Works matching IS 00220744 AND DT 2004 AND VI 53 AND IP 2
1
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 193, doi. 10.1093/jmicro/53.2.193
- Toshiharu Saiki;
- Kazunari Matsuda;
- Shintaro Nomura;
- Masaru Mihara;
- Yoshinobu Aoyagi;
- Selvakumar Nair;
- Toshihide Takagahara
- Article
2
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 157, doi. 10.1093/jmicro/53.2.157
- Airu Wang;
- Osamu Ohashi;
- Norio Yamaguchi;
- Guoqiang Xie;
- Minghui Song;
- Kazuo Furuya;
- Yasuo Higashi;
- Nobuteru Hitomi
- Article
3
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 177, doi. 10.1093/jmicro/53.2.177
- Article
4
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 129, doi. 10.1093/jmicro/53.2.129
- Jun Yamasaki;
- Tomoyuki Kawai;
- Nobuo Tanaka
- Article
5
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 107, doi. 10.1093/jmicro/53.2.107
- James M. Howe;
- Takeshi Yokota;
- Mitsuhiro Murayama;
- William A. Jesser
- Article
6
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 143, doi. 10.1093/jmicro/53.2.143
- Zhi-Quan Liu;
- Minghui Song;
- Kazutaka Mitsuishi;
- Kazuo Furuya;
- Hatsujiro Hashimoto
- Article
7
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 137, doi. 10.1093/jmicro/53.2.137
- Katsunori Ohshima;
- Takeshi Fujita
- Article
8
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 169, doi. 10.1093/jmicro/53.2.169
- Tohru Tsuruoka;
- Sukekatsu Ushioda
- Article
9
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 187, doi. 10.1093/jmicro/53.2.187
- Article
10
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 121
- Seiichiro Ii;
- Chihiro Iwamoto;
- Katsuyuki Matsunaga;
- Takahisa Yamamoto;
- Yuichi Ikuhara
- Article
11
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 115, doi. 10.1093/jmicro/53.2.115
- Zhou-Guang Wang;
- Naoko Kato;
- Katsuhiro Sasaki;
- Tsukasa Hirayama;
- Hiroyasu Saka
- Article
12
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 203, doi. 10.1093/jmicro/53.2.203
- Takashi Sekiguchi;
- Junqing Hu;
- Yoshio Bando
- Article
13
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 209, doi. 10.1093/jmicro/53.2.209
- Article
14
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 149, doi. 10.1093/jmicro/53.2.149
- Shoichi Toh;
- Kenji Kaneko;
- Yasuhiko Hayashi;
- Tomoharu Tokunaga;
- Won-Jin Moon
- Article
15
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 101, doi. 10.1093/jmicro/53.2.101
- John L. Hutchison;
- Jeremy Sloan;
- Angus I. Kirkland;
- Malcolm L. H. Green
- Article
16
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 163, doi. 10.1093/jmicro/53.2.163
- Seizo Morita;
- Yoshiaki Sugimoto;
- Noriaki Oyabu;
- Ryuji Nishi;
- Óscar Custance;
- Yasuhiro Sugawara;
- Masayuki Abe
- Article
17
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 99, doi. 10.1093/jmicro/53.2.99
- Article