Works matching DE "BIPOLAR transistors"
1
- Solid State Technology, 2001, v. 44, n. 6, p. 117
- John, Wilfred;
- Weixelbaum, Leonhard;
- Witrich, Harald;
- Wurfl, Joachim
- Article
2
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 4, p. 354, doi. 10.1007/s10854-008-9733-y
- Sang-Heung Lee;
- Seung-Yun Lee;
- Chan Woo Park;
- Dongwoo Suh
- Article
3
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 183, doi. 10.1007/s10854-007-9300-y
- Pengpad, P.;
- Bagnall, D. M.
- Article
4
- Measurement Techniques, 2019, v. 62, n. 8, p. 729, doi. 10.1007/s11018-019-01686-y
- Titkov, A. A.;
- Khvalin, A. L.
- Article
5
- Measurement Techniques, 2018, v. 61, n. 8, p. 831, doi. 10.1007/s11018-018-1510-6
- Article
6
- Measurement Techniques, 2007, v. 50, n. 1, p. 78, doi. 10.1007/s11018-007-0027-1
- Article
7
- Experimental Technology & Management, 2022, v. 39, n. 4, p. 90, doi. 10.16791/j.cnki.sjg.2022.04.018
- Article
8
- Electroplating & Finishing, 2022, v. 41, n. 14, p. 1014, doi. 10.19289/j.1004-227x.2022.14.010
- Article
9
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600535
- Liang, Guojin;
- Hu, Haibo;
- Liao, Lei;
- He, Yunbin;
- Ye, Changhui
- Article
10
- Journal of Chongqing University of Posts & Telecommunications (Natural Science Edition) / Chongqing Youdian Daxue Xuebao (Ziran Kexue Ban), 2021, v. 33, n. 6, p. 955, doi. 10.3979/j.issn.1673-825X.202001080013
- Article
11
- International Journal of Electronics Letters, 2023, v. 11, n. 4, p. 411, doi. 10.1080/21681724.2022.2087916
- Gautam, Amit Kumar;
- Majumdar, Sudipta
- Article
12
- International Journal of Electronics Letters, 2020, v. 8, n. 4, p. 437, doi. 10.1080/21681724.2019.1636292
- Wadhwa, Sanjay Kumar;
- Dixit, Ravi;
- Gottapu, Anil Kumar
- Article
13
- Applied Nanoscience, 2022, v. 12, n. 5, p. 1435, doi. 10.1007/s13204-021-02299-0
- Raissi, Farshid;
- Amirmazlaghani, Mina;
- Rajabi, Ali
- Article
14
- Journal of Mining & Metallurgy. Section B: Metallurgy, 2012, v. 48, n. 2, p. 227, doi. 10.2298/JMMB111102021C
- Cui, S. L.;
- Zhang, L. J.;
- Zhang, W. B.;
- Du, Y.;
- Xu, H. H.
- Article
15
- Acta Scientiarum: Technology, 2015, v. 37, n. 2, p. 211, doi. 10.4025/actascitechnol.v37i2.24941
- Gelen, Ayetül;
- Yalcinoz, Tankut
- Article
16
- Modern Physics Letters B, 2018, v. 32, n. 34-36, p. N.PAG, doi. 10.1142/S0217984918400808
- Zhai, Mingjing;
- Yang, Yuan;
- Wen, Yang;
- Yao, Wenqing;
- Li, Yuan
- Article
17
- Caderno Brasileiro de Ensino de Física, 2023, v. 45, p. 1, doi. 10.1590/1806-9126-RBEF-2023-0116
- Iarosz, Kelly C.;
- Gabrick, Enrique C.;
- Trobia, José;
- Borges, Rafael R.;
- Protachevicz, Paulo R.;
- Bonetti, Robson C.;
- de Souza, Silvio L. T.;
- Batista, Gabriel L.;
- Szezech Jr., José D.;
- Caldas, Iberê L.;
- Batista, Antonio M.
- Article
18
- EE: Evaluation Engineering, 2011, v. 50, n. 3, p. 14
- Article
19
- EE: Evaluation Engineering, 2005, v. 44, n. 3, p. 20
- Article
20
- Pacing & Clinical Electrophysiology, 1992, v. 15, n. 1, p. 45, doi. 10.1111/j.1540-8159.1992.tb02900.x
- Sevaptsidis, Elias;
- Massé, Stéphane;
- Parson, Ian D.;
- Downar, Eugene;
- Kimber, Shane
- Article
21
- Journal of Superconductivity & Novel Magnetism, 2010, v. 23, n. 1, p. 61, doi. 10.1007/s10948-009-0537-y
- Article
22
- Engineering Letters, 2008, v. 16, n. 1, p. 44
- Verdier, Jacquez;
- Núñez Pérez, José Cruz;
- Gontrand, Christian
- Article
23
- International Journal of Simulation: Systems, Science & Technology, 2014, v. 15, n. 2, p. 24, doi. 10.5013/IJSSST.a.15.02.04
- Mohd Ismail Saad;
- Zuhir, H.;
- Bun Seng, C.;
- Khairul, A. M.;
- Ghosh, Bablu;
- Bolong, N.;
- Ismail, Razali
- Article
24
- International Journal of RF & Microwave Computer-Aided Engineering, 2003, v. 13, n. 6, p. 518, doi. 10.1002/mmce.10110
- Angelov, I.;
- Choumei, K.;
- Inoue, A.
- Article
25
- International Journal of RF & Microwave Computer-Aided Engineering, 2002, v. 12, n. 4, p. 311, doi. 10.1002/mmce.10001
- Ooi, B. L.;
- Zhou, T. S.;
- Kooi, P. S.
- Article
26
- International Journal of RF & Microwave Computer-Aided Engineering, 2000, v. 10, n. 1, p. 33, doi. 10.1002/(SICI)1099-047X(200001)10:1<33::AID-MMCE5>3.0.CO;2-D
- Schultheis, R.;
- Bovolon, N.;
- Müller, J. E.;
- Zwicknagl, P.
- Article
27
- International Journal of RF & Microwave Computer-Aided Engineering, 1999, v. 9, n. 5, p. 403, doi. 10.1002/(SICI)1099-047X(199909)9:5<403::AID-MMCE5>3.0.CO;2-#
- Article
28
- International Journal of RF & Microwave Computer-Aided Engineering, 1999, v. 9, n. 5, p. 424, doi. 10.1002/(SICI)1099-047X(199909)9:5<424::AID-MMCE7>3.0.CO;2-N
- Article
29
- i-Manager's Journal on Digital Signal Processing, 2018, v. 6, n. 1, p. 33, doi. 10.26634/jdp.6.1.15157
- PURKAIT, SONAL;
- PANDEY, RAHUL
- Article
30
- Applied Computational Electromagnetics Society Journal, 2021, v. 36, n. 5, p. 513, doi. 10.47037/2020.ACES.J.360504
- Da-Miao Yu;
- Xiao-Min Pan;
- Xin-Qing Sheng
- Article
31
- Instruments & Experimental Techniques, 2016, v. 59, n. 4, p. 539, doi. 10.1134/S0020441216030143
- Dvornikov, O.;
- Chekhovskii, V.;
- Dyatlov, V.;
- Prokopenko, N.
- Article
32
- Instruments & Experimental Techniques, 2016, v. 59, n. 2, p. 222, doi. 10.1134/S0020441216020081
- Malashin, M.;
- Moshkunov, S.;
- Khomich, V.
- Article
33
- Instruments & Experimental Techniques, 2016, v. 59, n. 1, p. 82, doi. 10.1134/S002044121601022X
- Article
34
- Instruments & Experimental Techniques, 2013, v. 56, n. 3, p. 302, doi. 10.1134/S0020441213030020
- Efremov, A.;
- Koshelev, V.;
- Kovalchuk, B.;
- Plisko, V.
- Article
35
- Instruments & Experimental Techniques, 2011, v. 54, n. 4, p. 533, doi. 10.1134/S0020441211030225
- Boyko, N.;
- Bortsov, A.;
- Evdoshenko, L.;
- Ivanov, V.
- Article
36
- Instruments & Experimental Techniques, 2010, v. 53, n. 5, p. 657, doi. 10.1134/S0020441210050076
- Murashev, V. N.;
- Legotin, S. A.;
- Orlov, O. M.;
- Korol'chenko, A. S.;
- Ivshin, P. A.
- Article
37
- Instruments & Experimental Techniques, 2009, v. 52, n. 5, p. 655, doi. 10.1134/S0020441209050042
- Volkov, D.;
- Karmanov, D.;
- Murashev, V.;
- Legotin, S.;
- Mukhamedshin, R.;
- Chubenko, A.
- Article
38
- Journal of Microwaves, Optoelectronics & Electromagnetic Applications, 2020, v. 19, n. 2, p. 242, doi. 10.1590/2179-10742020v19i2836
- Perotoni, Marcelo B.;
- Silva, Samuel N. N.;
- da Silva, L. A.;
- de Oliveira, Alexandre M.
- Article
39
- Scientific Bulletin of National Mining University, 2021, n. 5, p. 49, doi. 10.33271/nvngu/2021-5/049
- Osadchuk, O. V.;
- Semenov, A. O.;
- Zviahin, O. S.;
- Semenova, O. O.;
- Rudyk, A. V.
- Article
40
- IUP Journal of Electrical & Electronics Engineering, 2023, v. 16, n. 2, p. 25
- A. A., Zhuk;
- N. N., Prokopenko;
- V. E., Chumakov;
- A. V., Kunts
- Article
41
- IUP Journal of Electrical & Electronics Engineering, 2022, v. 15, n. 3, p. 24
- Chumakov V. E.;
- Serebryakov A. I.;
- Titov A. E.;
- Prokopenko N. N.
- Article
42
- International Journal of Electrical Engineering Education, 2021, v. 58, n. 2, p. 319, doi. 10.1177/0020720918825244
- Nethra Devi, T;
- Raghuram, TR
- Article
43
- International Journal of Electrical Engineering Education, 2011, v. 48, n. 1, p. 104, doi. 10.7227/IJEEE.48.1.9
- Article
44
- International Journal of Electrical Engineering Education, 2003, v. 40, n. 1, p. 91
- Article
45
- Canadian Journal of Physics, 2003, v. 81, n. 9, p. 1109, doi. 10.1139/p03-053
- Zouari, Abdelaziz;
- Arab, Adel Ben
- Article
46
- Semiconductors, 2020, v. 54, n. 2, p. 258, doi. 10.1134/S1063782620020153
- Lebedeva, N. M.;
- Il'inskaya, N. D.;
- Ivanov, P. A.
- Article
47
- Semiconductors, 2019, v. 53, n. 10, p. 1353, doi. 10.1134/S1063782619100178
- Shobolova, T. A.;
- Korotkov, A. V.;
- Petryakova, E. V.;
- Lipatnikov, A. V.;
- Puzanov, A. S.;
- Obolensky, S. V.;
- Kozlov, V. A.
- Article
48
- Semiconductors, 2017, v. 51, n. 9, p. 1194, doi. 10.1134/S1063782617090238
- Yuferev, V.;
- Levinshtein, M.;
- Ivanov, P.;
- Zhang, Jon;
- Palmour, John
- Article
49
- Semiconductors, 2016, v. 50, n. 12, p. 1678, doi. 10.1134/S1063782616120162
- Puzanov, A.;
- Obolenskiy, S.;
- Kozlov, V.
- Article
50
- Semiconductors, 2015, v. 49, n. 1, p. 69, doi. 10.1134/S1063782615010224
- Puzanov, A.;
- Obolenskii, S.;
- Kozlov, V.
- Article