Works matching IS 12860042 AND DT 2015 AND VI 72 AND IP 1
Results: 10
Design and fabrication of a MEMS high-efficiency NIR-scanning grating based on tilted (1 1 1) silicon wafer.
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- European Physical Journal - Applied Physics, 2015, v. 72, n. 1, p. 10702-p1, doi. 10.1051/epjap/2015150285
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- Article
Electric field imaging of a high impedance surface for GNSS array decoupling application.
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- European Physical Journal - Applied Physics, 2015, v. 72, n. 1, p. 11001-p1, doi. 10.1051/epjap/2015150253
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- Article
Linearization strategies for high sensitivity magnetoresistive sensors.
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- European Physical Journal - Applied Physics, 2015, v. 72, n. 1, p. 10601-p1, doi. 10.1051/epjap/2015150214
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- Article
Correlation between physical properties and growth mechanism of In<sub>2</sub>S<sub>3</sub> thin films fabricated by electrodeposition technique with different deposition times.
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- European Physical Journal - Applied Physics, 2015, v. 72, n. 1, p. 10302-p1, doi. 10.1051/epjap/2015150195
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- Article
Characterization of n and p-type (SnO<sub>2</sub>)<sub>x</sub>(ZnO)<sub>1-x</sub> nanoparticles thin films.
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- European Physical Journal - Applied Physics, 2015, v. 72, n. 1, p. 10301-p1, doi. 10.1051/epjap/2015150188
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Study of the characteristics current-voltage and capacitance-voltage in nitride GaAs Schottky diode.
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- European Physical Journal - Applied Physics, 2015, v. 72, n. 1, p. 10102-p1, doi. 10.1051/epjap/2015150140
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- Article
The second-harmonic generation in a dissipative and dispersion layered structure.
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- European Physical Journal - Applied Physics, 2015, v. 72, n. 1, p. 10501-p1, doi. 10.1051/epjap/2015150126
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- Article
Power analysis for the design of a large area ultrasonic tactile touch panel.
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- European Physical Journal - Applied Physics, 2015, v. 72, n. 1, p. 11101-p1, doi. 10.1051/epjap/2015150051
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- Article
Integration of microwave termination based on TaN thin films on ferrite substrates.
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- European Physical Journal - Applied Physics, 2015, v. 72, n. 1, p. 10101-p1, doi. 10.1051/epjap/2015140497
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- Article
Original non-stationary eddy current imaging process for the evaluation of defects in metallic structures.
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- European Physical Journal - Applied Physics, 2015, v. 72, n. 1, p. 10701-p1, doi. 10.1051/epjap/2015140458
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- Article