Works matching DE "HALL effect"
1
- ZAMM -- Journal of Applied Mathematics & Mechanics / Zeitschrift für Angewandte Mathematik und Mechanik, 2025, v. 105, n. 5, p. 1, doi. 10.1002/zamm.70056
- Das, Sanatan;
- Karmakar, Poly;
- Sarkar, Soumitra;
- Ali, Asgar;
- Jana, Rabindra Nath;
- Kumar, Ravikumar Shashikala Varun
- Article
2
- ZAMM -- Journal of Applied Mathematics & Mechanics / Zeitschrift für Angewandte Mathematik und Mechanik, 2025, v. 105, n. 5, p. 1, doi. 10.1002/zamm.70019
- Roja, Ajjanna;
- Hassan, Mehboob Ul;
- Khan, Umair;
- Ishak, Anuar
- Article
3
- ZAMM -- Journal of Applied Mathematics & Mechanics / Zeitschrift für Angewandte Mathematik und Mechanik, 2025, v. 105, n. 5, p. 1, doi. 10.1002/zamm.70027
- Nosheen, Tayyaba;
- Hina, Sadia;
- Saleem, Salman;
- Kouki, Marouan;
- Yasin, Maria;
- Nawaz, Kiran;
- Aljohani, M. A.;
- Khan, Waris
- Article
4
- European Physical Journal: Special Topics, 2025, v. 234, n. 2, p. 327, doi. 10.1140/epjs/s11734-024-01387-w
- Guo, Xi;
- Chang, Mengmeng;
- Wang, Jinbin;
- Bai, Ruxue;
- Zhong, Xiangli;
- Zhang, Fabi;
- Wu, Fengmin;
- Guo, Daoyou
- Article
5
- Revista Cubana de Física, 2022, v. 39, n. 1, p. 27
- Article
6
- Journal of Electronic Materials, 2025, v. 54, n. 6, p. 4432, doi. 10.1007/s11664-025-11867-x
- Lotfy, Kh.;
- Elshazly, Ibrahim S.;
- Bachar, Imed;
- Sharma, Saurav;
- El-Bary, Alaa A.
- Article
7
- Journal of Electronic Materials, 2025, v. 54, n. 6, p. 4767, doi. 10.1007/s11664-025-11858-y
- Singh, Rekha;
- Srivastava, Vanya;
- Pandey, Akhilesh;
- Garg, Preeti;
- Raman, R.;
- Singh, Bharti;
- Pal, Ravinder
- Article
8
- Journal of Electronic Materials, 2025, v. 54, n. 3, p. 2211, doi. 10.1007/s11664-024-11725-2
- Li, Yi-Yao;
- Yang, Yu-Chen;
- Chou, Tung-Huan;
- Huang, Yu-Lin;
- Chang, Chia-He;
- Hsu, Ya-Lan;
- Lin, Kun-Lin
- Article
9
- Journal of Electronic Materials, 2025, v. 54, n. 1, p. 413, doi. 10.1007/s11664-024-11567-y
- Feng, Li;
- Wang, Fen;
- Luo, Hongjie;
- Zhu, Jianfeng;
- Qin, Yi
- Article
10
- Journal of Electronic Materials, 2025, v. 54, n. 1, p. 727, doi. 10.1007/s11664-024-11525-8
- Article
11
- Journal of Electronic Materials, 2024, v. 53, n. 8, p. 4869, doi. 10.1007/s11664-024-11220-8
- Hu, Shao-Hwa;
- Lin, Yen-Sheng;
- Su, Shui-Hsiang;
- Dai, Hang;
- He, Jing-Shi
- Article
12
- Journal of Electronic Materials, 2024, v. 53, n. 7, p. 3848, doi. 10.1007/s11664-024-11094-w
- Shang, Jing;
- Murugesan, Magesh;
- Gul, Rubi;
- Bigbee-Hansen, Samuel;
- Tallan, Joseph M.;
- Duenow, Joel N.;
- McCloy, John S.
- Article
13
- Surface Engineering, 2021, v. 37, n. 2, p. 137, doi. 10.1080/02670844.2020.1754623
- Sebastian, S.;
- Kulandaisamy, I.;
- Valanarasu, S.;
- Shkir, Mohd;
- Ganesh, V.;
- Yahia, I. S.;
- Kim, Hyun-Seok;
- Vikraman, Dhanasekaran
- Article
14
- Surface Engineering, 2018, v. 34, n. 9, p. 667, doi. 10.1080/02670844.2017.1373975
- Yang, Ya-Chu;
- Tsau, Chun-Huei;
- Yeh, Jien-Wei;
- Chen, Swe-Kai
- Article
15
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 17, p. 16463, doi. 10.1007/s10854-019-02022-4
- Govindasamy, Geetha;
- Pal, Kaushik;
- Abd Elkodous, M.;
- El-Sayyad, Gharieb S.;
- Gautam, Kumar;
- Murugasan, Priya
- Article
16
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 17, p. 16353, doi. 10.1007/s10854-019-02006-4
- Kononenko, O. V.;
- Zotov, A. V.;
- Volkov, V. T.;
- Levashov, V. I.;
- Tulin, V. A.;
- Matveev, V. N.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 14, p. 13217, doi. 10.1007/s10854-019-01685-3
- Khanvilkar, M. B.;
- Nikumbh, A. K.;
- Pawar, R. A.;
- Karale, N. J.;
- Nighot, D. V.;
- Gugale, G. S.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 4, p. 3338, doi. 10.1007/s10854-018-00607-z
- Chihi, Adel;
- Boujmil, Mohamed Fethi;
- Bessais, Brahim
- Article
19
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 2, p. 1366, doi. 10.1007/s10854-018-0406-1
- Guzmán-Caballero, D. E.;
- Quevedo-López, M. A.;
- Ramírez-Bon, R.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 17, p. 14989, doi. 10.1007/s10854-018-9637-4
- Yuan, Meng;
- Xu, Jing;
- Chen, Qiang;
- Li, Dongsheng;
- Yang, Deren
- Article
21
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 13, p. 11529, doi. 10.1007/s10854-018-9248-0
- Anitha, N.;
- Anitha, M.;
- Raj Mohamed, J.;
- Valanarasu, S.;
- Amalraj, L.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 13, p. 11358, doi. 10.1007/s10854-018-9223-9
- Arulanantham, A. M. S.;
- Valanarasu, S.;
- Kathalingam, A.;
- Jeyadheepan, K.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 1, p. 351, doi. 10.1007/s10854-017-7923-1
- Su, Ting-Hong;
- Wu, Chang-Lin;
- Chang, Hsing-Cheng;
- Lin, Yow-Jon
- Article
24
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 15, p. 11053, doi. 10.1007/s10854-017-6889-3
- Su, Zijie;
- Chen, Yao;
- Li, Xianggao;
- Wang, Shirong;
- Xiao, Yin
- Article
25
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1463, doi. 10.1007/s10854-016-5682-z
- Jrad, Abdelhak;
- Naffouti, Wafa;
- Ben Nasr, Tarek;
- Ammar, Souad;
- Turki-Kamoun, Najoua
- Article
26
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 13271, doi. 10.1007/s10854-016-5475-4
- Lu, Zhou;
- Kang, H.;
- Zhong, Z.;
- Zhang, T.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 11, p. 12148, doi. 10.1007/s10854-016-5368-6
- Ozcan, Gamze;
- Metin Gubur, Hulya;
- Alpdogan, Soner;
- Zeyrek, Birsen
- Article
28
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5427, doi. 10.1007/s10854-016-4445-1
- Adelifard, M.;
- Jahandoost, M.
- Article
29
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 4043, doi. 10.1007/s10854-015-4259-6
- Kumar, Vipin;
- Kumar, Pravin;
- Yadav, S.;
- Kumar, Virendra;
- Bansal, M.;
- Dwivedi, D.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 2, p. 1293, doi. 10.1007/s10854-015-3888-0
- Bagheri, N.;
- Ara, M.;
- Ghazyani, N.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 2, p. 1670, doi. 10.1007/s10854-015-3939-6
- Sun, Xigui;
- Gao, Kewei;
- Pang, Xiaolu;
- Yang, Huisheng;
- Volinsky, Alex
- Article
32
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4830, doi. 10.1007/s10854-015-2990-7
- Dhamodharan, P.;
- Manoharan, C.;
- Dhanapandian, S.;
- Bououdina, M.;
- Ramalingam, S.
- Article
33
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 5416, doi. 10.1007/s10854-015-3095-z
- Yadav, Abhijit;
- Salunke, S.
- Article
34
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 6, p. 3819, doi. 10.1007/s10854-015-2908-4
- Xu, Ji-wen;
- Yang, Zu-pei;
- Wang, Hua;
- Yang, Ling;
- Yuan, Changlai
- Article
35
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 3291, doi. 10.1007/s10854-015-2830-9
- Zhang, Qixiang;
- Liu, Jindong;
- Cui, Yunxian;
- Ding, Wanyu
- Article
36
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1492, doi. 10.1007/s10854-014-1758-9
- Jha, Jitendra;
- Santos-Ortiz, Reinaldo;
- Du, Jincheng;
- Shepherd, Nigel
- Article
37
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 6, p. 1863, doi. 10.1007/s10854-012-1024-y
- Article
38
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1263, doi. 10.1007/s10854-011-0584-6
- Chang, Lantao;
- Wang, Lei;
- Sheng, Xia;
- Luo, Yeping;
- Yang, Deren
- Article
39
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 827, doi. 10.1007/s10854-009-0002-5
- Valanarasu, S.;
- Chandramohan, R.;
- Thirumalai, J.;
- Vijayan, T. A.;
- Srikumar, S. R.;
- Mahalingam, T.
- Article
40
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 3, p. 242, doi. 10.1007/s10854-008-9710-5
- Savić, S.;
- Stojanović, G.;
- Nikolić, M.;
- Aleksić, O.;
- Luković Golić, D.;
- Nikolić, P.
- Article
41
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 60, doi. 10.1007/s10854-008-9607-3
- Tay, M.;
- Wu, Y. H.;
- Han, G. C.;
- Chen, Y. B.;
- Pan, X. Q.;
- Wang, S. J.;
- Yang, P.;
- Feng, Y. P.
- Article
42
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 12, p. 1203, doi. 10.1007/s10854-007-9314-5
- Saq'an, S.;
- Zihlif, A. M.;
- Al-Ani, R. S.;
- Ragosta, G.
- Article
43
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 57, doi. 10.1007/s10854-007-9173-0
- O'Reilly, L.;
- Mitra, A.;
- Lucas, F. O.;
- Natarajan, Gomathi;
- McNally, P. J.;
- Daniels, S.;
- Lankinen, A.;
- Lowney, D.;
- Bradley, A. L.;
- Cameron, D. C.
- Article
44
- Measurement Techniques, 2024, v. 67, n. 3, p. 219, doi. 10.1007/s11018-024-02337-7
- Sherstobitov, Sergey Vlamirovich
- Article
45
- Measurement Techniques, 2022, v. 65, n. 2, p. 111, doi. 10.1007/s11018-022-02056-x
- Medvedevskih, S. V.;
- Chekirda, K. V.
- Article
46
- Measurement Techniques, 2014, v. 57, n. 9, p. 1041, doi. 10.1007/s11018-014-0578-x
- Evstaf'ev, A.;
- Urakseev, M.
- Article
47
- Measurement Techniques, 2012, v. 54, n. 11, p. 1303, doi. 10.1007/s11018-012-9881-6
- Muravskaya, N.;
- Ermakova, Ya.;
- Ivanov, A.
- Article
48
- Measurement Techniques, 2012, v. 54, n. 10, p. 1103, doi. 10.1007/s11018-012-9856-7
- Article
49
- Fluid Dynamics, 2006, v. 41, n. 5, p. 843, doi. 10.1007/s10697-006-0100-5
- Bityurin, V.;
- Bocharov, A.N.
- Article
50
- Fluid Dynamics, 2003, v. 38, n. 4, p. 653, doi. 10.1023/A:1026342315743
- Article