Works matching IS 00220744 AND DT 2003 AND VI 52 AND IP 5
1
- Journal of Electron Microscopy, 2003, v. 52, n. 5, p. 485, doi. 10.1093/jmicro/52.5.485
- Yu-Rong Tan;
- Jing-Chen Sun;
- Xin-Ying Lu;
- De-Ming Su;
- Jing-Qiang Zhang
- Article
2
- Journal of Electron Microscopy, 2003, v. 52, n. 5, p. 477, doi. 10.1093/jmicro/52.5.477
- Daisuke Koga;
- Masaki Ueno;
- Shohei Yamashina
- Article
3
- Journal of Electron Microscopy, 2003, v. 52, n. 5, p. 471, doi. 10.1093/jmicro/52.5.471
- Yasuo Miake;
- Yoji Saeki;
- Mitsuru Takahashi;
- Takaaki Yanagisawa
- Article
4
- Journal of Electron Microscopy, 2003, v. 52, n. 5, p. 465, doi. 10.1093/jmicro/52.5.465
- Trang T. Nguyen;
- Anu Saxena;
- Terry J. Beveridge
- Article
5
- Journal of Electron Microscopy, 2003, v. 52, n. 5, p. 441, doi. 10.1093/jmicro/52.5.441
- Masami Terauchi;
- Kenji Tsuda;
- Kazuo Kawamura
- Article
6
- Journal of Electron Microscopy, 2003, v. 52, n. 5, p. 459, doi. 10.1093/jmicro/52.5.459
- Sung-Hwan Lim;
- Tae-Yeub Ra;
- Won-Yong Kim
- Article
7
- Journal of Electron Microscopy, 2003, v. 52, n. 5, p. 455, doi. 10.1093/jmicro/52.5.455
- Ren-Jian Feng;
- Hai-Bo Zhang;
- Katsumi Ura
- Article
8
- Journal of Electron Microscopy, 2003, v. 52, n. 5, p. 449, doi. 10.1093/jmicro/52.5.449
- Dwi Gustiono;
- Norihito Sakaguchi;
- Tamaki Shibayama;
- Hiroshi Kinoshita;
- Heishichiro Takahashi
- Article