microscopy, 2025, v. 74, n. 1, p. 28, doi. 10.1093/jmicro/dfae041
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- Publication type:
- Article
5
Precise measurement of spatial coherence and axial brightness based on the Wigner function reconstruction in transmission electron microscopes with field emission guns and a thermionic emission gun.
- Published in:
- Microscopy, 2025, v. 74, n. 1, p. 20, doi. 10.1093/jmicro/dfae040
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- Publication type:
- Article
6
Precise positional alignment of atom-resolved HAADF images of heteroepitaxial interface with low signal-to-noise ratio.
- Published in:
- Microscopy, 2025, v. 74, n. 1, p. 57, doi. 10.1093/jmicro/dfae038
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- Publication type:
- Article
7
Near-field electron ptychography using full-field structured illumination.
- Published in:
- Microscopy, 2025, v. 74, n. 1, p. 10, doi. 10.1093/jmicro/dfae035
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- Publication type:
- Article
8
Total third-degree variation for noise reduction in atomic-resolution STEM images.
- Published in:
- Microscopy, 2025, v. 74, n. 1, p. 1, doi. 10.1093/jmicro/dfae031
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- Publication type:
- Article
9
Simultaneous observation of multiple interferograms with Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope.
- Published in:
- Microscopy, 2025, v. 74, n. 1, p. 63, doi. 10.1093/jmicro/dfae030
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- Publication type:
- Article