Works matching IS 00220744 AND DT 2003 AND VI 52 AND IP 1
Results: 14
Inhomogeneous substitution of polyhalogenated copper‐phthalocyanine studied by high‐resolution imaging and electron crystallography.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 85, doi. 10.1093/jmicro/52.1.85
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In situ HREM observation of nucleation and growth of nanotwins beneath the solid–liquid interface in Si.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 79, doi. 10.1093/jmicro/52.1.79
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Creep deformation of grain boundary in a highly crystalline SiC fibre.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 75, doi. 10.1093/jmicro/52.1.75
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First observation of SiO2/Si(100) interfaces by spherical aberration‐corrected high‐resolution transmission electron microscopy.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 69, doi. 10.1093/jmicro/52.1.69
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Radiation‐induced segregation and precipitation behaviours around cascade clusters under electron irradiation.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 63, doi. 10.1093/jmicro/52.1.63
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In situ HREM study on the structural instability of isolated nanometre‐sized alloy particles in the Sn‐Bi system.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 57, doi. 10.1093/jmicro/52.1.57
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High‐resolution ultrahigh‐vacuum electron microscopy of helical gold nanowires: junction and thinning process.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 49, doi. 10.1093/jmicro/52.1.49
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Influence of Sr‐doping in Ba7Rh6O18, a new one‐dimensional oxide of the homologous series (A3Rh2O6)α(A3Rh3O9)β.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 41, doi. 10.1093/jmicro/52.1.41
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Atomistic observation and simulation analysis of spatio‐temporal fluctuations during radiation‐induced amorphization.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 33, doi. 10.1093/jmicro/52.1.33
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ARHVTEM of the Pd/ZnO heterointerface chemical structure.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 27, doi. 10.1093/jmicro/52.1.27
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Electron holographic 3‐D nano‐analysis of Au/TiO2 catalyst at interface.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 21, doi. 10.1093/jmicro/52.1.21
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Applications of 1 MV field‐emission transmission electron microscope.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 11, doi. 10.1093/jmicro/52.1.11
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A spherical aberration‐corrected 200 kV TEM.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 3, doi. 10.1093/jmicro/52.1.3
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Editorial.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 1, doi. 10.1093/jmicro/52.1.1
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- Article