Works matching Statistical reliability


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    Bimodal failure behaviour of metal film resistors.

    Published in:
    Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 87, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<87::AID-QRE166>3.0.CO;2-U
    By:
    • Croes, K.;
    • De Ceuninck, W.;
    • De Schepper, L.;
    • Tielemans, L.
    Publication type:
    Article