Nano-optical probing of exciton wave-functions confined in a GaAs quantum dot.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 193, doi. 10.1093/jmicro/53.2.193
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- Publication type:
- Article
Works matching IS 00220744 AND DT 2004 AND VI 53 AND IP 2
Results: 17
1
2
Electron microscopy observation of interface in diffusion-bonded copper joint.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 157, doi. 10.1093/jmicro/53.2.157
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- Publication type:
- Article
3
Novel local density of state mapping technique for low-dimensional systems.
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- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 177, doi. 10.1093/jmicro/53.2.177
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- Publication type:
- Article
4
Direct observation of a stacking fault in Si1−xGex semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 129, doi. 10.1093/jmicro/53.2.129
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- Publication type:
- Article
5
Effects of heat and electron irradiation on the melting behavior of Al–Si alloy particles and motion of the Al nanosphere within.
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- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 107, doi. 10.1093/jmicro/53.2.107
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- Publication type:
- Article
6
Detection of iron-oxide layer on the surface of iron nitride using high-resolution electron microscopy and Fourier filtering.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 143, doi. 10.1093/jmicro/53.2.143
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- Publication type:
- Article
7
Determination of absolute thickness and mean free path of thin foil specimen by ζ-factor method.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 137, doi. 10.1093/jmicro/53.2.137
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- Publication type:
- Article
8
Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope.
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- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 169, doi. 10.1093/jmicro/53.2.169
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- Publication type:
- Article
9
Scattering-type near-field optical microscopy.
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- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 187, doi. 10.1093/jmicro/53.2.187
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- Publication type:
- Article
10
Identification of crack path of inter- and transgranular fractures in sintered silicon nitride by in situ TEM.
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- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 121
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- Publication type:
- Article
11
Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 115, doi. 10.1093/jmicro/53.2.115
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- Publication type:
- Article
12
Cathodoluminescence study of one-dimensional free-standing widegap-semiconductor nanostructures: GaN nanotubes, Si3N4 nanobelts and ZnS/Si nanowires.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 203, doi. 10.1093/jmicro/53.2.203
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- Publication type:
- Article
13
Observation of polarization property in near-field optical imaging by a polarization-maintaining fiber probe.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 209, doi. 10.1093/jmicro/53.2.209
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- Publication type:
- Article
14
Microstructure of metal-filled carbon nanotubes.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 149, doi. 10.1093/jmicro/53.2.149
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- Publication type:
- Article
15
Growing and characterizing one-dimensional crystals within single-walled carbon nanotubes.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 101, doi. 10.1093/jmicro/53.2.101
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- Publication type:
- Article
16
Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 163, doi. 10.1093/jmicro/53.2.163
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- Publication type:
- Article
17
Preface.
- Published in:
- Journal of Electron Microscopy, 2004, v. 53, n. 2, p. 99, doi. 10.1093/jmicro/53.2.99
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- Publication type:
- Article