Works matching IS 0040-1706 AND VI 35 AND IP 1 AND DT 1993
36
- Technometrics, 1993, v. 35, n. 1, p. 72, doi. 10.1080/00401706.1993.10484995
- Article
37
- Technometrics, 1993, v. 35, n. 1, p. 61, doi. 10.1080/00401706.1993.10484994
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38
- Technometrics, 1993, v. 35, n. 1, p. 53, doi. 10.1080/00401706.1993.10484993
- Nayebpour, Mohamad R.;
- Woodall, William H.
- Article
39
- Technometrics, 1993, v. 35, n. 1, p. 37, doi. 10.1080/00401706.1993.10484992
- Article
40
- Technometrics, 1993, v. 35, n. 1, p. 32, doi. 10.1080/00401706.1993.10484991
- Article
41
- Technometrics, 1993, v. 35, n. 1, p. 28, doi. 10.1080/00401706.1993.10484990
- Article
42
- Technometrics, 1993, v. 35, n. 1, p. 25, doi. 10.1080/00401706.1993.10484989
- Coleman, David E.;
- Montgomery, Douglas C.
- Article
43
- Technometrics, 1993, v. 35, n. 1, p. 21, doi. 10.1080/00401706.1993.10484988
- Leon, Ramon V.;
- Shoemaker, Anne C.
- Article
44
- Technometrics, 1993, v. 35, n. 1, p. 17, doi. 10.1080/00401706.1993.10484987
- Haaland, Perry D.;
- O'Connell, M.A.
- Article
45
- Technometrics, 1993, v. 35, n. 1, p. 15, doi. 10.1080/00401706.1993.10484986
- Article
46
- Technometrics, 1993, v. 35, n. 1, p. 13, doi. 10.1080/00401706.1993.10484985
- Article
47
- Technometrics, 1993, v. 35, n. 1, p. 1, doi. 10.1080/00401706.1993.10484984
- Coleman, David E.;
- Montgomery, Douglas C.
- Article