Works matching DE "SEMICONDUCTOR analysis"
1
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 1, p. 120, doi. 10.1007/s10854-016-5500-7
- Čajko, Kristina;
- Lukić-Petrović, Svetlana;
- Šiljegović, Mirjana;
- Petrović, Dragoslav;
- Sekulić, Dalibor
- Article
2
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5243, doi. 10.1007/s10854-016-4420-x
- Adelifard, M.;
- Salamatizadeh, R.;
- Ketabi, S.
- Article
3
- Journal of Solid State Electrochemistry, 2018, v. 22, n. 11, p. 3621, doi. 10.1007/s10008-018-4069-x
- Waghadkar, Yogesh;
- Shinde, Manish;
- Rane, Sunit;
- Gosavi, Suresh;
- Terashima, Chiaki;
- Fujishima, Akira;
- Chauhan, Ratna
- Article
4
- Inorganic Materials, 2013, v. 49, n. 12, p. 1249, doi. 10.1134/S0020168513140057
- Karandashev, V. K.;
- Zhernokleeva, K. V.;
- Baranovskaya, V. B.;
- Karpov, Yu. A.
- Article
5
- Advanced Electronic Materials, 2017, v. 3, n. 9, p. n/a, doi. 10.1002/aelm.201700218
- Roche, Gilles H.;
- Thuau, Damien;
- Valvin, Pierre;
- Clevers, Simon;
- Tjoutis, Thomas;
- Chambon, Sylvain;
- Flot, David;
- Geerts, Yves H.;
- Moreau, Joël J. E.;
- Wantz, Guillaume;
- Dautel, Olivier J.
- Article
6
- Advanced Electronic Materials, 2017, v. 3, n. 9, p. n/a, doi. 10.1002/aelm.201600476
- Garlapati, Suresh Kumar;
- Gebauer, Julia Susanne;
- Dehm, Simone;
- Bruns, Michael;
- Winterer, Markus;
- Hahn, Horst;
- Dasgupta, Subho
- Article
7
- Advanced Electronic Materials, 2017, v. 3, n. 9, p. n/a, doi. 10.1002/aelm.201600350
- Article
8
- Materials Research Letters, 2018, v. 6, n. 8, p. 432, doi. 10.1080/21663831.2018.1477848
- Vattikuti, S. V. Prabhakar;
- Nagajyothi, P. C.;
- Anil Kumar Reddy, Police;
- Kotesh Kumar, Mandari;
- Shim, Jaesool;
- Byon, Chan
- Article
9
- Physica Status Solidi - Rapid Research Letters, 2014, v. 8, n. 4, p. n/a, doi. 10.1002/pssr.201308326
- Zhang, W.;
- Martin, M.;
- Brown, E. R.
- Article
10
- Acta Technica Corviniensis - Bulletin of Engineering, 2015, v. 8, n. 1, p. 31
- WEISZ, Daniel R.;
- HIMMELSTOSS, Felix A.
- Article
11
- Studia Universitatis Babes-Bolyai, Chemia, 2017, v. 62, n. 1, p. 195, doi. 10.24193/subbchem.2017.1.17
- Article
12
- Optica Applicata, 2006, v. 36, n. 2/3, p. 359
- Gislason, Hafliđi P.;
- Seghier, Djelloul
- Article
13
- Chemistry - A European Journal, 2019, v. 25, n. 2, p. 564, doi. 10.1002/chem.201804020
- Pang, Shuting;
- Más‐Montoya, Miriam;
- Xiao, Manjun;
- Duan, Chunhui;
- Wang, Zhenfeng;
- Liu, Xi;
- Janssen, René A. J.;
- Yu, Gang;
- Huang, Fei;
- Cao, Yong
- Article
14
- Chemistry - A European Journal, 2017, v. 23, n. 35, p. 8409, doi. 10.1002/chem.201702087
- Hu, Yue‐Qiao;
- Li, Mu‐Qing;
- Wang, Yanyan;
- Zhang, Tao;
- Liao, Pei‐Qin;
- Zheng, Zhiping;
- Chen, Xiao‐Ming;
- Zheng, Yan‐Zhen
- Article
15
- Optical & Quantum Electronics, 2018, v. 50, n. 10, p. 1, doi. 10.1007/s11082-018-1639-1
- Dubajić, Miloš;
- Daničić, Aleksandar;
- Vuković, Nikola;
- Milanović, Vitomir;
- Radovanović, Jelena
- Article
16
- Instruments & Experimental Techniques, 2009, v. 52, n. 1, p. 65, doi. 10.1134/S0020441209010102
- Nasibov, A.;
- Berezhnoi, K.;
- Shapkin, P.;
- Reutova, A.;
- Shunailov, S.;
- Yalandin, M.
- Article
17
- Applied Physics A: Materials Science & Processing, 2006, v. 85, n. 4, p. 457, doi. 10.1007/s00339-006-3701-2
- Article
18
- DAAAM International Scientific Book, 2013, p. 193, doi. 10.2507/daaam.scibook.2013.08
- Article
19
- Semiconductors, 2018, v. 52, n. 1, p. 131, doi. 10.1134/S1063782618010190
- Sachenko, A.;
- Belyaev, A.;
- Konakova, R.
- Article
20
- Semiconductors, 2012, v. 46, n. 6, p. 786, doi. 10.1134/S1063782612060140
- Article
21
- Semiconductors, 2011, v. 45, n. 6, p. 832, doi. 10.1134/S106378261106025X
- Article
22
- Semiconductors, 2010, v. 44, n. 10, p. 1258, doi. 10.1134/S1063782610100027
- Article
23
- Semiconductors, 2008, v. 42, n. 6, p. 662, doi. 10.1134/S1063782608060067
- Stamov, I. G.;
- Tkachenko, D. V.
- Article
24
- Semiconductors, 2008, v. 42, n. 6, p. 655, doi. 10.1134/S1063782608060055
- Article
25
- Semiconductors, 2008, v. 42, n. 6, p. 651, doi. 10.1134/S1063782608060043
- Sidorov, G. Yu.;
- Mikhaĭlov, N. N.;
- Varavin, V. S.;
- Ikusov, D. G.;
- Sidorov, Yu. G.;
- Dvoretskiĭ, S. A.
- Article
26
- Semiconductors, 2008, v. 42, n. 6, p. 720, doi. 10.1134/S1063782608060146
- Usov, S.;
- Tsatsul’nikov, A.;
- Lundin, V.;
- Sakharov, A.;
- Zavarin, E.;
- Sinitsyn, M.;
- Ledentsov, N.
- Article
27
- Semiconductors, 2003, v. 37, n. 11, p. 1275, doi. 10.1134/1.1626207
- Yakovyna, V. S.;
- Zayachuk, D. M.;
- Berchenko, N. N.
- Article
28
- Semiconductors, 2003, v. 37, n. 9, p. 1123, doi. 10.1134/1.1610132
- Grekhov, I.V.;
- Kyuregyan, A.S.;
- Mnatsakanov, T.T.;
- Yurkov, S.N.
- Article
29
- Journal of Electronic Materials, 2009, v. 38, n. 1, p. 54, doi. 10.1007/s11664-008-0528-y
- Takaku, Yoshikazu;
- Makino, Komei;
- Watanabe, Keita;
- Ohnuma, Ikuo;
- Kainuma, Ryosuke;
- Yamada, Yasushi;
- Yagi, Yuji;
- Nakagawa, Ikuo;
- Atsumi, Takashi;
- Ishida, Kiyohito
- Article
30
- Computer Systems Science & Engineering, 2017, v. 32, n. 3, p. 243
- Article
31
- Philosophical Magazine, 2006, v. 86, n. 29-31, p. 4727, doi. 10.1080/14786430600740641
- Arslan#, I.;
- Bleloch, A.;
- Stach, E. A.;
- Ogut, S.;
- Browning, N. D.
- Article
32
- Doklady Biochemistry & Biophysics, 2010, v. 430, n. 1, p. 41, doi. 10.1134/S1607672910010126
- Zdobnova, T.;
- Dorofeev, S.;
- Tananaev, P.;
- Zlomanov, V.;
- Stremovskiy, O.;
- Lebedenko, E.;
- Balalaeva, I.;
- Deyev, S.;
- Petrov, R.
- Article
33
- International Journal of Advanced Manufacturing Technology, 2018, v. 99, n. 5-8, p. 1503, doi. 10.1007/s00170-018-2414-y
- Singh, Rashmi;
- Mathirajan, M.
- Article
34
- Technical Physics, 2009, v. 54, n. 4, p. 555, doi. 10.1134/S1063784209040173
- Konshina, E. A.;
- Fedorov, M. A.;
- Rybnikova, A. E.;
- Amosova, L. P.;
- Ivanova, N. L.;
- Isaev, M. V.;
- Kostomarov, D. S.
- Article
35
- Technical Physics, 2007, v. 52, n. 1, p. 86, doi. 10.1134/S106378420701015X
- Kheifets, O.;
- Kobelev, L.;
- Melnikova, N.;
- Nugaeva, L.
- Article
36
- IETE Technical Review, 2020, v. 37, n. 2, p. 169, doi. 10.1080/02564602.2019.1584055
- Singh, Ankit Kumar;
- Pathak, Mukesh Kumar
- Article
37
- Applied Physics A: Materials Science & Processing, 2014, v. 114, n. 4, p. 1347, doi. 10.1007/s00339-013-7979-6
- Sbiaa, R.;
- Piramanayagam, S.
- Article
38
- Bulletin of the Chemical Society of Ethiopia, 2017, v. 31, n. 3, p. 435, doi. 10.4314/bcse.v31i3.7
- Ding-Wa Zhang;
- Yin-Feng Wang;
- Wen-Tong Chen
- Article
39
- Electronics & Electrical Engineering, 2010, n. 99, p. 3
- Špánik, P.;
- Šul, R.;
- Frívaldský, M.;
- Drgońa, P.;
- Kandráč, J.
- Article
40
- Optical & Quantum Electronics, 2008, v. 40, n. 5/6, p. 337, doi. 10.1007/s11082-008-9222-9
- Yingyan Huang;
- Seng-Tiong Ho
- Article
41
- Judicature, 2020, v. 104, n. 2, p. 7
- Article
42
- Scientific Reports, 2015, p. 12718, doi. 10.1038/srep12718
- Fang, Yutao;
- Wang, Lu;
- Sun, Qingling;
- Lu, Taiping;
- Deng, Zhen;
- Ma, Ziguang;
- Jiang, Yang;
- Jia, Haiqiang;
- Wang, Wenxin;
- Zhou, Junming;
- Chen, Hong
- Article
43
- Scientific Reports, 2015, p. 10848, doi. 10.1038/srep10848
- Li, Xi-Bo;
- Guo, Pan;
- Cao, Teng-Fei;
- Liu, Hao;
- Lau, Woon-Ming;
- Liu, Li-Min
- Article
44
- IETE Journal of Research, 2009, v. 55, n. 6, p. 299, doi. 10.4103/0377-2063.59170
- Srivastava, J. K.;
- Pandey, Preeti;
- Mishra, V. N.;
- Dwivedi, R.
- Article
45
- Digest Journal of Nanomaterials & Biostructures (DJNB), 2013, v. 8, n. 2, p. 573
- Article
46
- ChemSusChem, 2017, v. 10, n. 22, p. 4552, doi. 10.1002/cssc.201701538
- Hegner, Franziska Simone;
- CardENas ‐ Morcoso, Drialys;
- Giménez, Sixto;
- López, Núria;
- Galan ‐ Mascaros, Jose Ramon
- Article
47
- PLoS ONE, 2017, v. 12, n. 8, p. 1, doi. 10.1371/journal.pone.0181559
- McMahon, Christopher J.;
- Toomey, Joshua P.;
- Kane, Deb M.
- Article
48
- Asia-Pacific Management Accounting Journal, 2017, v. 12, n. 2, p. 1
- Kenichi Suzuki;
- Kohsuke Matsuoka;
- Hiromune Ishii
- Article
49
- Technometrics, 2020, v. 62, n. 1, p. 84, doi. 10.1080/00401706.2019.1575284
- Li, Wendong;
- Xiang, Dongdong;
- Tsung, Fugee;
- Pu, Xiaolong
- Article