Works matching IS 12860042 AND DT 2014 AND VI 68 AND IP 1


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    Atom probe tomography in nanoelectronics.

    Published in:
    European Physical Journal - Applied Physics, 2014, v. 68, n. 1, p. N.PAG, doi. 10.1051/epjap/2014140060
    By:
    • Blavette, Didier;
    • Duguay, Sébastien
    Publication type:
    Article
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