Works matching DE "RAMAN effect"
1
- Surface Engineering, 2011, v. 27, n. 8, p. 623, doi. 10.1179/026708410X12786785573391
- Chih, Y K;
- Hwang, J;
- Kou, C S;
- Chuang, C C;
- Hu, J L;
- Lee, J M;
- Chang, S C;
- Row, L C;
- Cheng, S H;
- Chen, J P
- Article
2
- Surface Engineering, 2011, v. 27, n. 2, p. 99, doi. 10.1179/174329409X455421
- Nayak, B B;
- Kar, O P N;
- Behera, D;
- Mishra, B K
- Article
3
- Angewandte Chemie, 2013, v. 125, n. 25, p. 6549, doi. 10.1002/ange.201207813
- Casado, Juan;
- Burrezo, Paula Mayorga;
- Ramírez, Francisco J.;
- Navarrete, Juan T. López;
- Lapidus, Saul H.;
- Stephens, Peter W.;
- Vo, Hoa-Lan;
- Miller, Joel S.;
- Mota, Fernando;
- Novoa, Juan J.
- Article
4
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 23, p. 21368, doi. 10.1007/s10854-020-04649-0
- Saravanan, C.;
- Haris, M.;
- Senthilkumar, M.;
- Mathivanan, V.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 15, p. 12476, doi. 10.1007/s10854-020-03794-w
- Sun, Song;
- Hu, Yifeng;
- Lai, Tianshu;
- Zhu, Xiaoqin
- Article
6
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 11, p. 8680, doi. 10.1007/s10854-020-03403-w
- Jouya, Mehraban;
- Taromian, Fahime;
- Afshari Abolkarlou, Mehdi
- Article
7
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 11, p. 8464, doi. 10.1007/s10854-020-03381-z
- Si, Shufang;
- Deng, Hongmei;
- Wang, Tiantian;
- Yang, Pingxiong;
- Chu, Junhao
- Article
8
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 10, p. 7499, doi. 10.1007/s10854-020-03024-3
- Ashok, A.;
- Regmi, G.;
- Romero-Núñez, A.;
- Solis-López, M.;
- Velumani, S.;
- Castaneda, H.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 9, p. 6755, doi. 10.1007/s10854-020-03233-w
- Kumar, Pragati;
- Saxena, Nupur;
- Gupta, Vinay
- Article
10
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 7, p. 5686, doi. 10.1007/s10854-020-03135-x
- Xiao, En-Cai;
- Ren, Qi;
- Cao, Zhikai;
- Dou, Gang;
- Qi, Ze-Ming;
- Shi, Feng
- Article
11
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 4, p. 3197, doi. 10.1007/s10854-020-02867-0
- Benali, E. M.;
- Benali, A.;
- Bejar, M.;
- Dhahri, E.;
- Graca, M. P. F.;
- Valente, M. A.;
- Costa, B. F. O.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 2, p. 1515, doi. 10.1007/s10854-019-02667-1
- Biswas, P. P.;
- Thirmal, Ch.;
- Pal, S.;
- Miryala, M.;
- Murakami, M.;
- Murugavel, P.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 1, p. 752, doi. 10.1007/s10854-019-02582-5
- Madhusudanan, Sreejith P.;
- Suresh Kumar, M.;
- Yamini Yasoda, K.;
- Santhanagopalan, Dhamodaran;
- Batabyal, Sudip K.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 20, p. 18858, doi. 10.1007/s10854-019-02242-8
- Paulraj, K.;
- Ramaswamy, S.;
- Arulanantham, A. M. S.;
- Valanarasu, S.;
- Shkir, Mohd;
- Ganesh, V.;
- AlFaify, S.;
- Kim, Hyun-Seok;
- Kathalingam, A.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 17, p. 16554, doi. 10.1007/s10854-019-02032-2
- Kumar, Ashish;
- Agrawal, Jitesh;
- Sharma, Ashok Kumar;
- Singh, Vipul;
- Agarwal, Ajay
- Article
16
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 16, p. 15116, doi. 10.1007/s10854-019-01884-y
- Akilan, M.;
- Ragu, R.;
- Angelena, J. P.;
- Jerome Das, S.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 15, p. 14464, doi. 10.1007/s10854-019-01816-w
- Saha, Sunirmal;
- Das, Nishi;
- Chakra, Poonam;
- Routray, Krutika L.;
- Behera, Dhrubananda
- Article
18
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 23, p. 17798, doi. 10.1007/s10854-017-7720-x
- Kuang, Daihong;
- Yang, Fangyuan;
- Jing, Weiwen;
- Xie, Haiyan;
- Yang, Zhanjin
- Article
19
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 17, p. 12858, doi. 10.1007/s10854-017-7113-1
- Wang, Jian;
- Cao, Zhigang;
- Zhang, Juan;
- Chen, Haibo;
- Zhang, Guosheng;
- Feng, Mingrui;
- Yu, Benli
- Article
20
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 17, p. 13013, doi. 10.1007/s10854-017-7133-x
- Singh, Gurpreet;
- Kohli, Nipin;
- Singh, Ravi
- Article
21
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 1, p. 474, doi. 10.1007/s10854-016-5545-7
- Fang, Xueli;
- Chen, Xiaohong;
- Zhu, Zhaoshu
- Article
22
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9798, doi. 10.1007/s10854-016-5045-9
- Article
23
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 6, p. 6020, doi. 10.1007/s10854-016-4525-2
- Agrahari, Vivek;
- Mathpal, Mohan;
- Kumar, Sachin;
- Kumar, Mahendra;
- Agarwal, Arvind
- Article
24
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 12, p. 9355, doi. 10.1007/s10854-015-3083-3
- Kurchania, Rajnish;
- Rathore, Deepshikha;
- Pandey, R.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 8, p. 2906, doi. 10.1007/s10854-013-1189-z
- Article
26
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1775, doi. 10.1007/s10854-012-0661-5
- Hu, Mingzhe;
- Fu, Yang;
- Zhou, Di;
- Gu, Haoshuang;
- Wang, Yu
- Article
27
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1201, doi. 10.1007/s10854-011-0573-9
- Anbarasu, Venugopalan;
- Manigandan, Appasamy;
- Karthik, Thangavelu;
- Sivakumar, Kandasamy
- Article
28
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 3, p. 753, doi. 10.1007/s10854-011-0484-9
- Wang, Min;
- Zuo, Ruzhong;
- Qi, Shishun;
- Liu, Longdong
- Article
29
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 2, p. 567, doi. 10.1007/s10854-011-0437-3
- Liu, Qiang;
- Han, Qifeng;
- Du, Guoping
- Article
30
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 7, p. 890, doi. 10.1007/s10854-010-0231-7
- Chen, Y. M.;
- Huang, Y. S.;
- Lee, K. Y.;
- Tsai, D. S.;
- Tiong, K. K.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 3, p. 228, doi. 10.1007/s10854-010-0119-6
- Joseph, James T.;
- Joseph, Shyla;
- John, Annamma;
- Thomas, J. K.;
- Prasad, V. S.;
- Solomon, Sam
- Article
32
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 11, p. 1164, doi. 10.1007/s10854-009-0040-z
- Haiming Zhang;
- Yujie Li;
- Guofeng Hu;
- Bo Gao;
- Yanjun Zhu
- Article
33
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 326, doi. 10.1007/s10854-009-9914-3
- Shenghuang Lin;
- Zhiming Chen;
- Bo Liu;
- Lianbi Li;
- Xianfeng Feng
- Article
34
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 410, doi. 10.1007/s10854-009-9934-z
- Article
35
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 11, p. 1095, doi. 10.1007/s10854-008-9833-8
- Mikla, V. I.;
- Mikla, V. V.
- Article
36
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 7, p. 609, doi. 10.1007/s10854-008-9773-3
- Cui, Fangming;
- Wang, Lei;
- Xi, Zhenqiang;
- Sun, Yun;
- Yang, Deren
- Article
37
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 170, doi. 10.1007/s10854-007-9499-7
- Fotsing-Djouwe, Isabelle Christiane;
- Gagné, Mathieu;
- Laurin, Jean-Jacques;
- Kashyap, Raman
- Article
38
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 425, doi. 10.1007/s10854-008-9661-x
- Ibáñez, J.;
- Alarcón-Lladó, E.;
- Cuscó, R.;
- Artús, L.;
- Fowler, D.;
- Patanè, A.;
- Uesugi, K.;
- Suemune, I.
- Article
39
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 48, doi. 10.1007/s10854-007-9434-y
- Walters, W. David;
- Knights, Andy P.
- Article
40
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 226, doi. 10.1007/s10854-007-9550-8
- Bulakh, B.;
- Korsunska, N.;
- Khomenkova, L.;
- Stara, T.;
- Venger, Ye.;
- Kryshtab, T.;
- Kryvko, A.
- Article
41
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 294, doi. 10.1007/s10854-007-9514-z
- Article
42
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 51, doi. 10.1007/s10854-007-9557-1
- Irmer, G.;
- Brumme, T.;
- Herms, M.;
- Wernicke, T.;
- Kneissl, M.;
- Weyers, M.
- Article
43
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 692, doi. 10.1007/s10854-007-9381-7
- Strelchuk, V. V.;
- Mazur, Yu. I.;
- Wang, Zh. M.;
- Schmidbauer, M.;
- Kolomys, O. F.;
- Valakh, M. Ya.;
- Manasreh, M. O.;
- Salamo, G. J.
- Article
44
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 584, doi. 10.1007/s10854-007-9393-3
- Ardelean, Ioan;
- Cora, Simona
- Article
45
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 369, doi. 10.1007/s10854-007-9345-y
- Article
46
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 305, doi. 10.1007/s10854-007-9339-9
- O'Reilly, L.;
- Bennett, N. S.;
- McNally, P. J.;
- Sealy, B. J.;
- Cowern, N. E. B.;
- Lankinen, A.;
- Tuomi, T. O.
- Article
47
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 367, doi. 10.1007/s10854-007-9238-0
- Maeda, K.;
- Sakai, T.;
- Sakai, K.;
- Ikari, T.;
- Munzar, M.;
- Tonchev, D.;
- Kasap, S. O.;
- Lucovsky, G.
- Article
48
- Biotechnology Letters, 2003, v. 25, n. 13, p. 1007, doi. 10.1023/A:1024199213519
- Bhosale, Prakash;
- Ermakov, Igor V.;
- Ermakova, Maia R.;
- Gellermann, Werner;
- Bernstein, Paul S.
- Article
49
- Materials & Corrosion / Werkstoffe und Korrosion, 2013, v. 64, n. 5, p. n/a, doi. 10.1002/maco.201390016
- Article
50
- Microbial Ecology, 2007, v. 53, n. 3, p. 494, doi. 10.1007/s00248-006-9191-0
- Ude, Susanne;
- Bailey, Mark J.;
- Huang, Wei E.;
- Spiers, Andrew J.
- Article